Patents by Inventor Rumi Hayakawa
Rumi Hayakawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11568177Abstract: A sequential data analysis apparatus extracts a pattern of two or more sets of items based on an appearance frequency of each of different sets of items in first sequential data, selects a pattern of two or more sets of items based on an appearance frequency of a sub-pattern formed of a portion of the extracted pattern, creates a related pattern including the same last set of items as and the other sets of items different from the selected characteristic pattern, calculates an evaluation value of the related pattern, creates a prediction model by organizing data of the characteristic pattern and the related pattern, and applies second sequential data to the prediction model to determine a result which the second sequential data is likely to lead to.Type: GrantFiled: January 19, 2015Date of Patent: January 31, 2023Assignees: KABUSHIKI KAISHA TOSHIBA, TOSHIBA SOLUTIONS CORPORATIONInventors: Hideki Iwasaki, Shigeaki Sakurai, Rumi Hayakawa, Shigeru Matsumoto
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Publication number: 20220075360Abstract: A manufacturing condition output apparatus of an embodiment is a manufacturing condition output apparatus which outputs a manufacturing condition of a product. The manufacturing condition output apparatus outputs change degree information which is information regarding degrees of change of values regarding defect probabilities for a plurality of variables relating to manufacturing of the product from model information of a model generated through machine learning on a basis of manufacturing data of the product and inspection result data of the product, as a manufacturing condition.Type: ApplicationFiled: November 18, 2021Publication date: March 10, 2022Applicants: Kabushiki Kaisha Toshiba, Toshiba Digital Solutions CorporationInventors: Toru ITO, Shintarou TAKAHASHI, Toshiyuki KATOU, Rumi HAYAKAWA
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Patent number: 10515051Abstract: A data analysis supporting apparatus according to an embodiment comprises a variable-type determining device, a variable-variation generating device, and a variable-contribution rate determining device. The variable-type determining device determines the type of each variable. The variable-variation generating device generates variations of each variable in accordance with the variable type determined and with a variable variation rule that defines a method of generating the variations of each variable of any type. The variable-contribution rate determining device calculates the rate at which the variations and analysis data contribute to the objective variable, and determines, from the rate, whether the variations should be used or deleted.Type: GrantFiled: March 27, 2015Date of Patent: December 24, 2019Assignees: Kabushiki Kaisha Toshiba, Toshiba Solutions CorporationInventors: Seiji Egawa, Shozo Isobe, Shigeaki Sakurai, Kazuyoshi Nishi, Shigeru Matsumoto, Rumi Hayakawa
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Patent number: 10025789Abstract: A data analyzing apparatus of an embodiment generates a format variation, analytical algorithm name, and analytical parameter not stored in a first storage device, and executes analysis. The data analyzing apparatus determines whether the application accuracy is lower than the knowledge model accuracy. If the determination result is “not lower”, the data analyzing apparatus reactivates a format variation generating device and an analytical parameter generating device. If the determination result is “lower”, the data analyzing apparatus reads out a format variation and knowledge model name associated with the highest priority order in the first storage device, and executes analysis.Type: GrantFiled: March 27, 2015Date of Patent: July 17, 2018Assignees: KABUSHIKI KAISHA TOSHIBA, TOSHIBA SOLUTIONS CORPORATIONInventors: Kazuyoshi Nishi, Shigeru Matsumoto, Shozo Isobe, Hideki Iwasaki, Shigeaki Sakurai, Kyoko Makino, Rumi Hayakawa, Seiji Egawa
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Publication number: 20170330055Abstract: A sequential data analysis apparatus extracts a pattern of two or more sets of items based on an appearance frequency of each of different sets of items in first sequential data, selects a pattern of two or more sets of items based on an appearance frequency of a sub-pattern formed of a portion of the extracted pattern, creates a related pattern including the same last set of items as and the other sets of items different from the selected characteristic pattern, calculates an evaluation value of the related pattern, creates a prediction model by organizing data of the characteristic pattern and the related pattern, and applies second sequential data to the prediction model to determine a result which the second sequential data is likely to lead to.Type: ApplicationFiled: January 19, 2015Publication date: November 16, 2017Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA SOLUTIONS CORPORATIONInventors: Hideki IWASAKI, Shigeaki SAKURAI, Rumi HAYAKAWA, Shigeru MATSUMOTO
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Patent number: 9569835Abstract: A pattern extracting apparatus includes a first storing section storing plural target information pieces, a candidate pattern producing section producing candidate patterns each including two or more items different from each other based on each of the items included in the plural target information pieces, a candidate evaluation value calculating section calculating an extraction evaluation value of the candidate pattern based on a frequency of appearance at which the produced candidate pattern appears in the plural target information pieces, a pattern extracting section determining and extracting any of the candidate patterns having the calculated extraction evaluation value satisfying a predetermined threshold value, and a second storing section storing an association degree between the items.Type: GrantFiled: May 25, 2012Date of Patent: February 14, 2017Assignees: KABUSHIKI KAISHA TOSHIBA, TOSHIBA SOLUTIONS CORPORATIONInventors: Shigeaki Sakurai, Rumi Hayakawa, Seiji Egawa
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Publication number: 20150199368Abstract: A data analysis supporting apparatus according to an embodiment comprises a variable-type determining device, a variable-variation generating device, and a variable-contribution rate determining device. The variable-type determining device determines the type of each variable. The variable-variation generating device generates variations of each variable in accordance with the variable type determined and with a variable variation rule that defines a method of generating the variations of each variable of any type. The variable-contribution rate determining device calculates the rate at which the variations and analysis data contribute to the objective variable, and determines, from the rate, whether the variations should be used or deleted.Type: ApplicationFiled: March 27, 2015Publication date: July 16, 2015Applicants: Kabushiki Kaisha Toshiba, Toshiba Solutions CorporationInventors: Seiji Egawa, Shozo Isobe, Shigeaki Sakurai, Kazuyoshi Nishi, Shigeru Matsumoto, Rumi Hayakawa
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Publication number: 20150199364Abstract: A data analyzing apparatus of an embodiment generates a format variation, analytical algorithm name, and analytical parameter not stored in a first storage device, and executes analysis. The data analyzing apparatus determines whether the application accuracy is lower than the knowledge model accuracy. If the determination result is “not lower”, the data analyzing apparatus reactivates a format variation generating device and an analytical parameter generating device. If the determination result is “lower”, the data analyzing apparatus reads out a format variation and knowledge model name associated with the highest priority order in the first storage device, and executes analysis.Type: ApplicationFiled: March 27, 2015Publication date: July 16, 2015Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA SOLUTIONS CORPORATIONInventors: Kazuyoshi NISHI, Shigeru MATSUMOTO, Shozo ISOBE, Hideki IWASAKI, Shigeaki SAKURAI, Kyoko MAKINO, Rumi HAYAKAWA, Seiji EGAWA
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Patent number: 8793143Abstract: A report check apparatus includes an input unit which inputs data of a diagnostic reading report as a check target, a check unit which checks whether the input diagnostic reading report contains a semantic error related to diagnostic reading, and a display unit which displays a check result by the check unit.Type: GrantFiled: April 4, 2006Date of Patent: July 29, 2014Assignees: Kabushiki Kaisha Toshiba, Toshiba Medical Systems CorporationInventors: Kyoko Makino, Rumi Hayakawa, Takashi Kondo, Akira Iwasa
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Publication number: 20140112549Abstract: A pattern extracting apparatus includes a first storing section storing plural target information pieces, a candidate pattern producing section producing candidate patterns each including two or more items different from each other based on each of the items included in the plural target information pieces, a candidate evaluation value calculating section calculating an extraction evaluation value of the candidate pattern based on a frequency of appearance at which the produced candidate pattern appears in the plural target information pieces, a pattern extracting section determining and extracting any of the candidate patterns having the calculated extraction evaluation value satisfying a predetermined threshold value, and a second storing section storing an association degree between the items.Type: ApplicationFiled: May 25, 2012Publication date: April 24, 2014Applicants: TOSHIBA SOLUTIONS CORPORATION, KABUSHIKI KAISHA TOSHIBAInventors: Shigeaki Sakurai, Rumi Hayakawa, Seiji Egawa
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Publication number: 20060241353Abstract: A report check apparatus includes an input unit which inputs data of a diagnostic reading report as a check target, a check unit which checks whether the input diagnostic reading report contains a semantic error related to diagnostic reading, and a display unit which displays a check result by the check unit.Type: ApplicationFiled: April 4, 2006Publication date: October 26, 2006Inventors: Kyoko Makino, Rumi Hayakawa, Takashi Kondo, Akira Iwasa
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Publication number: 20010032107Abstract: Of data for analysis of phenomena such as POS analysis data and data of analysis of causes such as question & answer survey result associated with a state in which the data for analysis of phenomena has been acquired, data specified by an initial output specification is output. Then, when a user inputs an associated data output specification, data associated with output data, of the data for analysis of phenomena and data for analysis of causes, is output.Type: ApplicationFiled: February 22, 2001Publication date: October 18, 2001Inventors: Seiji Iwata, Rumi Hayakawa, Kyoko Makino, Yuu Fukada, Miyoko Miyoshi, Takeshi Izawa, Chihiro Takahashi, Motomu Ootawa, Kazuhide Sato, Shinichi Hatano