Patents by Inventor Rung Bin Lin

Rung Bin Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7838175
    Abstract: A wafer lithographic shielding mask for fabricating a multi-project wafer (MPW) and a wafer fabrication method using the same are disclosed. The mask including a light shielding layer and at least one transparent region is used to select the layout patterns of designated chips on an MPW reticle to be exposed onto the photoresist layer on the surface of the wafer. The lithography method of fabricating MPW mainly involves disposing a wafer lithographic shielding mask for selecting the exposure regions on the MPW reticle on the light transmission path from a lithographic light source to a wafer, e.g., between the MPW reticle and the lithographic light source or between the MPW reticle and the wafer, so as to prevent some undesired chips from being fabricated on the wafer using the MPW reticle, thereby decreasing the wafer production cost.
    Type: Grant
    Filed: February 14, 2007
    Date of Patent: November 23, 2010
    Assignee: Yuan-Ze University
    Inventors: Shih Cheng Tsai, Rung Bin Lin
  • Publication number: 20070216891
    Abstract: A wafer lithographic shielding mask for fabricating a multi-project wafer (MPW) and a wafer fabrication method using the same are disclosed. The mask including a light shielding layer and at least one transparent region is used to select the layout patterns of designated chips on an MPW reticle to be exposed onto the photoresist layer on the surface of the wafer. The lithography method of fabricating MPW mainly involves disposing a wafer lithographic shielding mask for selecting the exposure regions on the MPW reticle on the light transmission path from a lithographic light source to a wafer, e.g., between the MPW reticle and the lithographic light source or between the MPW reticle and the wafer, so as to prevent some undesired chips from being fabricated on the wafer using the MPW reticle, thereby decreasing the wafer production cost.
    Type: Application
    Filed: February 14, 2007
    Publication date: September 20, 2007
    Applicant: Yuan-Ze University
    Inventors: Shih Cheng Tsai, Rung Bin Lin