Patents by Inventor Runjin WU

Runjin WU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12277988
    Abstract: Embodiments relate to the field of semiconductor circuit design, and more particularly, to a data processing method, a data processing structure, and a memory. The data processing method includes: obtaining raw data to be stored, and grouping the raw data to obtain first split data, the first split data having equal number of code elements; encoding each of the first split data to generate first encoded data, where the first encoded data includes the first split data and check data corresponding to the first split data; reorganizing the first encoded data to generate write data; storing the write data into a memory cell; and obtaining read data in the memory cell, and decoding and checking the read data to generate corrected read data, to correct a multi-bit burst error occurring in the memory during data storage or data transmission.
    Type: Grant
    Filed: January 16, 2023
    Date of Patent: April 15, 2025
    Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
    Inventor: Runjin Wu
  • Publication number: 20240055069
    Abstract: Embodiments relate to the field of semiconductor circuit design, and more particularly, to a data processing method, a data processing structure, and a memory. The data processing method includes: obtaining raw data to be stored, and grouping the raw data to obtain first split data, the first split data having equal number of code elements; encoding each of the first split data to generate first encoded data, where the first encoded data includes the first split data and check data corresponding to the first split data; reorganizing the first encoded data to generate write data; storing the write data into a memory cell; and obtaining read data in the memory cell, and decoding and checking the read data to generate corrected read data, to correct a multi-bit burst error occurring in the memory during data storage or data transmission.
    Type: Application
    Filed: January 16, 2023
    Publication date: February 15, 2024
    Inventor: Runjin WU