Abstract: Various embodiments of the teachings herein include a fault processing method comprising: receiving two historical faults similar to a target fault; searching keywords in a description of the target fault and each historical fault, wherein the keywords are classified into N grades, and for each system component in a grade, the grade comprises at least one keyword for describing the component, wherein N is an integer no less than 2; for each of the N grades, counting a quantity of identical system components represented by the keywords in the text description of each historical fault and the target fault; and comparing a degree of similarity of each historical fault to the target fault according to the quantity of identical system components counted in each grade of the N different grades, wherein a historical fault relating to a larger number of high-grade identical system components has a higher degree of similarity to the target fault.

Abstract: An industrial device matching method and apparatus are used for acquiring a corresponding relationship between industrial devices in different industrial data sources to provide basis for industrial data analysis. The method, in an embodiment, includes collecting data of at least two industrial data sources; determining a first relationship between various industrial devices in each industrial data source, and determining a first relationship topology between the industrial devices in the industrial data source; and comparing the first relationship topologies corresponding to various industrial data sources, to determine a first corresponding relationship between industrial devices in industrial data sources, the first corresponding relationship enabling the first relationship topologies corresponding to at least two industrial data sources to be similar.

Abstract: Various embodiments of the teachings herein include a fault processing method comprising: receiving two historical faults similar to a target fault; searching keywords in a description of the target fault and each historical fault, wherein the keywords are classified into N grades, and for each system component in a grade, the grade comprises at least one keyword for describing the component, wherein N is an integer no less than 2; for each of the N grades, counting a quantity of identical system components represented by the keywords in the text description of each historical fault and the target fault; and comparing a degree of similarity of each historical fault to the target fault according to the quantity of identical system components counted in each grade of the N different grades, wherein a historical fault relating to a larger number of high-grade identical system components has a higher degree of similarity to the target fault.

Abstract: An industrial device matching method and apparatus are used for acquiring a corresponding relationship between industrial devices in different industrial data sources to provide basis for industrial data analysis. The method, in an embodiment, includes collecting data of at least two industrial data sources; determining a first relationship between various industrial devices in each industrial data source, and determining a first relationship topology between the industrial devices in the industrial data source; and comparing the first relationship topologies corresponding to various industrial data sources, to determine a first corresponding relationship between industrial devices in industrial data sources, the first corresponding relationship enabling the first relationship topologies corresponding to at least two industrial data sources to be similar.