Abstract: Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (8), a light beam shaping apparatus (8), a pattern modulation apparatus (6), and a projection lens (2). The pattern modulation apparatus is configured to form a coded pattern. The light beam shaping apparatus is configured to shape light emitted by the light source into near-parallel light. The projection lens is configured to project the coded pattern onto a target object. The imaging system includes an imaging lens (3), a first beam-splitting system (12, 13), and an image sensor group including N image sensors (9, 10, 11). The first beam-splitting system is configured to transmit the coded pattern received by the imaging lens and projected onto the target object to the N image sensors of the image sensor group.

Abstract: Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (8), a light beam shaping apparatus (8), a pattern modulation apparatus (6), and a projection lens (2). The pattern modulation apparatus is configured to form a coded pattern. The light beam shaping apparatus is configured to shape light emitted by the light source into near-parallel light. The projection lens is configured to project the coded pattern onto a target object. The imaging system includes an imaging lens (3), a first beam-splitting system (12, 13), and an image sensor group including N image sensors (9, 10, 11). The first beam-splitting system is configured to transmit the coded pattern received by the imaging lens and projected onto the target object to the N image sensors of the image sensor group.