Patents by Inventor Ruska Patton

Ruska Patton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11609254
    Abstract: A testing apparatus for electromagnetically sensitive equipment includes a housing defining a testing chamber. The housing blocks transmission of electromagnetic waves from an external environment into the testing chamber and reduces reflection of electromagnetic waves within the testing chamber. The testing apparatus also includes a tube defining an air flow path between the testing chamber and the external environment. The tube blocks transmission of electromagnetic waves from the external environment into the air flow path. The tube includes a proximal end coupled to an opening in the housing such that the air flow path is fluidly coupled to the testing chamber via the opening, a distal end opposing the proximal end, and a bent segment extending between the proximal end and the distal end.
    Type: Grant
    Filed: August 11, 2021
    Date of Patent: March 21, 2023
    Assignee: Apple Inc.
    Inventors: Jr-Yi Shen, Sammer Al-Robaee, Ruska Patton, Jia-Woei Chen
  • Publication number: 20230050818
    Abstract: A testing apparatus for electromagnetically sensitive equipment includes a housing defining a testing chamber. The housing blocks transmission of electromagnetic waves from an external environment into the testing chamber and reduces reflection of electromagnetic waves within the testing chamber. The testing apparatus also includes a tube defining an air flow path between the testing chamber and the external environment. The tube blocks transmission of electromagnetic waves from the external environment into the air flow path. The tube includes a proximal end coupled to an opening in the housing such that the air flow path is fluidly coupled to the testing chamber via the opening, a distal end opposing the proximal end, and a bent segment extending between the proximal end and the distal end.
    Type: Application
    Filed: August 11, 2021
    Publication date: February 16, 2023
    Inventors: Jr-Yi Shen, Sammer Al-Robaee, Ruska Patton, Jia-Woei Chen
  • Patent number: 10732249
    Abstract: A method of calibrating or correcting near field or far field data from a scanner board array of integrated measuring probes that are electronically switched to capture near-field data from an antenna-under-test (AUT) and having a board output includes the steps of coupling a calibrating probe with one of the measuring probes, measuring the power through the measuring probe and the calibrating probe and isolating the effect of the RF path from the measuring probe to the board output by removing the effect of the calibrating probe, and repeating for each measuring probe. Also disclosed are methods for correcting for scattering effects and loading effects on the AUT.
    Type: Grant
    Filed: November 10, 2015
    Date of Patent: August 4, 2020
    Assignee: Ether Capital Corporation
    Inventors: Ruska Patton, Kasra Payandehjoo
  • Publication number: 20190128938
    Abstract: An RF scanning system and method includes a plurality of antenna probes and a plurality of RF receivers, wherein each probe is associated with a unique RF receiver, which outputs data to a digital signal processor.
    Type: Application
    Filed: April 13, 2017
    Publication date: May 2, 2019
    Inventors: Ruska Patton, Sammer Al-Robaee, Gil Montag
  • Publication number: 20190086459
    Abstract: A ground filtering source reconstruction method and system, for a near field measurement system comprising a scanner board with an array of integrated probes that are backed by a ground plane and at least one coupled RF receiver that captures near-field data from an antenna-under-test (AUT) or device-under-test (DUT).
    Type: Application
    Filed: July 9, 2018
    Publication date: March 21, 2019
    Inventors: Rezvan Rafiee Alavi, Ali Kiaee, Rashid Mirzavand, Pedram Mousavi, Ruska Patton
  • Patent number: 9880210
    Abstract: A scanner system and method operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT) are provided. The electromagnetic field level radiated by the DUT is measured with a probe array comprising a plurality of spatially separated switched probes, an analyzer, and a computer. An actuator changes the relative position of the probe array to the DUT by a distance less than or equal to the separation distance between the probes, and the electromagnetic field level is measured and stored again.
    Type: Grant
    Filed: January 29, 2015
    Date of Patent: January 30, 2018
    Assignee: EMSCAN CORPORATION
    Inventors: Ruska Patton, Yiping Zhou, Gil Montag, Robert Xue
  • Publication number: 20170248674
    Abstract: A method of calibrating or correcting near field or far field data from a scanner board array of integrated measuring probes that are electronically switched to capture near-field data from an antenna-under-test (AUT) and having a board output includes the steps of coupling a calibrating probe with one of the measuring probes, measuring the power through the measuring probe and the calibrating probe and isolating the effect of the RF path from the measuring probe to the board output by removing the effect of the calibrating probe, and repeating for each measuring probe. Also disclosed are methods for correcting for scattering effects and loading effects on the AUT.
    Type: Application
    Filed: November 10, 2015
    Publication date: August 31, 2017
    Inventors: Ruska PATTON, Kasra PAYANDEHJOO
  • Publication number: 20160334450
    Abstract: A scanner system and method operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT) are provided. The electromagnetic field level radiated by the DUT is measured with a probe array comprising a plurality of spatially separated switched probes, an analyzer, and a computer. An actuator changes the relative position of the probe array to the DUT by a distance less than or equal to the separation distance between the probes, and the electromagnetic field level is measured and stored again.
    Type: Application
    Filed: January 29, 2015
    Publication date: November 17, 2016
    Inventors: Ruska PATTON, Yiping ZHOU, Gil MONTAG, Robert XUE
  • Patent number: 9316714
    Abstract: A test station for wireless devices and methods for calibration thereof. The test station includes a signal generator, a calibrator, a scanner having receiving and transmitting antennas, a signal analyzer, and a computer. Under the direction of the computer, the signal generator generates a calibration signal in accordance with a programmable calibration signal script. The calibrator may be used to emulate either a wireless device in transmit mode by transmitting the calibration signal to the scanner for analysis by the signal analyzer, or a wireless device in receive mode by receiving the calibration signal from the scanner for analysis by the signal analyzer. The behavior of the test station is calibrated by correlating signal parameters of the calibration signal as specified by the calibration signal script and as measured at the signal analyzer.
    Type: Grant
    Filed: December 6, 2012
    Date of Patent: April 19, 2016
    Assignee: EMSCAN CORPORATION
    Inventors: Patrick Rada, Ruska Patton
  • Patent number: 8502546
    Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
    Type: Grant
    Filed: October 10, 2007
    Date of Patent: August 6, 2013
    Assignee: Emscan Corporation
    Inventors: Adiseshu Nyshadham, Ruska Patton, Jason Jin
  • Publication number: 20110193566
    Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
    Type: Application
    Filed: October 10, 2007
    Publication date: August 11, 2011
    Applicant: EMSCAN Corporation
    Inventors: Adiseshu Nyshadham, Ruska Patton, Jason Jin
  • Patent number: 7672640
    Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
    Type: Grant
    Filed: March 16, 2007
    Date of Patent: March 2, 2010
    Assignee: EMSCAN Corporation
    Inventors: Adiseshu Nyshadham, Ruska Patton, Jason Jin
  • Publication number: 20070285322
    Abstract: A near field microwave scanning system includes a switched array of antenna elements forming an array surface, a scan surface substantially parallel to the array surface and separated by a distance less than about 1 wavelength of the measured frequency, and a processing engine for obtaining and processing near field data, without the use of an absorber.
    Type: Application
    Filed: March 16, 2007
    Publication date: December 13, 2007
    Applicant: EMSCAN CORPORATION
    Inventors: Adiseshu NYSHADHAM, Ruska PATTON, Jason JIN