Patents by Inventor Ruslan Temirov

Ruslan Temirov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning probe microscope and method for measuring local electrical potential fields
    Patent number: 10585116
    Abstract: A scanning probe microscope includes a tip. A quantum dot is applied to the tip.
    Type: Grant
    Filed: January 18, 2016
    Date of Patent: March 10, 2020
    Assignee: FORSCHUNGSZENTRUM JUELICH GMBH
    Inventors: Frank Stefan Tautz, Ruslan Temirov, Christian Wagner, Matthew Felix Blishen Green
  • SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING LOCAL ELECTRICAL POTENTIAL FIELDS
    Publication number: 20180024161
    Abstract: A scanning probe microscope includes a tip. A quantum dot is applied to the tip.
    Type: Application
    Filed: January 18, 2016
    Publication date: January 25, 2018
    Inventors: Frank Stefan Tautz, Ruslan Temirov, Christian Wagner, Matthew Felix Blishen Green
  • Method for measuring the force interaction that is caused by a sample
    Patent number: 8832860
    Abstract: Disclosed is a method for measuring the force interaction caused by a sample, wherein a bias voltage, with respect to the sample, is applied between a tip, and the tip is guided at such a small distance to the sample that a measurable current flows between the tip and the sample, and a sensor and signal converter S, which changes the current flowing through the tip-sample contact depending on the intensity of the force interaction, is formed and used in the region of the force interaction. A scanning tunneling microscope therefor is disclosed.
    Type: Grant
    Filed: August 27, 2010
    Date of Patent: September 9, 2014
    Assignee: Forschungszentrum Juelich GmbH
    Inventors: Ruslan Temirov, Christian Weiss, Frank Stefan Tautz
  • Method for examining a sample
    Patent number: 8347410
    Abstract: Disclosed is a method for examining a sample using a scanning tunneling microscope, wherein before or during image recording, a contrast agent is applied to at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact during the image recording, while a temperature less than or equal to the condensation temperature of the contrast agent is set at this location. A corresponding scanning tunneling microscope is disclosed.
    Type: Grant
    Filed: November 7, 2008
    Date of Patent: January 1, 2013
    Assignee: Forschungszentrum Juelich GmbH
    Inventors: Ruslan Temirov, Sergey Subach, Frank Stefan Tautz
  • METHOD FOR MEASURING THE FORCE INTERACTION THAT IS CAUSED BY A SAMPLE
    Publication number: 20120151638
    Abstract: Disclosed is a method for measuring the force interaction caused by a sample, wherein a bias voltage, with respect to the sample, is applied between a tip, and the tip is guided at such a small distance to the sample that a measurable current flows between the tip and the sample, and a sensor and signal converter S, which changes the current flowing through the tip-sample contact depending on the intensity of the force interaction, is formed and used in the region of the force interaction. A scanning tunneling microscope therefor is disclosed.
    Type: Application
    Filed: August 27, 2010
    Publication date: June 14, 2012
    Inventors: Ruslan Temirov, Christian Weiss, Frank Stefan Tautz
  • METHOD FOR EXAMINING A SAMPLE
    Publication number: 20100263097
    Abstract: Disclosed is a method for examining a sample using a scanning tunneling microscope, wherein before or during image recording, a contrast agent is applied to at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact during the image recording, while a temperature less than or equal to the condensation temperature of the contrast agent is set at this location. A corresponding scanning tunneling microscope is disclosed.
    Type: Application
    Filed: November 7, 2008
    Publication date: October 14, 2010
    Inventors: Ruslan Temirov, Sergey Subach, Frank Stefan Tautz