Patents by Inventor Russel T. Mack

Russel T. Mack has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5059032
    Abstract: An apparatus for measuring heat flow from a surface, including a heat flow measuring device for measuring heat flow from a surface; a structure for applying a relatively constant and repeatable force on the heat flow measuring device contacting the surface; an infrared pyrometer for measuring test surface temperature; an infrared pyrometer for measuring surrounding atmospheric temperature and a free standing support for supporting all of the above identified elements of the heat flow measuring device.
    Type: Grant
    Filed: August 16, 1990
    Date of Patent: October 22, 1991
    Assignee: The Dow Chemical Company
    Inventors: Russel T. Mack, Ronald W. Rieger
  • Patent number: 4988211
    Abstract: The present invention includes a process and apparatus for determining the temperature of a sample such as urine without contacting the sample itself. A portable device is used to carry the temperature measuring apparatus. The sample of urine is placed in a plastic container on an adjustable support and the temperature is measured by an infrared pyrometer.
    Type: Grant
    Filed: April 27, 1989
    Date of Patent: January 29, 1991
    Assignee: The Dow Chemical Company
    Inventors: Sharon J. Barnes, James W. Beutnagel, Russel T. Mack, Aaron A. Mills, John Smith, III
  • Patent number: 4934830
    Abstract: An apparatus for measuring heat flow from a surface, including a heat flow measuring device for measuring heat flow from a surface; a structure for applying a relatively constant and repeatable force on the heat flow measuring device contacting the surface; a free standing support for supporting the heat flow measuring device and the force applying structure, and an infrared pyrometer for measuring the temperature of the surface.
    Type: Grant
    Filed: May 3, 1989
    Date of Patent: June 19, 1990
    Assignee: The Dow Chemical Company
    Inventors: Ronald W. Rieger, Russel T. Mack
  • Patent number: 4896281
    Abstract: A method for heat loss surveys comprising the steps of obtaining one or more thermal profiles of a surface radiating heat, the thermal profiles being marked in depicting areas of specified temperatures; at a selected location on each surface a heat flux measurement is made to thereby identify the heat loss from the surface at the selected location. The selected heat loss measurement is then correlated with the thermal profiles by employing a scaling equation to thus obtain indication of heat loss from all increments of the thermal profile, and thence from the entire surface under investigation. Heat loss evaluations for each of the various surfaces of the object being measured are then totalized. The total heat loss and the consequent cost thereof is considered to determine if heat insulation of the object will enhance or impede return on investment.
    Type: Grant
    Filed: August 31, 1988
    Date of Patent: January 23, 1990
    Assignee: The Dow Chemical Company
    Inventor: Russel T. Mack
  • Patent number: 4870656
    Abstract: An apparatus for measuring heat flow from a surface, including a heat flow measuring device for measuring heat flow from a surface; a structure for applying a relatively constant and repeatable force on the heat flow measuring device contacting the surface; and a free standing support for supporting the heat flow measuring device and the force applying structure.
    Type: Grant
    Filed: September 12, 1988
    Date of Patent: September 26, 1989
    Assignee: The Dow Chemical Company
    Inventors: Ronald W. Rieger, Russel T. Mack
  • Patent number: 4589781
    Abstract: In the preferred and illustrated embodiment, multiple fixtures are set forth which function as support structures for thermal fluxmeters. A fluxmeter wafer or pad having top and lower faces and forming an output signal by means of thermopiles connected to both faces is used. It is supported by first and second alternate forms of fixtures. A force is applied to the fluxmeter wafer which is approximately normalized in both fixtures. This establishes a stabilized contact force against a surface to measure heat loss through the surface. This avoids variations in surface contact.
    Type: Grant
    Filed: February 25, 1985
    Date of Patent: May 20, 1986
    Assignee: The Dow Chemical Company
    Inventor: Russel T. Mack