Patents by Inventor Russell A. Wincheski

Russell A. Wincheski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040228961
    Abstract: A method is provided for the controlled deposition and alignment of carbon nanotubes. A carbon nanotube (CNT) attraction material is deposited on a substrate in the gap region between two electrodes on the substrate. An electric potential is applied to the two electrodes. The CNT attraction material is wetted with a solution defined by a carrier liquid having carbon nanotubes (CNTs) suspended therein. A portion of the CNTs align with the electric field and adhere to the CNT attraction material. The carrier liquid and any CNTs not adhered to the CNT attraction material are then removed.
    Type: Application
    Filed: December 4, 2003
    Publication date: November 18, 2004
    Applicant: United States of America as represented by the Admin. of the Nat'l Aeronautics & Space Admin.
    Inventors: Jan M. Smits, Russell A. Wincheski, JoAnne L. Ingram, Anthony Neal Watkins, Jeffrey D. Jordan
  • Publication number: 20020130659
    Abstract: A giant magnetoresistive flux focusing eddy current device effectively detects deep flaws in thick multilayer conductive materials. The probe uses an excitation coil to induce eddy currents in conducting material perpendicularly oriented to the coil's longitudinal axis. A giant magnetoresistive (GMR) sensor, surrounded by the excitation coil, is used to detect generated fields. Between the excitation coil and GMR sensor is a highly permeable flux focusing lens which magnetically separates the GMR sensor and excitation coil and produces high flux density at the outer edge of the GMR sensor. The use of feedback inside the flux focusing lens enables complete cancellation of the leakage fields at the GMR sensor location and biasing of the GMR sensor to a location of high magnetic field sensitivity. In an alternate embodiment, a permanent magnet is positioned adjacent to the GMR sensor to accomplish the biasing.
    Type: Application
    Filed: November 28, 2001
    Publication date: September 19, 2002
    Applicant: National Aeronautics and Space Administration
    Inventors: Russell A. Wincheski, Min Namkung, John W. Simpson
  • Patent number: 6190589
    Abstract: A molded magnetic article and fabrication method are provided. Particles of ferromagnetic material embedded in a polymer binder are molded under heat and pressure into a geometric shape. Each particle is an oblate spheroid having a radius-to-thickness aspect ratio approximately in the range of 15-30. Each oblate spheroid has flattened poles that are substantially in perpendicular alignment to a direction of the molding pressure throughout the geometric shape.
    Type: Grant
    Filed: February 11, 2000
    Date of Patent: February 20, 2001
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Robert G. Bryant, Min Namkung, Russell A. Wincheski, Robert L. Fox
  • Patent number: 6054210
    Abstract: A molded magnetic article and fabrication method are provided. Particles of ferromagnetic material embedded in a polymer binder are molded under heat and pressure into a geometric shape. Each particle is an oblate spheroid having a radius-to-thickness aspect ratio approximately in the range of 15-30. Each oblate spheroid has flattened poles that are substantially in perpendicular alignment to a direction of the molding pressure throughout the geometric shape.
    Type: Grant
    Filed: April 9, 1997
    Date of Patent: April 25, 2000
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Robert G. Bryant, Min Namkung, Russell A. Wincheski, James P. Fulton, Robert L. Fox
  • Patent number: 5942894
    Abstract: A radially focused eddy current sensor detects longitudinal flaws in a metal tube. A drive coil induces eddy currents within the wall of the metal tube. A pick-up coil is spaced apart from the drive coil along the length of the metal tube. The pick-up coil is positioned with one end thereof lying adjacent the wall of the metal tube such that the pick-up coil's longitudinal axis is perpendicular to the wall of the metal tube. To isolate the pick-up coil from the magnetic flux of the drive coil and the flux from the induced eddy currents, except the eddy currents diverted by a longitudinal flaw, an electrically conducting material high in magnetic permeability surrounds all of the pick-up coil except its one end that is adjacent the walls of the metal tube. The electrically conducting material can extend into and through the drive coil in a coaxial relationship therewith.
    Type: Grant
    Filed: September 13, 1995
    Date of Patent: August 24, 1999
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Russell A. Wincheski, John W. Simpson, James P. Fulton, Shridhar C. Nath, Ronald G. Todhunter, Min Namkung
  • Patent number: 5847562
    Abstract: A thickness gauging instrument uses a flux focusing eddy current probe and two-point nonlinear calibration algorithm. The instrument is small and portable due to the simple interpretation and operational characteristics of the probe. A nonlinear interpolation scheme incorporated into the instrument enables a user to make highly accurate thickness measurements over a fairly wide calibration range from a single side of nonferromagnetic conductive metals. The instrument is very easy to use and can be calibrated quickly.
    Type: Grant
    Filed: May 8, 1997
    Date of Patent: December 8, 1998
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: James P. Fulton, Min Namkung, John W. Simpson, Russell A. Wincheski, Shridhar C. Nath
  • Patent number: 5698977
    Abstract: Flux-focusing electromagnetic sensor using a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. A ferrous shield isolates a high-turn pick-up coil from an excitation coil. Use of the magnetic shield produces a null voltage output across the receiving coil in presence of an unflawed sample. Redistribution of the current flow in the sample caused by the presence of flaws, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.Maximum sensor output is obtained when positioned symmetrically above the crack. By obtaining position of maximum sensor output, it is possible to track the fault and locate the area surrounding its tip.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: December 16, 1997
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: John W. Simpson, James P. Fulton, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung, Shridhar C. Nath
  • Patent number: 5648721
    Abstract: A flux-focusing electromagnetic sensor which uses a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks about circular fasteners and other circular inhomogeneities in high conductivity material. The unique feature of the device is the ferrous shield isolating a high-turn pick-up coil from an excitation coil, The use of the magnetic shield is shown to produce a null voltage output across the receiving coil in the presence of an unflawed sample. A redistribution of the current flow in the sample caused by the presence of flaws, however, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.By rotating the probe in a path around a circular fastener such as a rivet while maintaining a constant distance between the probe and the center of a rivet, the signal due to current flow about the rivet can be held constant.
    Type: Grant
    Filed: November 22, 1994
    Date of Patent: July 15, 1997
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Russell A. Wincheski, James P. Fulton, Shridhar C. Nath, John W. Simpson, Min Namkung
  • Patent number: 5617024
    Abstract: A flux-focusing electromagnetic sensor which uses a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. The unique feature of the device is the ferrous shield isolating a high-turn pick-up coil from an excitation coil. The use of the magnetic shield is shown to produce a null voltage output across the receiving coil in the presence of an unflawed sample. A redistribution of the current flow in the sample caused by the presence of flaws, however, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.The maximum sensor output is obtained when positioned symmetrically above the crack. Hence, by obtaining the position of the maximum sensor output, it is possible to track the fault and locate the area surrounding its tip.
    Type: Grant
    Filed: May 8, 1996
    Date of Patent: April 1, 1997
    Assignee: The United States of America as represented by the United States National Aeronautics and Space Administration
    Inventors: John W. Simpson, C. Gerald Clendenin, James P. Fulton, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung, Shridhar C. Nath