Abstract: A segmented subsystem, for use within an automated test platform, includes a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment. A second subsystem segment includes a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment.

Abstract: A scalable test platform includes a PCIe-based event fabric. One or more instrument subsystems are coupled to the PCIe-based event fabric and configured to interface one or more devices under test and generate captured test data. One or more digital signal processing subsystems are coupled to the PCIe-based event fabric and configured to process the captured test data.

Abstract: A scalable test platform includes a PCIe-based event fabric. One or more CPU subsystems are coupled to the PCIe-based event fabric and configured to execute an automated test process. One or more instrument subsystems are coupled to the PCIe-based event fabric and configured to interface one or more devices under test.

Abstract: A method, computer program product, and computing system for, upon the occurrence of a computer-related event, comparing code utilized by one or more subsystems included within a scalable test platform to code available from a remote location. If the code available from the remote location is newer than the code utilized by one or more subsystems, the code available from the remote location is obtained, thus defining newer code. The code utilized by one or more subsystems is updated with the newer code.

Abstract: A segmented subsystem, for use within an automated test platform, includes a first subsystem segment configured to execute one or more instructions within the first subsystem segment. A second subsystem segment is configured to execute one or more instructions within the second subsystem segment. The first subsystem segment includes: a first functionality, a second functionality, and a status polling engine. The status polling engine is configured to: determine a first status for the first functionality and a second status for the second functionality, and generate a consolidated status indicator for the first subsystem segment based, at least in part, upon the first status for the first functionality and the second status for the second functionality.

Abstract: A scalable test platform includes a PCIe-based event fabric. One or more instrument subsystems are coupled to the PCIe-based event fabric and configured to interface one or more devices under test and generate captured test data.

Abstract: A method, computer program product, and computing system for, upon the occurrence of a computer-related event, comparing code utilized by one or more subsystems included within a scalable test platform to code available from a remote location. If the code available from the remote location is newer than the code utilized by one or more subsystems, the code available from the remote location is obtained, thus defining newer code. The code utilized by one or more subsystems is updated with the newer code.

Abstract: A segmented subsystem, for use within an automated test platform, includes a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment. A second subsystem segment includes a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment.

Abstract: A segmented subsystem, for use within an automated test platform, includes a first subsystem segment configured to execute one or more instructions within the first subsystem segment. A second subsystem segment is configured to execute one or more instructions within the second subsystem segment. The first subsystem segment includes: a first functionality, a second functionality, and a status polling engine. The status polling engine is configured to: determine a first status for the first functionality and a second status for the second functionality, and generate a consolidated status indicator for the first subsystem segment based, at least in part, upon the first status for the first functionality and the second status for the second functionality.

Abstract: A scalable test platform includes a PCIe-based event fabric. One or more CPU subsystems are coupled to the PCIe-based event fabric and configured to execute an automated test process. One or more instrument subsystems are coupled to the PCIe-based event fabric and configured to interface one or more devices under test.