Patents by Inventor Russell Gilabert

Russell Gilabert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MULTIMODAL INSPECTION SYSTEM
    Publication number: 20240062330
    Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.
    Type: Application
    Filed: August 30, 2023
    Publication date: February 22, 2024
    Applicant: Battelle Memorial Institute
    Inventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley
  • Multimodal inspection system
    Patent number: 11756157
    Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.
    Type: Grant
    Filed: March 29, 2021
    Date of Patent: September 12, 2023
    Assignee: BATTELLE MEMORIAL INSTITUTE
    Inventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley
  • TECHNOLOGIES FOR VERIFYING AND VALIDATING ELECTRONIC DEVICES USING ELECTROLUMINESCENCE
    Publication number: 20230194599
    Abstract: In an approach to inspecting integrated circuits, a system includes a first detection system and a second detection system for measuring electroluminescent (EL) images from a device under test (DUT); and a controller. The controller is configured to: measure EL emissions from the DUT with the first and the second detection systems to obtain a first and a second EL test data; compare the first and the second EL test data to a reference model of a reference device, the reference model developed based on measured EL reference data, synthetic EL reference data, or a combination thereof obtained from the reference device or a reference design of the reference device; and determine whether the DUT is in accordance with the reference device, based at least in part on the comparison of the first and the second EL test data to the reference model of the reference device.
    Type: Application
    Filed: December 20, 2022
    Publication date: June 22, 2023
    Inventors: Russell GILABERT, Thomas KENT, Katie T. LISZEWSKI, Christian MEADOWS, Jeffrey A. SIMON
  • MULTIMODAL INSPECTION SYSTEM
    Publication number: 20220020114
    Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.
    Type: Application
    Filed: March 29, 2021
    Publication date: January 20, 2022
    Applicant: Battelle Memorial Institute
    Inventors: Anthony George, Thomas Kent, Blaine Miller, Katie Liszewski, Russell Gilabert, Timothy McDonley