Abstract: A method for detecting a leakage current path in a circuit is presented. The method may be used for identifying a leakage current path in an analog circuit and induced by the presence of a high voltage. The method includes several steps. A circuit design description of the circuit is received. The circuit design description is then interrogated to identify a set of candidate components having a first terminal coupled to a voltage source adapted to provide a voltage above a predefined value. Then for each electronic component in the set, a second terminal coupled to ground is searched. Upon identification of the second terminal coupled to ground a leakage path is reported. The method may be used for identifying a leakage current path induced by the presence of a high voltage in conjunction with the presence of parasitic devices.