Patents by Inventor Russell Houghton

Russell Houghton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7203102
    Abstract: A semiconductor memory having at least one memory cell adapted to store a data value, and adapted to be connected to a data line through a switch device controlled by a control signal. The invention also relates to a tri-state driver device for driving the control signal. Further, there is a method for operating a memory, in which the memory has a memory cell adapted to store a data value, and adapted to be connected to a data line through a switch device controlled by a control signal.
    Type: Grant
    Filed: October 27, 2004
    Date of Patent: April 10, 2007
    Assignee: Infineon Technologies, AG
    Inventors: Martin Brox, Russell Houghton, Helmut Schneider, Sabine Kieser
  • Publication number: 20060289864
    Abstract: A programmable element that has a first diode having an electrode and a first insulator disposed between the substrate and said electrode of said first device, said first insulator having a first value of a given characteristic, and an FET having an electrode and a second insulator disposed between the substrate and said electrode of said second device, said second insulator having a second value of said given characteristic that is different from said first value. The electrodes of the diode and the FET are coupled to one another, and a source of programming energy is coupled to the diode to cause it to permanently decrease in resistivity when programmed. The programmed state of the diode is indicated by a current in the FET, which is read by a sense latch. Thus a small resistance change in the diode translates to a large signal gain/change in the latch. This allows the diode to be programmed at lower voltages.
    Type: Application
    Filed: July 7, 2006
    Publication date: December 28, 2006
    Inventors: John Fifield, Russell Houghton, William Tonti
  • Publication number: 20060232326
    Abstract: A reference circuit that includes a first circuit configured to provide a temperature dependent current, a second circuit configured to provide a first current, and a third circuit. The third circuit is configured to provide a temperature dependent voltage based on the first current and the temperature dependent current. The temperature dependent voltage has a voltage versus temperature slope established by the third circuit and a voltage level established by the first current.
    Type: Application
    Filed: April 18, 2005
    Publication date: October 19, 2006
    Inventors: Helmut Seitz, Russell Houghton, Ernst Stahl
  • Publication number: 20060087896
    Abstract: The invention relates to semiconductor memories and in particular to DRAMs. A semiconductor memory is provided comprising at least one memory cell adapted to store a data value, and adapted to be connected to a data line through a switch device controlled by a control signal, further comprising a tri-state driver device for driving the control signal. Further, a method for operating a memory is provided, the memory comprising a memory cell adapted to store a data value, and adapted to be connected to a data line through a switch device controlled by a control signal, the method comprising the steps: driving the control signal at a first voltage level when a read operation is to be performed; and driving the control signal at a second voltage level different from the first voltage level when a write operation is to be performed. Advantageously, the first voltage level used for the read operation is lower than the second voltage level used for the write operation.
    Type: Application
    Filed: October 27, 2004
    Publication date: April 27, 2006
    Applicant: INFINEON TECHNOLOGIES AG
    Inventors: Martin Brox, Russell Houghton, Helmut Schneider, Sabine Kieser
  • Publication number: 20050145983
    Abstract: An anti-fuse structure that can be programmed at low voltage and current and which potentially consumes very little chip spaces and can be formed interstitially between elements spaced by a minimum lithographic feature size is formed on a composite substrate such as a silicon-on-insulator wafer by etching a contact through an insulator to a support semiconductor layer, preferably in combination with formation of a capacitor-like structure reaching to or into the support layer. The anti-fuse may be programmed either by the selected location of conductor formation and/or damaging a dielectric of the capacitor-like structure. An insulating collar is used to surround a portion of either the conductor or the capacitor-like structure to confine damage to the desired location. Heating effects voltage and noise due to programming currents are effectively isolated to the bulk silicon layer, permitting programming during normal operation of the device.
    Type: Application
    Filed: February 11, 2005
    Publication date: July 7, 2005
    Inventors: Claude Bertin, Ramachandra Divakaruni, Russell Houghton, Jack Mandelman, William Tonti