Abstract: A remote delay regulator circuit measures the effects of intrinsic propagation delays experienced by a system clock signal propagating through an extended clock distribution path that encompasses a clock repeater chip, a module transmission network and a clock distribution network of an integrated circuit (IC) chip. Delay measurement of the associated (IC) chips on the module is provided by sensing the clock signal at the beginning of the network and at the end of the network. The BEFORE and AFTER sense taps are routed to a signal generation circuit on the repeater chip where measurement signals are generated that define the beginning and end of a measurement cycle. A clock delay path circuit on the repeater chip contains the logic circuitry required to measure and compensate for the actual measured intrinsic propagation delays of the total clock transmission network.

Abstract: A remote delay regulator circuit measures the effects of intrinsic propagation delays experienced by a system clock signal propagating through an extended clock distribution path that encompasses a clock repeater chip, a module transmission network and a clock distribution network of an integrated circuit (IC) chip associated with a clock repeater chip. Circuits of the remote delay regulator are contained on the repeater chip and on the associated IC chip. Delay measurement of the remote IC clock distribution network is provided by sensing the clock signal at the beginning of the network using a BEFORE sense tap and at the end of the network using an AFTER sense tap. The BEFORE and AFTER sense taps are routed to a signal generation circuit on the repeater chip where measurement signals are generated that define the beginning and end of a measurement cycle.

Abstract: An "absolute" delay regulator of a clock repeater chip performs a precise measurement of the propagation delay of a clock signal and adjusts that delay so as to maintain a fixed-phase relationship with an input clock signal. A replica loop accurately replicates the internal path and external loading, including input and output buffers, of the chip. The output of the replica loop drives a delay line whose tapped outputs provide an absolute delay measurement. Results of the measurement are decoded and used to select an appropriate tap to another delay line used to insert a desired amount of delay to an output clock signal.

Abstract: An update synchronizer includes a two-stage synchronization unit for generating enable signals to select an output signal from among multiple input clock signals of a clock delay multiplexer. The enable signals originate from an asynchronous control signal having a phase different from that of the clock signals. A pre-synchronization logic stage transforms the asynchronous control signal into complementary synchronous control signals for use by the clock synchronization units; these synchronous control signals, in turn, are transformed into complementary selection enable signals having phases within the domains of the input clock signals. This ensures that transitions of the enable signals occur during the same clock period.

Abstract: An "absolute" delay regulator of a clock repeater chip performs a precise measurement of the propagation delay of a clock signal and adjusts that delay so as to maintain a fixed-phase relationship with an input clock signal. A replica loop accurately replicates the internal path and external loading, including input and output buffers, of the chip. The output of the replica loop drives a delay line whose tapped outputs provide an absolute delay measurement. Results of the measurement are decoded and used to select an appropriate tap to another delay line used to insert a desired amount of delay to an output clock signal.

Abstract: A test register coupled to an absolute delay regulator circuit of a clock repeater chip enables complete functional testing of a clock delay path of the regulator. The test register is connected to a measurement latch of the clock path in a "logical OR" configuration with respect to a measurement delay line and is enabled during a test mode by control logic of the repeater chip. Operationally, a sequence of logic "0" bits are forced in the measurement delay line during test mode. A state machine clears the measurement latch, and then loads a test pattern into the test register. As each bit of the register is set, a corresponding bit in the measurement latch is also set to simulate a measurement cycle; the results of the "measurement" are stored in the measurement latch. Once the test pattern is loaded, the repeater chip is placed into a measurement test mode. Execution of a measurement test cycle then propagates the test pattern throughout the clock delay path of the regulator.