Patents by Inventor Russell J Navarre

Russell J Navarre has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Surface evaluation in a stamping manufacturing process utilizing true reflection line methodology and computer graphics technology
    Patent number: 6785640
    Abstract: The present invention provides a method for evaluating a surface quality of a simulated stamping which includes the steps of obtaining a CAD model of a desired part, calculate and display at least one image of true reflect line on the CAD model, obtaining a blank mesh representative of the part before the part is formed, and processing the blank mesh with a springback simulation software to obtain a deformed finite element analysis springback blank. True reflect lines are then calculated and displayed on the deformed FEA springback blank, and the reflect lines are compared with the true reflect lines on the CAD model to determine variance of the deformed springback blank with the CAD model.
    Type: Grant
    Filed: August 7, 2000
    Date of Patent: August 31, 2004
    Assignee: DaimlerChrysler Corporation
    Inventors: Yun Lu, Russell J Navarre, Li Zhang