Abstract: Various embodiments of the present disclosure are directed towards a method for forming a semiconductor structure, the method includes forming a buffer layer over a substrate. An active layer is formed on the buffer layer. A top electrode is formed on the active layer. An etch process is performed on the buffer layer and the substrate to define a plurality of pillar structures. The plurality of pillar structures include a first pillar structure laterally offset from a second pillar structure. At least portions of the first and second pillar structures are spaced laterally between sidewalls of the top electrode.

Abstract: A programmable testing apparatus imposes power interruptions on a storage device at any given point of time under at least one workload according to at least one protocol for tests. The programmable testing apparatus includes a controller unit connected to a workload unit, a power control unit, a protocol control unit and a data buffer unit. The controller unit calculates and receives and replies commands in the tests. The workload unit imposes various workloads on the storage device. The power control unit imposes power interruptions on the storage device under control of the controller unit. The protocol control unit provides commands according to the protocol for tests. The data buffer unit stores critical data and information to check whether data stored in the storage device are correct.

Abstract: A programmable testing apparatus imposes power interruptions on a storage device at any given point of time under at least one workload according to at least one protocol for tests. The programmable testing apparatus includes a controller unit connected to a workload unit, a power control unit, a protocol control unit and a data buffer unit. The controller unit calculates and receives and replies commands in the tests. The workload unit imposes various workloads on the storage device. The power control unit imposes power interruptions on the storage device under control of the controller unit. The protocol control unit provides commands according to the protocol for tests. The data buffer unit stores critical data and information to check whether data stored in the storage device are correct.

Abstract: A programmable testing apparatus imposes power interruptions on a storage device at any given point of time under at least one workload according to at least one protocol for tests. The programmable testing apparatus includes a controller unit connected to a workload unit, a power control unit, a protocol control unit and a data buffer unit. The controller unit calculates and receives and replies commands in the tests. The workload unit imposes various workloads on the storage device. The power control unit imposes power interruptions on the storage device under control of the controller unit. The protocol control unit provides commands according to the protocol for tests. The data buffer unit stores critical data and information to check whether data stored in the storage device are correct.