Patents by Inventor Ryan Amelia Beiermeister

Ryan Amelia Beiermeister has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10810772
    Abstract: A method and system for drawing a stack graph that includes a timeline and one or more stack lines based on a set of event data. A stack line may be associated with an event target and may include one or more event overlays that represent event objects. In one implementation, event overlays may include a visual characteristic that identifies an event source associated with the event object of the event overlay.
    Type: Grant
    Filed: May 11, 2020
    Date of Patent: October 20, 2020
    Assignee: Palantir Technologies Inc.
    Inventors: Julie Noelle Tibshirani, Ryan Amelia Beiermeister, Daniel Patrick Cervelli, Timothy James Slatcher, Gregory DeJuan Martin, Antoine Alexandre Adrien Llorca, Timothy James Wilson
  • Publication number: 20200273221
    Abstract: A method and system for drawing a stack graph that includes a timeline and one or more stack lines based on a set of event data. A stack line may be associated with an event target and may include one or more event overlays that represent event objects. In one implementation, event overlays may include a visual characteristic that identifies an event source associated with the event object of the event overlay.
    Type: Application
    Filed: May 11, 2020
    Publication date: August 27, 2020
    Inventors: Julie Noelle Tibshirani, Ryan Amelia Beiermeister, Daniel Patrick Cervelli, Timothy James Slatcher, Gregory DeJuan Martin, Antoine Alexandre Adrien Llorca, Timothy James Wilson
  • Patent number: 10650558
    Abstract: A method and system for drawing a stack graph that includes a timeline and one or more stack lines based on a set of event data. A stack line may be associated with an event target and may include one or more event overlays that represent event objects. In one implementation, event overlays may include a visual characteristic that identifies an event source associated with the event object of the event overlay.
    Type: Grant
    Filed: April 4, 2016
    Date of Patent: May 12, 2020
    Assignee: Palantir Technologies Inc.
    Inventors: Julie Noelle Tibshirani, Ryan Amelia Beiermeister, Daniel Patrick Cervelli, Timothy James Slatcher, Gregory DeJuan Martin, Antoine Alexandre Adrien Llorca, Timothy James Wilson
  • Publication number: 20170287179
    Abstract: A method and system for drawing a stack graph that includes a timeline and one or more stack lines based on a set of event data. A stack line may be associated with an event target and may include one or more event overlays that represent event objects. In one implementation, event overlays may include a visual characteristic that identifies an event source associated with the event object of the event overlay.
    Type: Application
    Filed: April 4, 2016
    Publication date: October 5, 2017
    Inventors: Julie Noelle Tibshirani, Ryan Amelia Beiermeister, Daniel Patrick Cervelli, Timothy James Slatcher, Gregory DeJuan Martin, Antoine Alexandre Adrien Llorca, Timothy James Wilson