Abstract: Examples disclosed herein relate to set-reset (SR) latch circuits and methods for manufacturing the same. In some of the disclosed examples, a SR latch circuit includes an inverter storage loop for storing state information and a set of p-channel field-effect transistors (PFETs) for control circuitry. The PFETs may include first and second PFETs connected to a first node of the inverter storage loop, and third and fourth PFETs connected to a second node of the inverter storage loop. Gate terminals of the first and fourth PFETs may be connected to a first control input, and gate terminals of the second and third PFETs may be connected to a second control input.

Abstract: One embodiment can provide a sampler for a decision feedback equalizer (DFE). The sampler can include a comparator comprising a resolver and a plurality of amplifiers coupled to the resolver. The plurality of amplifiers are to receive an input signal and one or more feedback signals, and the plurality of amplifiers are coupled to each other in parallel, thereby facilitating a summation of the input signal and the one or more feedback signals. The comparator is to generate an output based on the summation of the input signals and the one or more feedback signals. The sampler can further include an inverter to invert the output of the comparator. The inverted output of the inverter is sent to a tap-1 amplifier to generate a tap-1 feedback signal to be sent to the comparator at a next unit interval (UI).

Abstract: A comparator includes a resolver controlled by a resolver clock signal and a differential amplifier controlled by a sampling clock signal. The resolver clock signal and the sampling clock signal are such that amplification at the differential amplifier during the reset phase of the resolver clock signal and the reset phase of the sampling clock signal begins during the resolving phase of the resolver.

Abstract: A comparator includes a resolver controlled by a resolver clock signal and a differential amplifier controlled by a sampling clock signal. The resolver clock signal and the sampling clock signal are such that amplification at the differential amplifier during the reset phase of the resolver clock signal and the reset phase of the sampling clock signal begins during the resolving phase of the resolver.

Abstract: Examples disclosed herein relate to set-reset (SR) latch circuits and methods for manufacturing the same. In some of the disclosed examples, a SR latch circuit includes an inverter storage loop for storing state information and a set of p-channel field-effect transistors (PFETs) for control circuitry. The PFETs may include first and second PFETs connected to a first node of the inverter storage loop, and third and fourth PFETs connected to a second node of the inverter storage loop. Gate terminals of the first and fourth PFETs may be connected to a first control input, and gate terminals of the second and third PFETs may be connected to a second control input.

Abstract: Examples disclosed herein relate to set-reset (SR) latch circuits and methods for manufacturing the same. In some of the disclosed examples, a SR latch circuit includes an inverter storage loop for storing state information and a set of p-channel field-effect transistors (PFETs) for control circuitry. The PFETs may include first and second PFETs connected to a first node of the inverter storage loop, and third and fourth PFETs connected to a second node of the inverter storage loop. Gate terminals of the first and fourth PFETs may be connected to a first control input, and gate terminals of the second and third PFETs may be connected to a second control input.

Abstract: Examples disclosed herein relate to set-reset (SR) latch circuits and methods for manufacturing the same. In some of the disclosed examples, a SR latch circuit includes an inverter storage loop for storing state information and a set of p-channel field-effect transistors (PFETs) for control circuitry. The PFETs may include first and second PFETs connected to a first node of the inverter storage loop, and third and fourth PFETs connected to a second node of the inverter storage loop. Gate terminals of the first and fourth PFETs may be connected to a first control input, and gate terminals of the second and third PFETs may be connected to a second control input.