Patents by Inventor Ryan Bazinet

Ryan Bazinet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for glitch analysis in circuits
    Patent number: 7809542
    Abstract: A system and method for analyzing power glitch in circuits includes simulating a circuit to provide waveform responses at positions of interest in the circuit. Each waveform response is processed to determine glitch power by comparing optimal energy to actual energy for the waveform. The circuit is adjusted to reduce loss due to the glitch power.
    Type: Grant
    Filed: May 7, 2007
    Date of Patent: October 5, 2010
    Assignee: International Business Machines Corporation
    Inventors: Ryan Bazinet, James Scott Neely
  • SYSTEM AND METHOD FOR GLITCH ANALYSIS IN CIRCUITS
    Publication number: 20080281574
    Abstract: A system and method for analyzing power glitch in circuits includes simulating a circuit to provide waveform responses at positions of interest in the circuit. Each waveform response is processed to determine glitch power by comparing optimal energy to actual energy for the waveform. The circuit is adjusted to reduce loss due to the glitch power.
    Type: Application
    Filed: May 7, 2007
    Publication date: November 13, 2008
    Inventors: Ryan Bazinet, James Scott Neely