Abstract: In some aspects, an apparatus is provided. The apparatus includes a plurality of memory arrays, a latch, and a selection circuit coupled to the plurality of memory arrays and to the latch. The selection circuit may be operative to receive a bit from each of a plurality of memory arrays select one of the plurality of memory arrays, and store the bit from the selected memory array. Numerous other aspects are provided.

Abstract: A device maintains a state of a precharged dot line that is periodically precharged by a global precharge signal. The device includes a data input signal that can have a selected one of a first value and a second value. The first value is a value that would be reflected by the dot line being in a charged state. A precharge circuit is responsive to a global precharge signal and is configured to precharge the dot line. A guaranteed write through logic device is responsive to the data input signal. The guaranteed write through logic device ensures that charge is applied to the dot line whenever the data. A guaranteed write through inhibitor that is responsive to a write through gate signal is configured to inhibit selectively the guaranteed write through logic device from applying charge to the dot line when the write through gate signal is in a guarantee inhibit state.

Abstract: In some aspects, a method is provided for testing an integrated circuit (IC). The method includes the steps of selecting a bit from each of a plurality of memory arrays formed on an IC chip, selecting one of the plurality of memory arrays, and storing the selected bit from the selected memory array. Numerous other aspects are provided.

Abstract: In some aspects a method is provided for testing an integrated circuit (IC). The method includes the steps of selecting a bit from each of a plurality of memory arrays formed on an IC chip, selecting one of the plurality of memory arrays, and storing the selected bit from the selected memory array. Numerous other aspects are provided.

Abstract: A glitch protect valid cell and method for maintaining a desired logic state value. The glitch protect valid cell includes a memory element, a state machine, and a glitch protect circuit. The glitch protect circuit includes a propagation delay assembly coupled to a restore assembly. The propagation delay assembly includes a first pull down network coupled to a NOR gate. The restore assembly includes a second pull down network coupled to the propagation delay assembly. Responsive to a glitch signal and timing signal, the first pull down network resets the initial state value of a true valid bit to ultimately enable a pull up network in the NOR gate. Responsive to enablement of the NOR gate pull up network, the second pull down network resets the complement valid bit in the memory element to consequently restore the initial state of the true valid bit.