Patents by Inventor Ryan Elliot Eckman

Ryan Elliot Eckman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multifunction solid-state inspection system
    Patent number: 9007572
    Abstract: An inspection system includes optical components for operating the inspection system in an interference fringe imaging mode and a microscope imaging mode. The inspection system further includes at least one optical light source configured to emit a first wavelength of light to operate the inspection system in the interference fringe imaging mode and configure to emit a second wavelength of light to operate the inspection system in the microscope mode. The first wavelength of light is different from the second wavelength of light.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: April 14, 2015
    Assignee: Promet International, Inc.
    Inventors: Ryan Elliot Eckman, Peter David Koudelka, Lubomir Koudelka
  • MULTIFUNCTION SOLID-STATE INSPECTION SYSTEM
    Publication number: 20140268109
    Abstract: An inspection system includes optical components for operating the inspection system in an interference fringe imaging mode and a microscope imaging mode. The inspection system further includes at least one optical light source configured to emit a first wavelength of light to operate the inspection system in the interference fringe imaging mode and configure to emit a second wavelength of light to operate the inspection system in the microscope mode. The first wavelength of light is different from the second wavelength of light.
    Type: Application
    Filed: March 13, 2013
    Publication date: September 18, 2014
    Applicant: PROMET International, Inc.
    Inventors: Ryan Elliot Eckman, Peter David Koudelka, Lubomir Koudelka
  • Coaxial interferometer and inspection probe
    Patent number: 8705041
    Abstract: An optical probe has optical components of an interferometer and includes an optical axis, at least one optical source for emitting light along an illumination path that is at least partially coaxial with the optical axis, a first beam splitter and a first lens. The first beam splitter intersects the optical axis and splits the light from the at least one optical source into a first beam for traveling along a reference path that is coaxial with the optical axis to a reference surface and a second beam for traveling along a test path that is coaxial with the optical axis to a specimen. The first lens is interposed along the reference path.
    Type: Grant
    Filed: May 20, 2011
    Date of Patent: April 22, 2014
    Assignee: Promet International, Inc.
    Inventors: Ryan Elliot Eckman, Peter David Koudelka, Lubomir Koudelka
  • COAXIAL INTERFEROMETER AND INSPECTION PROBE
    Publication number: 20120133946
    Abstract: An optical probe has optical components of an interferometer and includes an optical axis, at least one optical source for emitting light along an illumination path that is at least partially coaxial with the optical axis, a first beam splitter and a first lens. The first beam splitter intersects the optical axis and splits the light from the at least one optical source into a first beam for traveling along a reference path that is coaxial with the optical axis to a reference surface and a second beam for traveling along a test path that is coaxial with the optical axis to a specimen. The first lens is interposed along the reference path.
    Type: Application
    Filed: May 20, 2011
    Publication date: May 31, 2012
    Applicant: PROMET INTERNATIONAL, INC.
    Inventors: Ryan Elliot Eckman, Peter David Koudelka, Lubomir Koudelka
  • Method and device for inspecting a surface of an optical component
    Patent number: 7667831
    Abstract: The present invention provides an inspection system for inspecting a surface of an optical specimen. The inspection system includes an optical testing device having a main body and an optical axis. The optical testing device includes an optical imaging system housed in the main body. The optical imaging system includes imaging components for acquiring a microscope visual image and for acquiring at least one interference fringe image of the surface of the optical specimen. The optical testing device also includes a translational mechanism housed in the main body and configured to allow linear movement of the optical imaging system and to prevent off-axis movement of the optical imaging system.
    Type: Grant
    Filed: November 9, 2007
    Date of Patent: February 23, 2010
    Assignee: PROMET International, Inc.
    Inventors: Lubomir Koudelka, Steven M. Arnold, Peter David Koudelka, Ryan Elliot Eckman, Eric Karl Lindmark
  • Optical fiber inspection device
    Patent number: 7312859
    Abstract: The present invention provides an inspection system for inspecting a surface of an optical specimen. The inspection system includes an optical testing device having a main body and an optical axis. The optical testing device includes an optical imaging system housed in the main body. The optical imaging system includes imaging components for acquiring a microscope visual image and for acquiring at least one interference fringe image of the surface of the optical specimen. The optical testing device also includes a translational mechanism housed in the main body and configured to allow linear movement of the optical imaging system and to prevent off-axis movement of the optical imaging system.
    Type: Grant
    Filed: January 28, 2005
    Date of Patent: December 25, 2007
    Assignee: PROMET International, Inc.
    Inventors: Lubomir Koudelka, Steven M. Arnold, Peter David Koudelka, Ryan Elliot Eckman, Eric Karl Lindmark