Abstract: The present invention generally relates to a protected metallic or metallized scanning probe microscopy tip for apertureless near-field optical applications which comprise a metallic tip or a metallic structure covering a scanning probe microscopy tip, protected by an ultrathin dielectric layer. In one embodiment, the protective layer is comprised of SiOx, AI2O3, or any other hard ultrathin dielectric layer that extends the lifetime of the tip by providing mechanical, chemical, and thermal protection to the entire structure.

Abstract: A microscope for performing apertureless near-field scanning optical microscopy on a sample comprising a means for mounting a sample; a scanning probe; means for illuminating the sample with light along optical axes from at least two illumination angles relative to an imaginary line connecting the probe and the sample; means for enhancing the electric field of light in a region of the sample with the probe; means for scanning the sample in a plane perpendicular to an imaginary line connecting the probe and the sample; means for moving said sample along said imaginary line to maintain a nearly constant distance between the probe and the sample; and means for collecting light scattered, emitted, or transmitted from the sample.