Abstract: An approach for power supply noise mitigation on a processor is provided. In one aspect, the approach comprises a central computing unit operatively coupled to the processor to execute program operations. The approach further comprises a calibration circuit adapted to determine a first threshold on the processor to be used for comparison performed dynamically through the use of a detection circuit. A detection circuit adapted to dynamically monitor system operation of the processor and indicate if the first threshold is violated and a counting circuit adapted to prevent voltage from drooping if one or more voltage sensing measurements violates the first threshold are also provided.

Abstract: An approach for power supply noise mitigation on a processor is provided. In one aspect, the approach comprises a central computing unit operatively coupled to the processor to execute program operations. The approach further comprises a calibration circuit adapted to determine a first threshold on the processor to be used for comparison performed dynamically through the use of a detection circuit. A detection circuit adapted to dynamically monitor system operation of the processor and indicate if the first threshold is violated and a counting circuit adapted to prevent voltage from drooping if one or more voltage sensing measurements violates the first threshold are also provided.

Abstract: An approach for power supply noise mitigation on a processor is provided. In one aspect, the approach comprises a central computing unit operatively coupled to the processor to execute program operations. The approach further comprises a calibration circuit adapted to determine a first threshold on the processor to be used for comparison performed dynamically through the use of a detection circuit. A detection circuit adapted to dynamically monitor system operation of the processor and indicate if the first threshold is violated and a counting circuit adapted to prevent voltage from drooping if one or more voltage sensing measurements violates the first threshold are also provided.

Abstract: A method, system, and computer program product for changing hardware in a data processing system without disrupting processes executing on the data processing system. A hardware change to a selected portion of hardware in the data processing system may be required, such as to repair hardware errors or to implement a system update. Responsive to a determination that a hardware change to the selected portion of the hardware is required, a process being performed by the selected portion is moved from the selected portion of the hardware to an alternate portion of the hardware. The hardware change is applied to the selected portion of the hardware. The selected portion of the hardware is returned for use by the data processing system after the hardware change is applied.

Abstract: An approach for power supply noise mitigation on a processor is provided. In one aspect, the approach comprises a central computing unit operatively coupled to the processor to execute program operations. The approach further comprises a calibration circuit adapted to determine a first threshold on the processor to be used for comparison performed dynamically through the use of a detection circuit. A detection circuit adapted to dynamically monitor system operation of the processor and indicate if the first threshold is violated and a counting circuit adapted to prevent voltage from drooping if one or more voltage sensing measurements violates the first threshold are also provided.

Abstract: An embodiment is a method includes writing a first set of memory device parameters to a first mode register in a memory device, wherein the first set of memory device parameters correspond to a first frequency, monitoring selected parameters for the memory system while the memory device operates at the first frequency and predicting a second frequency that the memory device will operate at subsequent to the first frequency, the predicting being based on the monitored selected parameters. The method further includes writing a second set of memory device parameters to second mode register in the memory device, receiving a frequency change request at a memory controller associated with the memory device, the frequency change request to operate at a new frequency and updating the first mode register with the second set of memory device parameters from the second mode register responsive to the new frequency being equal to the second frequency.

Abstract: An embodiment is a method for operating a memory system, the method including storing initial calibration values for each of a first frequency and second frequency for a memory device, performing a periodic calibration to determine a calibration update value for operation of the memory device at the first frequency, combining the calibration update value with the initial calibration value for the first frequency to provide an updated calibration for operation of the memory device at an operating frequency of the first frequency and receiving a frequency change request at a memory controller associated with the memory device. The method further includes blocking traffic to the memory device, adjusting operating frequency to the second frequency while the memory device remains powered, combining the calibration update value with the initial calibration value for the second frequency for operation at the second frequency and enabling traffic to the memory device.

Abstract: A method, system, and computer program product for changing hardware in a data processing system without disrupting processes executing on the data processing system. A hardware change to a selected portion of hardware in the data processing system may be required, such as to repair hardware errors or to implement a system update. Responsive to a determination that a hardware change to the selected portion of the hardware is required, a process being performed by the selected portion is moved from the selected portion of the hardware to an alternate portion of the hardware. The hardware change is applied to the selected portion of the hardware. The selected portion of the hardware is returned for use by the data processing system after the hardware change is applied.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.