Patents by Inventor Ryan Major

Ryan Major has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250123192
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Application
    Filed: October 24, 2024
    Publication date: April 17, 2025
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Patent number: 12140571
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Grant
    Filed: December 16, 2021
    Date of Patent: November 12, 2024
    Assignee: Bruker Nano, Inc.
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Publication number: 20220357251
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Application
    Filed: December 16, 2021
    Publication date: November 10, 2022
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Patent number: 11237087
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: February 1, 2022
    Assignee: Bruker Nano, Inc.
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Publication number: 20200408655
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Application
    Filed: April 10, 2020
    Publication date: December 31, 2020
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Patent number: 10663380
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Grant
    Filed: October 17, 2016
    Date of Patent: May 26, 2020
    Assignee: Bruker Nano, Inc.
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Patent number: 10241017
    Abstract: A sample gripping and heating assembly includes an assembly housing and first and second heating grips coupled with the assembly housing. The first and second heating grips each include a gripping surface, and the gripping surfaces of the first and second heating grips are opposed to each other. Each of the first and second heating grips further includes a heating element adjacent to the gripping surface. Optionally, the sample gripping and heating assembly is included in a heating system including a probe heater having a probe heating element for heating of a probe. The heating system is included with a testing assembly having a stage coupled with the sample gripping and heating assembly, and a transducer assembly coupled with the probe heater.
    Type: Grant
    Filed: November 28, 2012
    Date of Patent: March 26, 2019
    Assignee: Bruker Nano, Inc.
    Inventors: Lucas Paul Keranen, Syed Amanulla Syed Asif, Ryan Major, Yunje Oh
  • Patent number: 9829417
    Abstract: An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: November 28, 2017
    Assignee: Hysitron, Inc.
    Inventors: Roger William Schmitz, Ude D. Hangen, Lucas Paul Keranen, Ryan Major, Yunje Oh, Jeremiah Vieregge, Christopher David Young
  • Patent number: 9804072
    Abstract: A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.
    Type: Grant
    Filed: November 28, 2012
    Date of Patent: October 31, 2017
    Assignee: Hysitron, Inc.
    Inventors: Syed Amanulla Syed Asif, Edward Cyrankowski, Lucas Paul Keranen, Ryan Major, Yunje Oh, Oden Lee Warren, Maciej W. Misiak
  • Publication number: 20170030812
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Application
    Filed: October 17, 2016
    Publication date: February 2, 2017
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Patent number: 9472374
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Grant
    Filed: September 28, 2012
    Date of Patent: October 18, 2016
    Assignee: HYSITRON, INC.
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Patent number: 9335240
    Abstract: A system and method of measuring an interaction force is disclosed. One embodiment includes providing a method of measuring an interaction force including providing a microelectromechanical transducer. The transducer includes a body, a probe moveable relative to the body, and a micromachined comb drive. The micromachined comb drive includes a differential capacitive displacement sensor to provide a sensor output signal representative of an interaction force on the probe. The probe is moved relative to a sample surface. An interaction force is determined between the probe and the sample surface using the sensor output, as the probe is moved relative to the sample surface.
    Type: Grant
    Filed: November 28, 2012
    Date of Patent: May 10, 2016
    Assignee: Hysitron Incorporated
    Inventors: Yunje Oh, Ryan Major, Douglas Stauffer, Syed Amanula Syed Asif
  • Publication number: 20150185117
    Abstract: An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity.
    Type: Application
    Filed: March 14, 2013
    Publication date: July 2, 2015
    Applicant: Hysitron, Inc.
    Inventors: Roger William Schmitz, Ude D. Hangen, Lucas Paul Keranen, Ryan Major, Yunje Oh, Jeremiah Vieregge, Christopher David Young
  • Publication number: 20150075264
    Abstract: An objective testing module includes a module base configured for coupling with an objective turret of a microscope. The objective testing module includes a mechanical testing assembly. The mechanical testing assembly is configured to mechanically test a sample at macro scale or less, and quantitatively determine one or more properties of the sample based on the mechanical testing. The mechanical testing assembly optionally includes a probe and one or more transducers coupled with the probe. The transducer measures one or more of force applied to a sample by the probe or displacement of the probe within the sample. In operation, an optical instrument locates a test location on a sample and the objective testing module mechanically tests at the test location with the mechanical testing assembly at a macro scale or less. The mechanical testing assembly further determines one or more properties of the sample according to the mechanical test.
    Type: Application
    Filed: March 13, 2013
    Publication date: March 19, 2015
    Inventors: Syed Amanulla Syed Asif, Rajiv Dama, Ryan Major
  • Publication number: 20150033835
    Abstract: A heating system for use in mechanical testing at scales of microns or less includes a stage heater. The stage heater having a stage plane, and a stage heating element distributed across the stage plane. Two or more support mounts are on opposed sides of the stage plane. A first bridge extends from the stage plane to a first mount of the two or more support mounts, and a second bridge extends from the stage plane to a second mount of the two or more support mounts. The first and second bridges provide a plurality of supports between the stage plane and two or more support mounts to accordingly support the stage plane. In another example, the heating system includes a probe heater configured to heat a probe as part of mechanical testing.
    Type: Application
    Filed: November 28, 2012
    Publication date: February 5, 2015
    Inventors: Syed Amanulla Syed Asif, Edward Cyrankowski, Lucas Paul Keranen, Ryan Major, Yunjie Oh, Oden Lee Warren
  • Publication number: 20140331782
    Abstract: A sample gripping and heating assembly includes an assembly housing and first and second heating grips coupled with the assembly housing. The first and second heating grips each include a gripping surface, and the gripping surfaces of the first and second heating grips are opposed to each other. Each of the first and second heating grips further includes a heating element adjacent to the gripping surface. Optionally, the sample gripping and heating assembly is included in a heating system including a probe heater having a probe heating element for heating of a probe. The heating system is included with a testing assembly having a stage coupled with the sample gripping and heating assembly, and a transducer assembly coupled with the probe heater.
    Type: Application
    Filed: November 28, 2012
    Publication date: November 13, 2014
    Inventors: Lucas Paul Keranen, Syed Amanulla Syed Asif, Ryan Major, Yunje Oh
  • Patent number: 8844366
    Abstract: A testing instrument for mechanical testing at nano or micron scale includes a transducer body, and a coupling shaft coupled with a probe tip. A transducer body houses a capacitor. The capacitor includes first and second counter electrodes and a center electrode assembly interposed therebetween. The center electrode assembly is movable with the coupling shaft relative to the first and second counter electrodes, for instance in one or more of dimensions including laterally and normally. The center electrode assembly includes a center plate coupled with the coupling shaft and one or more springs extending from the center plate. Upper and lower plates are coupled with the center plate and cover the center plate and the one or more springs. A shaft support assembly includes one or more support elements coupled along the coupling shaft. The shaft support assembly provides lateral support to the coupling shaft.
    Type: Grant
    Filed: March 9, 2012
    Date of Patent: September 30, 2014
    Assignee: Hysitron, Inc.
    Inventors: Oden Lee Warren, Syed Amanulla Syed Asif, Yunje Oh, Yuxin Feng, Edward Cyrankowski, Ryan Major
  • Publication number: 20140231670
    Abstract: A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
    Type: Application
    Filed: September 28, 2012
    Publication date: August 21, 2014
    Applicant: Hysitron, Inc.
    Inventors: Edward Cyrankowski, Syed Amanulla Syed Asif, Ryan Major, Derek Rasugu, Yuxin Feng
  • Publication number: 20140150562
    Abstract: A testing instrument for mechanical testing at nano or micron scale includes a transducer body, and a coupling shaft coupled with a probe tip. A transducer body houses a capacitor. The capacitor includes first and second counter electrodes and a center electrode assembly interposed therebetween. The center electrode assembly is movable with the coupling shaft relative to the first and second counter electrodes, for instance in one or more of dimensions including laterally and normally. The center electrode assembly includes a center plate coupled with the coupling shaft and one or more springs extending from the center plate. Upper and lower plates are coupled with the center plate and cover the center plate and the one or more springs. A shaft support assembly includes one or more support elements coupled along the coupling shaft. The shaft support assembly provides lateral support to the coupling shaft.
    Type: Application
    Filed: March 9, 2012
    Publication date: June 5, 2014
    Applicant: Hysitron, Inc.
    Inventors: Oden Lee Warren, Syed Amanulla Syed Asif, Yunje Oh, Yuxin Feng, Edward Cyrankowski, Ryan Major