Patents by Inventor Ryan Manuel Lacerda

Ryan Manuel Lacerda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High throughput system for photovoltaic UV degradation testing
    Patent number: 10476432
    Abstract: High throughput systems for photovoltaic UV degradation testing of solar cells, and methods of testing for UV degradation of solar cell during manufacture, are described herein. In an example, a high throughput solar cell testing apparatus includes a plurality of real time ultra-violet (RTUV) testing modules. Each of the RTUV testing modules includes an ultra-violet (UV) light source, an optics assembly for focusing light from the UV light source on a sample area, and a detector for receiving photoluminescence energy from the sample area. The high throughput solar cell testing apparatus also includes an acquisition and control assembly coupled to the plurality of RTUV testing modules.
    Type: Grant
    Filed: December 30, 2016
    Date of Patent: November 12, 2019
    Assignee: SunPower Corporation
    Inventors: David Aitan Soltz, Yoann Buratti, Xiuwen Tu, Ryan Manuel Lacerda, Taiqing Qiu
  • HIGH THROUGHPUT SYSTEM FOR PHOTOVOLTAIC UV DEGRADATION TESTING
    Publication number: 20180041165
    Abstract: High throughput systems for photovoltaic UV degradation testing of solar cells, and methods of testing for UV degradation of solar cell during manufacture, are described herein. In an example, a high throughput solar cell testing apparatus includes a plurality of real time ultra-violet (RTUV) testing modules. Each of the RTUV testing modules includes an ultra-violet (UV) light source, an optics assembly for focusing light from the UV light source on a sample area, and a detector for receiving photoluminescence energy from the sample area. The high throughput solar cell testing apparatus also includes an acquisition and control assembly coupled to the plurality of RTUV testing modules.
    Type: Application
    Filed: December 30, 2016
    Publication date: February 8, 2018
    Inventors: David Aitan Soltz, Yoann Buratti, Xiuwen Tu, Ryan Manuel Lacerda, Taiqing Qiu