Abstract: Certain aspects of the present disclosure provide a method for processing data with an enhanced memory module comprising a compute core, including: receiving data at the enhanced memory module from a host processing system; storing the data in host processing system-addressable memory; transferring the data from the host processing system-addressable memory to compute core-addressable memory; processing the data with the compute core on the enhanced memory module to generate processed data; transferring the processed data from the compute core-addressable memory to the host processing system-addressable memory; and providing the processed data to the host processing system via the host processing system-addressable memory.

Abstract: A method of correcting defects in a storage array of a microprocessor, such as a cache memory, by operating the microprocessor to carry out a functional test procedure which utilizes cache memory, collecting fault data in a trace array during the functional test procedure, identifying a location of the defect in the cache memory using the fault data, and repairing the defect by setting a fuse to reroute access requests for the location to a redundant array. The fault data may include an error syndrome and a failing address. The functional test procedure creates random cache access sequences that cause varying loads of traffic in the cache memory using a test pattern based on a random seed. The functional test procedure may be carried out after completion of a nonfunctional, built-in self test of the microprocessor which sets some of the fuses.