Patents by Inventor Ryan Rawlins

Ryan Rawlins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11263116
    Abstract: Systems, methods, and computer-readable media for identifying a champion test case that provides an increased likelihood of exposing a fault and expanding a set of test cases to include the champion test case are described. The fault may occur in a System Under Test (SUT), which may be a hardware system or a software system. A weight may be assigned to a champion test case that indicates the relative strength of the test case in detecting faults. The weight may be used to influence the selection of other test cases.
    Type: Grant
    Filed: January 24, 2019
    Date of Patent: March 1, 2022
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins
  • Patent number: 11106567
    Abstract: Systems, methods, and computer-readable media are described for expanding test space coverage for testing performed on a System Under Test (SUT) through iterative test case generation from combinatoric pairwise outputs. At each test case generation iteration, a new set of test vectors is generated that provides complete pairwise coverage of the test space but that does not include any overlapping test vector with any previously generated set of test vectors. As such, cumulative m-wise test space coverage (where 2<m?n) is incrementally increased through each iteration until the iterative process ceases when a desired percentage of m-wise test space coverage is achieved.
    Type: Grant
    Filed: January 24, 2019
    Date of Patent: August 31, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins, Eitan Farchi
  • Patent number: 11099975
    Abstract: A method includes defining functional coverage by a first test suite based on a first functional coverage model of a System Under Test (SUT). The first test suite includes a first plurality of tests. The first functional coverage model includes a first plurality of attributes. The first functional coverage model defines possible combinations of values of the first plurality of attributes. Functional coverage by a second test suite is defined based on a second functional coverage model which includes a second plurality of attributes. The second functional coverage model defines possible combinations of values of the second plurality of attributes. Subsets of the first and second plurality of attributes are determined. The subsets of attributes include exclusively common attributes between the first and the second plurality of attributes. A subset of the tests is selected. The selected subset is operative to cover the first and second subsets of the attributes.
    Type: Grant
    Filed: January 24, 2019
    Date of Patent: August 24, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins
  • Patent number: 11010285
    Abstract: Systems, methods, and computer-readable media are described for performing fault detection and localization using Combinatorial Test Design (CTD) techniques and generating a regression bucket of test cases that expose a detected fault in a System Under Test (SUT). The SUT may be a hardware system or a software system. Further, the fault detection and localization may be performed while adhering to architectural restrictions on the SUT.
    Type: Grant
    Filed: January 24, 2019
    Date of Patent: May 18, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins, Rachel Brill
  • Patent number: 11010282
    Abstract: Systems, methods, and computer-readable media are described for performing fault detection and localization using Combinatorial Test Design (CTD) techniques and generating a regression bucket of test cases that expose a detected fault in a System Under Test (SUT). The SUT may be a hardware system or a software system. Further, the fault detection and localization may be performed while adhering to architectural restrictions on the SUT.
    Type: Grant
    Filed: January 24, 2019
    Date of Patent: May 18, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins, Rachel Brill
  • Patent number: 10990510
    Abstract: Systems, methods, and computer-readable media are described for associating regression test cases with corresponding test fingerprints via a translation table or other suitable storage mechanism. A test fingerprint indicates a collection of breakpoints encountered as part of traversal of a code path during execution of a test case, and thus, provides an indication of an extent of code coverage of the test case. Test fingerprints can be evaluated to determine cumulative code coverage of sets of test cases. Specific sets of test cases can be selected based on the cumulative code coverage they provide. Sets of test cases that provide greater cumulative code coverage and/or that target specific areas of interest can be prioritized for execution particularly when having to adhere to execution constraints.
    Type: Grant
    Filed: June 13, 2019
    Date of Patent: April 27, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins, Steven Partlow
  • Patent number: 10963366
    Abstract: Systems, methods, and computer-readable media are described for generating fingerprints for regression tests that identify code paths taken during execution of the regression tests. Breakpoint values are assigned to breakpoints encountered during execution of a regression test and a fingerprint is generated based on the assigned breakpoint values and a code path taken during execution of the regression test. Various breakpoint value assignment/fingerprint generation algorithms are described herein that generate a fingerprint from which a corresponding code path taken can be reconstructed including which breakpoints are encountered, the number of times each such breakpoint is encountered, and the order in which the breakpoints are encountered.
    Type: Grant
    Filed: June 13, 2019
    Date of Patent: March 30, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins, Steven Partlow
  • Publication number: 20200394118
    Abstract: Systems, methods, and computer-readable media are described for generating fingerprints for regression tests that identify code paths taken during execution of the regression tests. Breakpoint values are assigned to breakpoints encountered during execution of a regression test and a fingerprint is generated based on the assigned breakpoint values and a code path taken during execution of the regression test. Various breakpoint value assignment/fingerprint generation algorithms are described herein that generate a fingerprint from which a corresponding code path taken can be reconstructed including which breakpoints are encountered, the number of times each such breakpoint is encountered, and the order in which the breakpoints are encountered.
    Type: Application
    Filed: June 13, 2019
    Publication date: December 17, 2020
    Inventors: ANDREW HICKS, DALE E. BLUE, RYAN RAWLINS, STEVEN PARTLOW
  • Publication number: 20200394121
    Abstract: Systems, methods, and computer-readable media are described for associating regression test cases with corresponding test fingerprints via a translation table or other suitable storage mechanism. A test fingerprint indicates a collection of breakpoints encountered as part of traversal of a code path during execution of a test case, and thus, provides an indication of an extent of code coverage of the test case. Test fingerprints can be evaluated to determine cumulative code coverage of sets of test cases. Specific sets of test cases can be selected based on the cumulative code coverage they provide. Sets of test cases that provide greater cumulative code coverage and/or that target specific areas of interest can be prioritized for execution particularly when having to adhere to execution constraints.
    Type: Application
    Filed: June 13, 2019
    Publication date: December 17, 2020
    Inventors: ANDREW HICKS, DALE E. BLUE, RYAN RAWLINS, STEVEN PARTLOW
  • Publication number: 20200242012
    Abstract: Systems, methods, and computer-readable media are described for performing fault detection and localization using Combinatorial Test Design (CTD) techniques and generating a regression bucket of test cases that expose a detected fault in a System Under Test (SUT). The SUT may be a hardware system or a software system. Further, the fault detection and localization may be performed while adhering to architectural restrictions on the SUT.
    Type: Application
    Filed: January 24, 2019
    Publication date: July 30, 2020
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins, Rachel Brill
  • Publication number: 20200242010
    Abstract: Systems, methods, and computer-readable media are described for performing fault detection and localization using Combinatorial Test Design (CTD) techniques and generating a regression bucket of test cases that expose a detected fault in a System Under Test (SUT). The SUT may be a hardware system or a software system. Further, the fault detection and localization may be performed while adhering to architectural restrictions on the SUT.
    Type: Application
    Filed: January 24, 2019
    Publication date: July 30, 2020
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins, Rachel Brill
  • Publication number: 20200242016
    Abstract: A method includes defining functional coverage by a first test suite based on a first functional coverage model of a System Under Test (SUT). The first test suite includes a first plurality of tests. The first functional coverage model includes a first plurality of attributes. The first functional coverage model defines possible combinations of values of the first plurality of attributes. Functional coverage by a second test suite is defined based on a second functional coverage model which includes a second plurality of attributes. The second functional coverage model defines possible combinations of values of the second plurality of attributes. Subsets of the first and second plurality of attributes are determined. The subsets of attributes include exclusively common attributes between the first and the second plurality of attributes. A subset of the tests is selected. The selected subset is operative to cover the first and second subsets of the attributes.
    Type: Application
    Filed: January 24, 2019
    Publication date: July 30, 2020
    Inventors: Andrew Hicks, Dale E. Blue, RYAN RAWLINS
  • Publication number: 20200242013
    Abstract: Systems, methods, and computer-readable media for identifying a champion test case that provides an increased likelihood of exposing a fault and expanding a set of test cases to include the champion test case are described. The fault may occur in a System Under Test (SUT), which may be a hardware system or a software system. A weight may be assigned to a champion test case that indicates the relative strength of the test case in detecting faults. The weight may be used to influence the selection of other test cases.
    Type: Application
    Filed: January 24, 2019
    Publication date: July 30, 2020
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins
  • Publication number: 20200242011
    Abstract: Systems, methods, and computer-readable media are described for expanding test space coverage for testing performed on a System Under Test (SUT) through iterative test case generation from combinatoric pairwise outputs. At each test case generation iteration, a new set of test vectors is generated that provides complete pairwise coverage of the test space but that does not include any overlapping test vector with any previously generated set of test vectors. As such, cumulative m-wise test space coverage (where 2<m?n) is incrementally increased through each iteration until the iterative process ceases when a desired percentage of m-wise test space coverage is achieved.
    Type: Application
    Filed: January 24, 2019
    Publication date: July 30, 2020
    Inventors: Andrew Hicks, Dale E. Blue, Ryan Rawlins, Eitan Farchi