Abstract: A system for testing reflections within a data transmission signal includes a data transmission line configured to transmit the signal in a downstream direction, and a test probe configured to electrically contact a contact point on the transmission line and measure a magnitude of a frequency response of the signal therein. The system further includes a spectrum capturing device in operable contact with the test probe, and configured to collect and arrange data of frequency response magnitudes measured by the test probe. The data transmission line includes at least a first impedance mismatch corresponding to a first reflection point along the transmission line, and the spectrum capturing device is configured to determine a severity of the first reflection based on a comparison of a first voltage V1 with a second voltage V2, where V1 represents a DC term, and where V2 represents a reflected energy of a subsequent impulse.

Abstract: A system for testing line attenuation defects includes a data transmission line configured to transmit a forward signal in a first direction, at least one reflection point at a first location along the data transmission line, a test probe configured to (i) electrically contact a center conductor at a second location along the data transmission line, (ii) introduce a broadband data signal onto the data transmission line, and (iii) measure, at the second location, a return signal from the reflection point, and a spectrum capturing device in operable contact with the test probe. The spectrum capturing device is configured to (i) collect and arrange frequency data measured by the test probe for the test signal, the return signal, and a standing wave created by the sum of the broadband data signal and the return signal, (ii) determine the voltage VSWR of the standing wave, and (iii) calculate a line loss from the VSWR.

Abstract: A system for testing line attenuation defects includes a data transmission line configured to transmit a forward signal in a first direction, at least one reflection point at a first location along the data transmission line, a test probe configured to (i) electrically contact a center conductor at a second location along the data transmission line, (ii) introduce a broadband data signal onto the data transmission line, and (iii) measure, at the second location, a return signal from the reflection point, and a spectrum capturing device in operable contact with the test probe. The spectrum capturing device is configured to (i) collect and arrange frequency data measured by the test probe for the test signal, the return signal, and a standing wave created by the sum of the broadband data signal and the return signal, (ii) determine the voltage VSWR of the standing wave, and (iii) calculate a line loss from the VSWR.

Abstract: A system for testing line attenuation defects includes a data transmission line configured to transmit a forward signal in a first direction, at least one reflection point at a first location along the data transmission line, a test probe configured to (i) electrically contact a center conductor at a second location along the data transmission line, (ii) introduce a broadband data signal onto the data transmission line, and (iii) measure, at the second location, a return signal from the reflection point, and a spectrum capturing device in operable contact with the test probe. The spectrum capturing device is configured to (i) collect and arrange frequency data measured by the test probe for the test signal, the return signal, and a standing wave created by the sum of the broadband data signal and the return signal, (ii) determine the voltage VSWR of the standing wave, and (iii) calculate a line loss from the VSWR.

Abstract: A system for testing reflections within a data transmission signal includes a data transmission line configured to transmit the signal in a downstream direction, and a test probe configured to electrically contact a contact point on the transmission line and measure a magnitude of a frequency response of the signal therein. The system further includes a spectrum capturing device in operable contact with the test probe, and configured to collect and arrange data of frequency response magnitudes measured by the test probe. The data transmission line includes at least a first impedance mismatch corresponding to a first reflection point along the transmission line, and the spectrum capturing device is configured to determine a severity of the first reflection based on a comparison of a first voltage V1 with a second voltage V2, where V1 represents a DC term, and where V2 represents a reflected energy of a subsequent impulse.