Abstract: Methods, systems, and apparatus, including computer programs stored on computer-readable media, for retrieving relevant information content while typing are disclosed. Upon identifying text being entered by a user into a text field of a typing-enabled application, one or more keywords may be determined that match the text. The matching keywords may be presented for selection. Upon receiving a selection of a keyword, an information card related to the selected keyword may be retrieved and presented. In addition to presenting the information card, information content associated with the information card may be inserted into the text field of the typing-enabled application.

Abstract: Methods, systems, and apparatus, including computer programs stored on computer-readable media, for retrieving relevant information content while typing are disclosed. Upon identifying text being entered by a user into a text field of a typing-enabled application, one or more keywords may be determined that match the text. The matching keywords may be presented for selection. Upon receiving a selection of a keyword, an information card related to the selected keyword may be retrieved and presented. In addition to presenting the information card, information content associated with the information card may be inserted into the text field of the typing-enabled application.

Abstract: A purge system includes a purge gas distribution manifold that includes at least one port through which light beam from an optical metrology or inspection head is transmitted. The purge gas distribution manifold includes a bottom surface having one or more apertures through which purge gas is expelled. The bottom surface is held in close proximity to the top surface of the substrate and the apertures may be distributed over the bottom surface of the purge gas distribution manifold so that purge gas is uniformly distributed over the entirety of the top surface of the substrate at all measurement positions of the substrate with respect to the optical metrology or inspection head.

Abstract: A purge system includes a purge gas distribution manifold that includes at least one port through which light beam from an optical metrology or inspection head is transmitted. The purge gas distribution manifold includes a bottom surface having one or more apertures through which purge gas is expelled. The bottom surface is held in close proximity to the top surface of the substrate and the apertures may be distributed over the bottom surface of the purge gas distribution manifold so that purge gas is uniformly distributed over the entirety of the top surface of the substrate at all measurement positions of the substrate with respect to the optical metrology or inspection head.

Abstract: A purge system includes a purge gas distribution manifold that includes at least one port through which light beam from an optical metrology or inspection head is transmitted. The purge gas distribution manifold includes a bottom surface having one or more apertures through which purge gas is expelled. The bottom surface is held in close proximity to the top surface of the substrate and the apertures may be distributed over the bottom surface of the purge gas distribution manifold so that purge gas is uniformly distributed over the entirety of the top surface of the substrate at all measurement positions of the substrate with respect to the optical metrology or inspection head.