Patents by Inventor Ryan WENDLANDT

Ryan WENDLANDT has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Self-radiated loopback test procedure for millimeter wave antennas
    Patent number: 11575450
    Abstract: Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.
    Type: Grant
    Filed: October 24, 2019
    Date of Patent: February 7, 2023
    Assignee: QUALCOMM Incorporated
    Inventors: Gaurav Verma, David Collins, Ryan Wendlandt, Prachi Deshpande, Gaurav Singhania, Karthik Moncombu Ramakrishnan, Jeffrey Carr, Anushruti Bhattacharya, Dennis Feenaghty
  • SELF-RADIATED LOOPBACK TEST PROCEDURE FOR MILLIMETER WAVE ANTENNAS
    Publication number: 20200136732
    Abstract: Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.
    Type: Application
    Filed: October 24, 2019
    Publication date: April 30, 2020
    Inventors: Gaurav VERMA, David COLLINS, Ryan WENDLANDT, Prachi DESHPANDE, Gaurav SINGHANIA