Patents by Inventor Ryohei Kamimura

Ryohei Kamimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Single-chip microcomputer with dynamic burn-in test function and dynamic burn-in testing method therefor
    Patent number: 7143229
    Abstract: In a single-chip microcomputer including a nonvolatile semiconductor memory device and write, read and erase circuits for performing a write operation, a read operation and an erase operation upon the nonvolatile semiconductor memory device, respectively, a sequencer is connected between the write, read and erase circuits and an interface. The sequencer receives first data via the interface from the exterior to write the first data into the nonvolatile semiconductor memory device, reads the first data from the nonvolatile semiconductor device, compares the first data with second data read via the interface from the exterior thus performing a verification upon the nonvolatile semiconductor memory device, and reads third data from the nonvolatile semiconductor memory device and transmits the third data via the interface to the exterior.
    Type: Grant
    Filed: April 24, 2002
    Date of Patent: November 28, 2006
    Assignee: NEC Electronics Corporation
    Inventor: Ryohei Kamimura
  • Single-chip microcomputer with dynamic burn-in test function and dynamic burn-in testing method therefor
    Publication number: 20020161963
    Abstract: In a single-chip microcomputer including a nonvolatile semiconductor memory device and write, read and erase circuits for performing a write operation, a read operation and an erase operation upon the nonvolatile semiconductor memory device, respectively, a sequencer is connected between the write, read and erase circuits and an interface. The sequencer receives first data via the interface from the exterior to write the first data into the nonvolatile semiconductor memory device, reads the first data from the nonvolatile semiconductor device, compares the first data with second data read via the interface from the exterior thus performing a verification upon the nonvolatile semiconductor memory device, and reads third data from the nonvolatile semiconductor memory device and transmits the third data via the interface to the exterior.
    Type: Application
    Filed: April 24, 2002
    Publication date: October 31, 2002
    Applicant: NEC Corporation
    Inventor: Ryohei Kamimura