Patents by Inventor Ryohei KURI

Ryohei KURI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12086976
    Abstract: An inspection method includes: a first acquisition step of acquiring information in which information on a color difference with respect to a reference color is assigned to each of a plurality of first divided regions into which an reference image is divided; a second acquisition step of acquiring information in which information on a color difference with respect to the reference color is assigned to each of a plurality of second divided regions into which a captured image is divided; a first comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the corresponding second divided regions; and a second comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the second divided regions in a combination different from the combination in which the comparison is performed in the first comparison step, and
    Type: Grant
    Filed: December 23, 2021
    Date of Patent: September 10, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Ryohei Kuri
  • Patent number: 11441947
    Abstract: A spectrometry method used with an apparatus including a spectrometry section, a spectroscopic controller, a spectroscopic image generator, and a display section, the method including generating a teaching-purpose spectroscopic image, generating and displaying a teaching-purpose visualized image, identifying a first teaching area in the teaching-purpose visualized image and generating a first teaching-purpose spectrum, displaying a first icon based on the display color of the first teaching area, accepting teacher data that teaches chromaticity in correspondence with the first icon, generating a conversion rule based on the relationship between the spectrum and the teacher data, generating a measurement-purpose spectrum, and calculating chromaticity based on the conversion rule.
    Type: Grant
    Filed: November 10, 2020
    Date of Patent: September 13, 2022
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Seiji Aiso, Ryohei Kuri
  • Publication number: 20220207685
    Abstract: An inspection method includes: a first acquisition step of acquiring information in which information on a color difference with respect to a reference color is assigned to each of a plurality of first divided regions into which an reference image is divided; a second acquisition step of acquiring information in which information on a color difference with respect to the reference color is assigned to each of a plurality of second divided regions into which a captured image is divided; a first comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the corresponding second divided regions; and a second comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the second divided regions in a combination different from the combination in which the comparison is performed in the first comparison step, and
    Type: Application
    Filed: December 23, 2021
    Publication date: June 30, 2022
    Inventor: Ryohei KURI
  • Patent number: 11333554
    Abstract: A spectrometry method used by a spectrometry apparatus including a spectrometry section including a spectrometer and an imaging device that captures a spectroscopic image, a spectroscopic controller that controls the action of the spectrometer, and an image generator that generates the spectroscopic image, the method including generating the spectroscopic image, dividing the range of the spectroscopic image into a plurality of regions including at least a first region, determining a reference value of a color value, generating a first region spectrum based on the spectroscopic image of the first region, calculating first region tristimulus values based on the first region spectrum, calculating a first region color value based on the first region tristimulus values, and calculating a first region color difference that is the color difference between the first region color value and the reference value by using a color difference formula.
    Type: Grant
    Filed: November 10, 2020
    Date of Patent: May 17, 2022
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Ryohei Kuri, Seiji Aiso
  • Patent number: 11293877
    Abstract: A defect detecting device includes an illumination that irradiates a measuring object with illumination light, an imager that images the illumination light reflected by the measuring object, and a detector that detects a defect at a surface of the measuring object based on a captured image obtained by imaging the illumination light by the imager. The captured image includes a plurality of spectral images having different spectral wavelengths, and the detector detects a diffuse reflection region by which the illumination light is diffusely reflected based on the plurality of spectral images, and determines a size of the defect based on the spectral wavelength of the spectral image in which the diffuse reflection region is detected.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: April 5, 2022
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Ryohei Kuri
  • Patent number: 11209313
    Abstract: An inspection method includes: spectroscopically separating light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and imaging spectroscopic images of each of the wavelengths; inspecting a shape of the inspection object using the spectroscopic image of a predetermined wavelength among the wavelengths imaged in the imaging of the spectroscopic images of each of the wavelengths; and inspecting a color of the inspection object using the spectroscopic images of each of the wavelengths imaged. The predetermined wavelength is determined so that a maximum light quantity of the light from the inspection object in the corresponding spectroscopic image at the predetermined wavelength is equal to or higher than maximum light quantities in the other spectroscopic images at the other wavelengths.
    Type: Grant
    Filed: October 6, 2020
    Date of Patent: December 28, 2021
    Inventors: Satoshi Oguchi, Ryohei Kuri, Masashi Kanai
  • Patent number: 11099071
    Abstract: An imaging condition evaluation device according to the present disclosure includes: a spectrometer configured to capture a spectral image under an arbitrarily set imaging condition; and an evaluation unit configured to set a first region and a second region different from each other in the spectral image, and calculate an evaluation value of the imaging condition based on an optical spectrum of the first region and an optical spectrum of the second region.
    Type: Grant
    Filed: March 31, 2020
    Date of Patent: August 24, 2021
    Inventors: Yuki Yamamoto, Ryohei Kuri
  • Publication number: 20210140820
    Abstract: A spectrometry method used with an apparatus including a spectrometry section, a spectroscopic controller, a spectroscopic image generator, and a display section, the method including generating a teaching-purpose spectroscopic image, generating and displaying a teaching-purpose visualized image, identifying a first teaching area in the teaching-purpose visualized image and generating a first teaching-purpose spectrum, displaying a first icon based on the display color of the first teaching area, accepting teacher data that teaches chromaticity in correspondence with the first icon, generating a conversion rule based on the relationship between the spectrum and the teacher data, generating a measurement-purpose spectrum, and calculating chromaticity based on the conversion rule.
    Type: Application
    Filed: November 10, 2020
    Publication date: May 13, 2021
    Inventors: Seiji AISO, Ryohei KURI
  • Publication number: 20210140821
    Abstract: A spectrometry method used by a spectrometry apparatus including a spectrometry section including a spectrometer and an imaging device that captures a spectroscopic image, a spectroscopic controller that controls the action of the spectrometer, and an image generator that generates the spectroscopic image, the method including generating the spectroscopic image, dividing the range of the spectroscopic image into a plurality of regions including at least a first region, determining a reference value of a color value, generating a first region spectrum based on the spectroscopic image of the first region, calculating first region tristimulus values based on the first region spectrum, calculating a first region color value based on the first region tristimulus values, and calculating a first region color difference that is the color difference between the first region color value and the reference value by using a color difference formula.
    Type: Application
    Filed: November 10, 2020
    Publication date: May 13, 2021
    Inventors: Ryohei KURI, Seiji AISO
  • Patent number: 10921185
    Abstract: A spectroscopic camera according to the present disclosure includes: a second light source; a first monochrome imaging element; a first spectral portion and a second spectral portion; and a control unit that controls operations of the second light source, the first monochrome imaging element, the first spectral portion, and the second spectral portion, the second light source and the first monochrome imaging element are disposed to be directed in the same direction, the first spectral portion is disposed between the first monochrome imaging element and the measurement target, and the second spectral portion is disposed between the second light source and the measurement target.
    Type: Grant
    Filed: November 27, 2019
    Date of Patent: February 16, 2021
    Inventors: Teruyuki Nishimura, Ryohei Kuri, Naoki Kuwata
  • Publication number: 20210018367
    Abstract: An inspection method includes: spectroscopically separating light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and imaging spectroscopic images of each of the wavelengths; inspecting a shape of the inspection object using the spectroscopic image of a predetermined wavelength among the wavelengths imaged in the imaging of the spectroscopic images of each of the wavelengths; and inspecting a color of the inspection object using the spectroscopic images of each of the wavelengths imaged. The predetermined wavelength is determined so that a maximum light quantity of the light from the inspection object in the corresponding spectroscopic image at the predetermined wavelength is equal to or higher than maximum light quantities in the other spectroscopic images at the other wavelengths.
    Type: Application
    Filed: October 6, 2020
    Publication date: January 21, 2021
    Inventors: Satoshi OGUCHI, Ryohei KURI, Masashi KANAI
  • Patent number: 10837831
    Abstract: An inspection apparatus includes a spectroscopic imager that spectroscopically separates light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and images spectroscopic images of each of the wavelengths, a shape inspection unit that inspects a shape of the inspection object using a spectroscopic image of a predetermined wavelength among the spectroscopic images of each of the wavelengths, and a color inspection unit that inspects a color of the inspection object using the spectroscopic images of each of the wavelengths.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: November 17, 2020
    Assignee: Seiko Epson Corporation
    Inventors: Satoshi Oguchi, Ryohei Kuri, Masashi Kanai
  • Patent number: 10792925
    Abstract: An ink cartridge includes a tank main body that contains ink, a transparent member that forms at least part of the tank main body and transmits light, and a reference plate that is disposed in the tank main body and in a position facing the transparent member and forms, along with the transparent member, an inflow space which is located between the transparent member and the reference plate and into which the ink flows.
    Type: Grant
    Filed: January 29, 2019
    Date of Patent: October 6, 2020
    Assignee: Seiko Epson Corporation
    Inventor: Ryohei Kuri
  • Publication number: 20200309600
    Abstract: An imaging condition evaluation device according to the present disclosure includes: a spectrometer configured to capture a spectral image under an arbitrarily set imaging condition; and an evaluation unit configured to set a first region and a second region different from each other in the spectral image, and calculate an evaluation value of the imaging condition based on an optical spectrum of the first region and an optical spectrum of the second region.
    Type: Application
    Filed: March 31, 2020
    Publication date: October 1, 2020
    Inventors: Yuki YAMAMOTO, Ryohei KURI
  • Patent number: 10760962
    Abstract: A spectroscopic measurement device includes a light receiving element that receives light and outputs a light receiving signal, a variable amplification circuit that amplifies the light receiving signal which is input, and a dark voltage correction unit that calculates a correction coefficient that is a rate of change of a dark voltage value with respect to gains, based on an output value of the variable amplification circuit with each value of two or more gains which are equal to or greater than a predetermined value in an environment where no light is incident on the light receiving element.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: September 1, 2020
    Assignee: Seiko Epson Corporation
    Inventor: Ryohei Kuri
  • Publication number: 20200191723
    Abstract: A defect detecting device includes an illumination that irradiates a measuring object with illumination light, an imager that images the illumination light reflected by the measuring object, and a detector that detects a defect at a surface of the measuring object based on a captured image obtained by imaging the illumination light by the imager. The captured image includes a plurality of spectral images having different spectral wavelengths, and the detector detects a diffuse reflection region by which the illumination light is diffusely reflected based on the plurality of spectral images, and determines a size of the defect based on the spectral wavelength of the spectral image in which the diffuse reflection region is detected.
    Type: Application
    Filed: December 13, 2019
    Publication date: June 18, 2020
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Ryohei KURI
  • Publication number: 20200173849
    Abstract: A spectroscopic camera according to the present disclosure includes: a second light source; a first monochrome imaging element; a first spectral portion and a second spectral portion; and a control unit that controls operations of the second light source, the first monochrome imaging element, the first spectral portion, and the second spectral portion, the second light source and the first monochrome imaging element are disposed to be directed in the same direction, the first spectral portion is disposed between the first monochrome imaging element and the measurement target, and the second spectral portion is disposed between the second light source and the measurement target.
    Type: Application
    Filed: November 27, 2019
    Publication date: June 4, 2020
    Inventors: Teruyuki NISHIMURA, Ryohei KURI, Naoki KUWATA
  • Patent number: 10670856
    Abstract: An optical module includes a variable wavelength interference filter provided with a pair of reflecting films, and an electrostatic actuator configured to change a gap dimension between the pair of reflecting films, a driver configured to apply a periodic drive voltage to the electrostatic actuator, a gap detector configured to detect a gap dimension between the pair of reflecting films, and a light receiver configured to receive light from the variable wavelength interference filter. The light reception signal from the light receiver is detected at a predetermined timing from a detection timing of one of a maximum value and a minimum value of the gap dimension detected by the gap detector.
    Type: Grant
    Filed: March 13, 2018
    Date of Patent: June 2, 2020
    Assignee: Seiko Epson Corporation
    Inventor: Ryohei Kuri
  • Publication number: 20190271593
    Abstract: An inspection apparatus includes a spectroscopic imager that spectroscopically separates light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and images spectroscopic images of each of the wavelengths, a shape inspection unit that inspects a shape of the inspection object using a spectroscopic image of a predetermined wavelength among the spectroscopic images of each of the wavelengths, and a color inspection unit that inspects a color of the inspection object using the spectroscopic images of each of the wavelengths.
    Type: Application
    Filed: March 1, 2019
    Publication date: September 5, 2019
    Inventors: Satoshi OGUCHI, Ryohei KURI, Masashi KANAI
  • Publication number: 20190232672
    Abstract: An ink cartridge includes a tank main body that contains ink, a transparent member that forms at least part of the tank main body and transmits light, and a reference plate that is disposed in the tank main body and in a position facing the transparent member and forms, along with the transparent member, an inflow space which is located between the transparent member and the reference plate and into which the ink flows.
    Type: Application
    Filed: January 29, 2019
    Publication date: August 1, 2019
    Inventor: Ryohei KURI