Patents by Inventor Ryohei KURI
Ryohei KURI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12086976Abstract: An inspection method includes: a first acquisition step of acquiring information in which information on a color difference with respect to a reference color is assigned to each of a plurality of first divided regions into which an reference image is divided; a second acquisition step of acquiring information in which information on a color difference with respect to the reference color is assigned to each of a plurality of second divided regions into which a captured image is divided; a first comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the corresponding second divided regions; and a second comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the second divided regions in a combination different from the combination in which the comparison is performed in the first comparison step, andType: GrantFiled: December 23, 2021Date of Patent: September 10, 2024Assignee: SEIKO EPSON CORPORATIONInventor: Ryohei Kuri
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Patent number: 11441947Abstract: A spectrometry method used with an apparatus including a spectrometry section, a spectroscopic controller, a spectroscopic image generator, and a display section, the method including generating a teaching-purpose spectroscopic image, generating and displaying a teaching-purpose visualized image, identifying a first teaching area in the teaching-purpose visualized image and generating a first teaching-purpose spectrum, displaying a first icon based on the display color of the first teaching area, accepting teacher data that teaches chromaticity in correspondence with the first icon, generating a conversion rule based on the relationship between the spectrum and the teacher data, generating a measurement-purpose spectrum, and calculating chromaticity based on the conversion rule.Type: GrantFiled: November 10, 2020Date of Patent: September 13, 2022Assignee: SEIKO EPSON CORPORATIONInventors: Seiji Aiso, Ryohei Kuri
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Publication number: 20220207685Abstract: An inspection method includes: a first acquisition step of acquiring information in which information on a color difference with respect to a reference color is assigned to each of a plurality of first divided regions into which an reference image is divided; a second acquisition step of acquiring information in which information on a color difference with respect to the reference color is assigned to each of a plurality of second divided regions into which a captured image is divided; a first comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the corresponding second divided regions; and a second comparison step of comparing the information on the color difference of each of the first divided regions with the information on the color difference of each of the second divided regions in a combination different from the combination in which the comparison is performed in the first comparison step, andType: ApplicationFiled: December 23, 2021Publication date: June 30, 2022Inventor: Ryohei KURI
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Patent number: 11333554Abstract: A spectrometry method used by a spectrometry apparatus including a spectrometry section including a spectrometer and an imaging device that captures a spectroscopic image, a spectroscopic controller that controls the action of the spectrometer, and an image generator that generates the spectroscopic image, the method including generating the spectroscopic image, dividing the range of the spectroscopic image into a plurality of regions including at least a first region, determining a reference value of a color value, generating a first region spectrum based on the spectroscopic image of the first region, calculating first region tristimulus values based on the first region spectrum, calculating a first region color value based on the first region tristimulus values, and calculating a first region color difference that is the color difference between the first region color value and the reference value by using a color difference formula.Type: GrantFiled: November 10, 2020Date of Patent: May 17, 2022Assignee: SEIKO EPSON CORPORATIONInventors: Ryohei Kuri, Seiji Aiso
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Patent number: 11293877Abstract: A defect detecting device includes an illumination that irradiates a measuring object with illumination light, an imager that images the illumination light reflected by the measuring object, and a detector that detects a defect at a surface of the measuring object based on a captured image obtained by imaging the illumination light by the imager. The captured image includes a plurality of spectral images having different spectral wavelengths, and the detector detects a diffuse reflection region by which the illumination light is diffusely reflected based on the plurality of spectral images, and determines a size of the defect based on the spectral wavelength of the spectral image in which the diffuse reflection region is detected.Type: GrantFiled: December 13, 2019Date of Patent: April 5, 2022Assignee: SEIKO EPSON CORPORATIONInventor: Ryohei Kuri
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Patent number: 11209313Abstract: An inspection method includes: spectroscopically separating light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and imaging spectroscopic images of each of the wavelengths; inspecting a shape of the inspection object using the spectroscopic image of a predetermined wavelength among the wavelengths imaged in the imaging of the spectroscopic images of each of the wavelengths; and inspecting a color of the inspection object using the spectroscopic images of each of the wavelengths imaged. The predetermined wavelength is determined so that a maximum light quantity of the light from the inspection object in the corresponding spectroscopic image at the predetermined wavelength is equal to or higher than maximum light quantities in the other spectroscopic images at the other wavelengths.Type: GrantFiled: October 6, 2020Date of Patent: December 28, 2021Inventors: Satoshi Oguchi, Ryohei Kuri, Masashi Kanai
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Patent number: 11099071Abstract: An imaging condition evaluation device according to the present disclosure includes: a spectrometer configured to capture a spectral image under an arbitrarily set imaging condition; and an evaluation unit configured to set a first region and a second region different from each other in the spectral image, and calculate an evaluation value of the imaging condition based on an optical spectrum of the first region and an optical spectrum of the second region.Type: GrantFiled: March 31, 2020Date of Patent: August 24, 2021Inventors: Yuki Yamamoto, Ryohei Kuri
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Publication number: 20210140820Abstract: A spectrometry method used with an apparatus including a spectrometry section, a spectroscopic controller, a spectroscopic image generator, and a display section, the method including generating a teaching-purpose spectroscopic image, generating and displaying a teaching-purpose visualized image, identifying a first teaching area in the teaching-purpose visualized image and generating a first teaching-purpose spectrum, displaying a first icon based on the display color of the first teaching area, accepting teacher data that teaches chromaticity in correspondence with the first icon, generating a conversion rule based on the relationship between the spectrum and the teacher data, generating a measurement-purpose spectrum, and calculating chromaticity based on the conversion rule.Type: ApplicationFiled: November 10, 2020Publication date: May 13, 2021Inventors: Seiji AISO, Ryohei KURI
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Publication number: 20210140821Abstract: A spectrometry method used by a spectrometry apparatus including a spectrometry section including a spectrometer and an imaging device that captures a spectroscopic image, a spectroscopic controller that controls the action of the spectrometer, and an image generator that generates the spectroscopic image, the method including generating the spectroscopic image, dividing the range of the spectroscopic image into a plurality of regions including at least a first region, determining a reference value of a color value, generating a first region spectrum based on the spectroscopic image of the first region, calculating first region tristimulus values based on the first region spectrum, calculating a first region color value based on the first region tristimulus values, and calculating a first region color difference that is the color difference between the first region color value and the reference value by using a color difference formula.Type: ApplicationFiled: November 10, 2020Publication date: May 13, 2021Inventors: Ryohei KURI, Seiji AISO
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Patent number: 10921185Abstract: A spectroscopic camera according to the present disclosure includes: a second light source; a first monochrome imaging element; a first spectral portion and a second spectral portion; and a control unit that controls operations of the second light source, the first monochrome imaging element, the first spectral portion, and the second spectral portion, the second light source and the first monochrome imaging element are disposed to be directed in the same direction, the first spectral portion is disposed between the first monochrome imaging element and the measurement target, and the second spectral portion is disposed between the second light source and the measurement target.Type: GrantFiled: November 27, 2019Date of Patent: February 16, 2021Inventors: Teruyuki Nishimura, Ryohei Kuri, Naoki Kuwata
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Publication number: 20210018367Abstract: An inspection method includes: spectroscopically separating light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and imaging spectroscopic images of each of the wavelengths; inspecting a shape of the inspection object using the spectroscopic image of a predetermined wavelength among the wavelengths imaged in the imaging of the spectroscopic images of each of the wavelengths; and inspecting a color of the inspection object using the spectroscopic images of each of the wavelengths imaged. The predetermined wavelength is determined so that a maximum light quantity of the light from the inspection object in the corresponding spectroscopic image at the predetermined wavelength is equal to or higher than maximum light quantities in the other spectroscopic images at the other wavelengths.Type: ApplicationFiled: October 6, 2020Publication date: January 21, 2021Inventors: Satoshi OGUCHI, Ryohei KURI, Masashi KANAI
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Patent number: 10837831Abstract: An inspection apparatus includes a spectroscopic imager that spectroscopically separates light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and images spectroscopic images of each of the wavelengths, a shape inspection unit that inspects a shape of the inspection object using a spectroscopic image of a predetermined wavelength among the spectroscopic images of each of the wavelengths, and a color inspection unit that inspects a color of the inspection object using the spectroscopic images of each of the wavelengths.Type: GrantFiled: March 1, 2019Date of Patent: November 17, 2020Assignee: Seiko Epson CorporationInventors: Satoshi Oguchi, Ryohei Kuri, Masashi Kanai
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Patent number: 10792925Abstract: An ink cartridge includes a tank main body that contains ink, a transparent member that forms at least part of the tank main body and transmits light, and a reference plate that is disposed in the tank main body and in a position facing the transparent member and forms, along with the transparent member, an inflow space which is located between the transparent member and the reference plate and into which the ink flows.Type: GrantFiled: January 29, 2019Date of Patent: October 6, 2020Assignee: Seiko Epson CorporationInventor: Ryohei Kuri
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Publication number: 20200309600Abstract: An imaging condition evaluation device according to the present disclosure includes: a spectrometer configured to capture a spectral image under an arbitrarily set imaging condition; and an evaluation unit configured to set a first region and a second region different from each other in the spectral image, and calculate an evaluation value of the imaging condition based on an optical spectrum of the first region and an optical spectrum of the second region.Type: ApplicationFiled: March 31, 2020Publication date: October 1, 2020Inventors: Yuki YAMAMOTO, Ryohei KURI
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Patent number: 10760962Abstract: A spectroscopic measurement device includes a light receiving element that receives light and outputs a light receiving signal, a variable amplification circuit that amplifies the light receiving signal which is input, and a dark voltage correction unit that calculates a correction coefficient that is a rate of change of a dark voltage value with respect to gains, based on an output value of the variable amplification circuit with each value of two or more gains which are equal to or greater than a predetermined value in an environment where no light is incident on the light receiving element.Type: GrantFiled: December 26, 2018Date of Patent: September 1, 2020Assignee: Seiko Epson CorporationInventor: Ryohei Kuri
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Publication number: 20200191723Abstract: A defect detecting device includes an illumination that irradiates a measuring object with illumination light, an imager that images the illumination light reflected by the measuring object, and a detector that detects a defect at a surface of the measuring object based on a captured image obtained by imaging the illumination light by the imager. The captured image includes a plurality of spectral images having different spectral wavelengths, and the detector detects a diffuse reflection region by which the illumination light is diffusely reflected based on the plurality of spectral images, and determines a size of the defect based on the spectral wavelength of the spectral image in which the diffuse reflection region is detected.Type: ApplicationFiled: December 13, 2019Publication date: June 18, 2020Applicant: SEIKO EPSON CORPORATIONInventor: Ryohei KURI
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Publication number: 20200173849Abstract: A spectroscopic camera according to the present disclosure includes: a second light source; a first monochrome imaging element; a first spectral portion and a second spectral portion; and a control unit that controls operations of the second light source, the first monochrome imaging element, the first spectral portion, and the second spectral portion, the second light source and the first monochrome imaging element are disposed to be directed in the same direction, the first spectral portion is disposed between the first monochrome imaging element and the measurement target, and the second spectral portion is disposed between the second light source and the measurement target.Type: ApplicationFiled: November 27, 2019Publication date: June 4, 2020Inventors: Teruyuki NISHIMURA, Ryohei KURI, Naoki KUWATA
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Patent number: 10670856Abstract: An optical module includes a variable wavelength interference filter provided with a pair of reflecting films, and an electrostatic actuator configured to change a gap dimension between the pair of reflecting films, a driver configured to apply a periodic drive voltage to the electrostatic actuator, a gap detector configured to detect a gap dimension between the pair of reflecting films, and a light receiver configured to receive light from the variable wavelength interference filter. The light reception signal from the light receiver is detected at a predetermined timing from a detection timing of one of a maximum value and a minimum value of the gap dimension detected by the gap detector.Type: GrantFiled: March 13, 2018Date of Patent: June 2, 2020Assignee: Seiko Epson CorporationInventor: Ryohei Kuri
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Publication number: 20190271593Abstract: An inspection apparatus includes a spectroscopic imager that spectroscopically separates light from a predetermined imaging range of an inspection object into light of a plurality of wavelengths and images spectroscopic images of each of the wavelengths, a shape inspection unit that inspects a shape of the inspection object using a spectroscopic image of a predetermined wavelength among the spectroscopic images of each of the wavelengths, and a color inspection unit that inspects a color of the inspection object using the spectroscopic images of each of the wavelengths.Type: ApplicationFiled: March 1, 2019Publication date: September 5, 2019Inventors: Satoshi OGUCHI, Ryohei KURI, Masashi KANAI
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Publication number: 20190232672Abstract: An ink cartridge includes a tank main body that contains ink, a transparent member that forms at least part of the tank main body and transmits light, and a reference plate that is disposed in the tank main body and in a position facing the transparent member and forms, along with the transparent member, an inflow space which is located between the transparent member and the reference plate and into which the ink flows.Type: ApplicationFiled: January 29, 2019Publication date: August 1, 2019Inventor: Ryohei KURI