Patents by Inventor Ryohei Yokota

Ryohei Yokota has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220339754
    Abstract: A polishing method for polishing a wafer by use of a polishing unit having a spindle with a polishing tool, the polishing tool having a disk-shaped base and an annular polishing layer that is fixed to one surface of the base and that includes an opening being located at a central portion in a diameter direction of the base and having a predetermined diameter, a maximum width of an effective polishing region of the polishing layer in a radial direction of the base being smaller than the radius of the wafer and the radius of the wafer being smaller than the diameter of the opening, the method includes polishing the wafer in such a manner that a part of a peripheral edge of the wafer protrudes from a periphery of the polishing layer and that the center of the wafer is located in the opening section of the polishing layer.
    Type: Application
    Filed: August 5, 2021
    Publication date: October 27, 2022
    Inventors: Naruto FUWA, Ryohei YOKOTA
  • Publication number: 20220203809
    Abstract: The vehicular display control device is mounted on an autonomous driving vehicle provided with a windshield display. The windshield display is configured to change a transmittance of external light. The vehicular display control device includes a transmittance control unit configured to reduce the transmittance in order to promote a sleep of at least one passenger.
    Type: Application
    Filed: January 24, 2022
    Publication date: June 30, 2022
    Inventors: Ifushi SHIMONOMOTO, Ryohei YOKOTA, Yuji OTA
  • Patent number: 10068811
    Abstract: A gettering property evaluating method for a wafer includes: a gettering layer forming step of polishing a back surface opposite to a front surface of a semiconductor wafer by use of a polishing wheel to form polishing marks on the back surface and to form a gettering layer inside the semiconductor wafer and beneath the polishing marks; an imaging step of imaging at least a unit region of the back surface formed with the polishing marks by imaging means; a counting step of counting the number of the polishing marks having a width of 10 to 500 nm present in the unit region imaged; and a comparing step of comparing the number of the polishing marks counted by the counting step with a predetermined value to determine whether or not the counted number is not less than the predetermined value.
    Type: Grant
    Filed: May 12, 2017
    Date of Patent: September 4, 2018
    Assignee: Disco Corporation
    Inventors: Naoya Sukegawa, Ryohei Yokota, Naruto Fuwa
  • Publication number: 20180009392
    Abstract: A device for mounting an audio speaker in a vehicle includes a clip and a pin. The clip includes an engaging plate, a first engager provided on a first side of the engaging plate, a first lock provided at an end of the first engager on an side opposite to the engaging plate, a second engager provided on a second side that is opposite to the first side of the engaging plate, and a second lock provided at an end of the second engager on a side opposite to the engaging plate. The pin includes a shaft and the first engager has a concave portion that receives the shaft of the pin.
    Type: Application
    Filed: January 28, 2016
    Publication date: January 11, 2018
    Applicants: FUJITSU TEN LIMITED, FUJITSU TEN MINDA INDIA PRIVATE LIMITED
    Inventors: Ryohei YOKOTA, Yadav SANJAY, Ranjan Kumar RAVI
  • Publication number: 20170338158
    Abstract: A gettering property evaluating method for a wafer includes: a gettering layer forming step of polishing a back surface opposite to a front surface of a semiconductor wafer by use of a polishing wheel to form polishing marks on the back surface and to form a gettering layer inside the semiconductor wafer and beneath the polishing marks; an imaging step of imaging at least a unit region of the back surface formed with the polishing marks by imaging means; a counting step of counting the number of the polishing marks having a width of 10 to 500 nm present in the unit region imaged; and a comparing step of comparing the number of the polishing marks counted by the counting step with a predetermined value to determine whether or not the counted number is not less than the predetermined value.
    Type: Application
    Filed: May 12, 2017
    Publication date: November 23, 2017
    Inventors: Naoya Sukegawa, Ryohei Yokota, Naruto Fuwa