Patents by Inventor Ryoichi Fukazawa

Ryoichi Fukazawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180189916
    Abstract: According to one form of the present disclosure, a system transmits a request for recording of generation of an electronic recorded monetary claim condition precedent with defense, to a ledger recorder. The system transmits an assignment recording request indicating that the electronic recorded monetary claim with defense has been pledged as an assignment guarantee, to the ledger recorder.
    Type: Application
    Filed: March 1, 2018
    Publication date: July 5, 2018
    Applicant: Tranzax Co., Ltd.
    Inventors: Takashi OGURA, Ryoichi FUKAZAWA
  • Publication number: 20180137567
    Abstract: There are provided a method and a system capable of reducing a debt and improving a financial condition of a debtor in a batch factoring transaction by an electronically-recorded monetary claim An ordering company terminal (1), an FP terminal (3), a supplying company terminal (2), and an electronic-monetary-claim recording institution (C) are connected through the internet to a bridge service (A) having a factoring function to a supplying company, and factoring management means of the bridge service (A) performs data management of a monetary claim ledger, a discount statement, monetary claim transfer, and the like through the FP terminal (3) based on monetary claim statement data transmitted from the ordering company terminal (1).
    Type: Application
    Filed: June 10, 2016
    Publication date: May 17, 2018
    Inventors: Takashi OGURA, Ryoichi FUKAZAWA
  • Publication number: 20120262190
    Abstract: A measuring method for measuring characteristics of an object to be measured, the measuring method including holding the object on a void-arranged structure having at least two void portions that pass therethrough in a direction perpendicular to a principal surface thereof, and applying electromagnetic waves to the void-arranged structure on which the object is held to detect frequency characteristics of the electromagnetic waves transmitted through the void-arranged structure. The void-arranged structure has a grid structure in which the void portions are periodically arranged in at least one direction on the principal surface of the void-arranged structure. The characteristics of the object are measured on the basis of a relationship between a first frequency characteristic and a second frequency characteristic.
    Type: Application
    Filed: June 22, 2012
    Publication date: October 18, 2012
    Applicant: MURATA MANUFACTURING CO., LTD.
    Inventors: Takashi Kondo, Kazuhiro Takigawa, Seiji Kamba, Ryoichi Fukazawa, Tomofumi Ikari
  • Patent number: 5227861
    Abstract: An apparatus for and a method of evaluating a multilayer thin film of the present invention. An interference light beam in a predetermined wave number region is projected as a parallel beam onto a multilayer thin film sample and the interference light beam reflected by the sample is detected to find an interferogram. The interferogram is subject to Fourier transform, filtering and reverse Fourier transform so that a spatialgram is provided. Thereby the variation in incident angle of the light beam incident on the sample and in incident surface is reduced, and the spatialgram can be provided with accurate information of the multilayer thin film.
    Type: Grant
    Filed: September 24, 1990
    Date of Patent: July 13, 1993
    Assignees: Mitsubishi Denki Kabushiki Kaisha, Jasco Corporation
    Inventors: Seizi Nishizawa, Ryoichi Fukazawa, Tokuzi Takahashi, Ryo Hattori