Patents by Inventor Ryoichi INAGAWA

Ryoichi INAGAWA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9312839
    Abstract: A buffer circuit section receives an input clock, and outputs an output clock by wave-shaping the input clock, a measurement circuit section measures a first pulse width at a first potential level of the output clock and a second pulse width at a second potential level of the output clock, and an adjustment circuit section adjusts a ratio between the first pulse width and the second pulse width by varying a drive capability of the buffer circuit section on the basis of the measurement result of the measurement circuit section.
    Type: Grant
    Filed: April 18, 2014
    Date of Patent: April 12, 2016
    Assignee: Socionext Inc.
    Inventor: Ryoichi Inagawa
  • Patent number: 9124416
    Abstract: For each of a plurality of delayed phases, one of the plurality of delayed phases being the same as a phase of a reference clock and the others of the plurality of delayed phases delayed with respect to the phase of the reference clock, test parallel data transmitted in synchronism with the reference clock is received in synchronism with a delayed clock having the delayed phase and an adjacent delayed clock having a delayed phase adjacent to the delayed phase of the delayed clock, respectively; and a phase range containing a delayed phase with which the test parallel data has been received correctly and for which the result of the comparison indicates a match is determined from among the plurality of delayed phases; and the phase of a receive clock to be used for reception of parallel data is determined from the determined phase range.
    Type: Grant
    Filed: August 13, 2014
    Date of Patent: September 1, 2015
    Assignee: SOCIONEXT INC.
    Inventor: Ryoichi Inagawa
  • Publication number: 20150071396
    Abstract: For each of a plurality of delayed phases, one of the plurality of delayed phases being the same as a phase of a reference clock and the others of the plurality of delayed phases delayed with respect to the phase of the reference clock, test parallel data transmitted in synchronism with the reference clock is received in synchronism with a delayed clock having the delayed phase and an adjacent delayed clock having a delayed phase adjacent to the delayed phase of the delayed clock, respectively; and a phase range containing a delayed phase with which the test parallel data has been received correctly and for which the result of the comparison indicates a match is determined from among the plurality of delayed phases; and the phase of a receive clock to be used for reception of parallel data is determined from the determined phase range.
    Type: Application
    Filed: August 13, 2014
    Publication date: March 12, 2015
    Inventor: Ryoichi INAGAWA
  • Publication number: 20140320187
    Abstract: A buffer circuit section receives an input clock, and outputs an output clock by wave-shaping the input clock, a measurement circuit section measures a first pulse width at a first potential level of the output clock and a second pulse width at a second potential level of the output clock, and an adjustment circuit section adjusts a ratio between the first pulse width and the second pulse width by varying a drive capability of the buffer circuit section on the basis of the measurement result of the measurement circuit section.
    Type: Application
    Filed: April 18, 2014
    Publication date: October 30, 2014
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Ryoichi INAGAWA
  • Patent number: 8458540
    Abstract: A integrated circuit include: a first selection circuit selecting first data from input-data or scan-data, scan-data being for performing a diagnosis of a combinational circuit, input-data being received from a combinational circuit; a first latch circuit holding first data as first output-data in accordance with a first signal; a second latch circuit holding first output-data as second output-data in accordance with which of the first signal and a second signal, the second signal being used to force the second latch circuit to hold first output-data; a third latch circuit holding first output-data as third output-data in accordance with which of the first signal and a third signal, the third signal being used to force the third latch circuit to hold first output-data; and a second selection circuit selecting second data from among the data which include second output-data and third output-data.
    Type: Grant
    Filed: December 21, 2010
    Date of Patent: June 4, 2013
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Ryoichi Inagawa
  • Publication number: 20110161756
    Abstract: A integrated circuit include: a first selection circuit selecting first data from input-data or scan-data, scan-data being for performing a diagnosis of a combinational circuit, input-data being received from a combinational circuit; a first latch circuit holding first data as first output-data in accordance with a first signal; a second latch circuit holding first output-data as second output-data in accordance with which of the first signal and a second signal, the second signal being used to force the second latch circuit to hold first output-data; a third latch circuit holding first output-data as third output-data in accordance with which of the first signal and a third signal, the third signal being used to force the third latch circuit to hold first output-data; and a second selection circuit selecting second data from among the data which include second output-data and third output-data.
    Type: Application
    Filed: December 21, 2010
    Publication date: June 30, 2011
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Ryoichi INAGAWA