Patents by Inventor Ryoichi Kinoshita
Ryoichi Kinoshita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240035994Abstract: To provide a thermal analysis system and a thermal analysis method capable of easily performing thermal analysis while suppressing atmospheric exposure associated with sample movement. A thermal analysis system according to the present disclosure includes a sample preparing unit and a thermal analyzing unit. The sample preparing unit includes a wall portion forming an internal space, a gate portion capable of opening and closing an opening of the wall portion, and a sample holding member including a sample holder and temperature sensors. The thermal analyzer includes a moving mechanism for moving a sample holder into a thermal analysis part, a sealing mechanism for sealing the sample holder from an internal space of a sample preparation part, and a coupling mechanism for connecting a heating tube of the thermal analysis part to a gate part in a state of sealing the heating tube from the outside.Type: ApplicationFiled: June 7, 2023Publication date: February 1, 2024Inventors: Martin Brunner, Ryoichi Kinoshita
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Patent number: 11320408Abstract: A gas analysis device and a gas analysis method for performing measurement in a direct mode and a trap mode without carrying out a complicated control. The gas analysis device includes a branching section that branches a target gas, a mass spectrometer performing mass spectrometry of one branched target gas, a trap section holding the other branched target gas, a gas chromatograph analyzing the other branched target gas, and a controller controlling the flow path of the one branched target gas and the other branched target gas. The branching section is controlled so that, while a thermal analysis is performed by a thermal analysis device, the branching section continuously branches the supplied target gas and discharges the one branched target gas and the other branched target gas, and when the thermal analysis is completed, the other branched target gas held by the trap section is supplied to the gas chromatograph.Type: GrantFiled: September 16, 2020Date of Patent: May 3, 2022Assignee: NETZSCH-Gerätebau GmbHInventors: Ryoichi Kinoshita, Hiroki Takaishi, Daisuke Ito, Kenta Sato
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Publication number: 20210088485Abstract: A gas analysis device and a gas analysis method capable of performing measurement in a direct mode and a trap mode without carrying out a complicated control. The gas analysis device includes a branching section that branches a target gas, a mass spectrometer that carries out mass spectrometry of one branched target gases, a trap section that holds the other branched target gases, a gas chromatograph that analyzes the other branched target gas held by the trap section, and a controller that controls the flow path of the one branched target gas and the other branched target gas. The branching section is controlled so that, while the thermal analysis is being carried out by the thermal analysis device, the branching section continuously branches the supplied target gas and discharges one branched target gas and the other branched target gas, and when the thermal analysis has been completed, the other branched target gas held by the trap section is supplied to the gas chromatograph.Type: ApplicationFiled: September 16, 2020Publication date: March 25, 2021Inventors: Ryoichi Kinoshita, Hiroki Takaishi, Daisuke Ito, Kenta Sato
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Patent number: 9939329Abstract: A device for thermal analysis including: a pair of sample container assembly sets, having a sample container and a heat sink connected using a predetermined thermal resistance; a heating unit for equally heating the pair of sample container assembly sets; a temperature control for the heating unit; a weight measurement unit measuring difference between a sample and a reference material; while the heating unit is changed.Type: GrantFiled: July 31, 2015Date of Patent: April 10, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Yoshio Shinoda, Ryoichi Kinoshita
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Publication number: 20160054181Abstract: A device for thermal analysis including: a pair of sample container assembly sets, having a sample container and a heat sink connected using a predetermined thermal resistance; a heating unit for equally heating the pair of sample container assembly sets; a temperature control for the heating unit; a weight measurement unit measuring difference between a sample and a reference material; while the heating unit is changed.Type: ApplicationFiled: July 31, 2015Publication date: February 25, 2016Inventors: Yoshio Shinoda, Ryoichi Kinoshita
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Patent number: 7641384Abstract: To enable the reduction in working efforts by hand by performing control a drying operation by appropriately selecting dry conditions depending on the connection mode of the cooling device, and removal of moisture and the like without fail. The thermal analysis system uses a heater and a cooling device to raise and decrease the temperature inside the purge box. In the drying method for the thermal analysis system, the drying operation is performed by: previously setting dry conditions depending on the connection mode of the cooling device; starting control of an opening time dry process upon activation of the thermal analysis system; supplying a predetermined amount of dry gas into the purge box in accordance with the dry conditions corresponding to the selected connection mode of the cooling device with the cooling device kept off; and making the temperature control module control the temperature of the dry gas.Type: GrantFiled: July 18, 2007Date of Patent: January 5, 2010Assignee: SII NanoTechnology Inc.Inventors: Rintaro Nakatani, Ryoichi Kinoshita, Shinya Nishimura
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Patent number: 7588366Abstract: There is provided a differential scanning calorimeter in which a base line stability and a responsiveness are improved. There is made a constitution in which the stability is ensured by making a neck-like part in a heat passage from a heat reservoir 1 to a sensor plate 4 and, at the same time, a two-dimension heat flow passage to a sample holder 5a is ensured.Type: GrantFiled: February 14, 2008Date of Patent: September 15, 2009Assignee: SII NanoTechnology Inc.Inventor: Ryoichi Kinoshita
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Publication number: 20080187020Abstract: There is provided a differential scanning calorimeter in which a base line stability and a responsiveness are improved. There is made a constitution in which the stability is ensured by making a neck-like part in a heat passage from a heat reservoir 1 to a sensor plate 4 and, at the same time, a two-dimension heat flow passage to a sample holder 5a is ensured.Type: ApplicationFiled: February 14, 2008Publication date: August 7, 2008Applicant: SII NANO TECHNOLOGY INC.Inventor: Ryoichi Kinoshita
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Publication number: 20080025364Abstract: To enable the reduction in working efforts by hand by performing control a drying operation by appropriately selecting dry conditions depending on the connection mode of the cooling device, and removal of moisture and the like without fail. The thermal analysis system uses a heater and a cooling device to raise and decrease the temperature inside the purge box. In the drying method for the thermal analysis system, the drying operation is performed by: previously setting dry conditions depending on the connection mode of the cooling device; starting control of an opening time dry process upon activation of the thermal analysis system; supplying a predetermined amount of dry gas into the purge box in accordance with the dry conditions corresponding to the selected connection mode of the cooling device with the cooling device kept off; and making the temperature control module control the temperature of the dry gas.Type: ApplicationFiled: July 18, 2007Publication date: January 31, 2008Inventors: Rintaro Nakatani, Ryoichi Kinoshita, Shinya Nishimura
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Patent number: 7275862Abstract: A differential scanning calorimeter has a heat sink for accommodating therein a measurement sample and a reference material, and a differential heat flow detector that detects a temperature difference between the sample and the reference material. A cooling mechanism cools the heat sink, and a thermoconductor is disposed between the cooling mechanism and the heat sink and forms a heat flow path between the two. A first heater heats the heat sink, and a second heater heats the thermoconductor to thereby heat the heat sink. The second heater begins operating before the first heater nears its rated maximum output power.Type: GrantFiled: November 17, 2004Date of Patent: October 2, 2007Assignee: SII NanoTechnology Inc.Inventors: Shinya Nishimura, Rintaro Nakatani, Ryoichi Kinoshita
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Publication number: 20050163188Abstract: At a differential scanning calorimeter, a cooling mechanism for cooling a heat sink is provided at a lower part of the heat sink. A thermoconductor equipped with a second heater is provided between the heat sink and the cooling mechanism, and a heat path is formed between the heat sink and the cooling mechanism by the thermoconductor.Type: ApplicationFiled: November 17, 2004Publication date: July 28, 2005Inventors: Shinya Nishimura, Rintaro Nakatani, Ryoichi Kinoshita
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Patent number: 6709153Abstract: In order to provide means for suppressing vibration of a balance arm of a thermogravity apparatus when changing a sample at low cost and with a minimal footprint, there is therefore provided a balance arm having a sample holder, a detector for detecting an amount of shift of the balance arm from an equilibrium position, a control circuit for carrying out feedback control towards the equilibrium position of the balance arm, a driver for driving the balance arm towards the equilibrium position, an exchange stage detector for detecting when a sample is being changed, and a fixed output holding circuit for maintaining the output of the driver at a fixed level while the exchange stage is indicated by the exchange stage detector, wherein output of the driver is fixed during the sample exchange stage.Type: GrantFiled: October 9, 2002Date of Patent: March 23, 2004Assignee: SII NanoTechnology Inc.Inventors: Rintaro Nakatani, Keiko Ooshiro, Masafumi Take, Ryoichi Kinoshita
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Publication number: 20030086471Abstract: In order to provide means for suppressing vibration of a balance arm of a thermogravity apparatus when changing a sample at low cost and with a minimal footprint, there is therefore provided a balance arm having a sample holder, a detector for detecting an amount of shift of the balance arm from an equilibrium position, a control circuit for carrying out feedback control towards the equilibrium position of the balance arm, a driver for driving the balance arm towards the equilibrium position, an exchange stage detector for detecting when a sample is being changed, and a fixed output holding circuit for maintaining the output of the driver at a fixed level while the exchange stage is indicated by the exchange stage detector, wherein output of the driver is fixed during the sample exchange stage.Type: ApplicationFiled: October 9, 2002Publication date: May 8, 2003Inventors: Rintaro Nakatani, Keiko Ooshiro, Masafumi Take, Ryoichi Kinoshita
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Publication number: 20030026319Abstract: To provide a differential scanning calorimeter in which rise and fall of temperatures of a sample and a reference substance follow rise and fall of temperature of a heat sink with excellent response maintaining a structure of a differential scanning calorimeter having a structure of providing stability of a base line constituting a characteristic of a heat flux type while achieving response equivalent to or faster than that of a power compensation type, in a structure of a heat flux type differential scanning calorimeter in which a heat flow path between a sample holder and a heat sink is formed by a metallic material having excellent heat conductance, heaters for power compensation are attached to the sample holder and a reference holder.Type: ApplicationFiled: July 12, 2002Publication date: February 6, 2003Inventor: Ryoichi Kinoshita
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Patent number: 6508585Abstract: An insulating substrate provided with two types of metallic or alloy circuit patterns for detecting temperature difference between a sample side and a reference side, and also a metallic resistance circuit pattern, is fixed to a heat sink, and the heat sink is temperature controlled. If a temperature difference between the sample and the reference is detected, electrical power supplied to a compensation heater using metallic resistors is adjusted by a differential heat compensation circuit so that the temperature difference is immediately returned to zero, and a difference in supplied power is output as a differential heat flow.Type: GrantFiled: November 30, 2001Date of Patent: January 21, 2003Assignee: Seiko Instruments Inc.Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
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Patent number: 6422742Abstract: A sample holder and a reference holder are arranged coaxially. Heat conductors making heat exchange with a heat sink are joined to the heat sink at the same position. The inside diameter of the heat sink can be made close to the diameter of the sample container without spoiling the stability of the baseline that is a feature of heat-flux DSC. The heat capacity of the heat sink can be decreased. Therefore, the response to the temperature as it is elevated and lowered can be improved greatly.Type: GrantFiled: December 2, 1998Date of Patent: July 23, 2002Assignee: Seiko Instruments Inc.Inventor: Ryoichi Kinoshita
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Publication number: 20020085615Abstract: An insulating substrate provided with two types of metallic or alloy circuit patterns for detecting temperature difference between a sample side and a reference side, and also a metallic resistance circuit pattern, is fixed to a heat sink, and the heat sink is temperature controlled. If a temperature difference between the sample and the reference is detected, electrical power supplied to a compensation heater using metallic resistors is adjusted by a differential heat compensation circuit so that the temperature difference is immediately returned to zero, and a difference in supplied power is output as a differential heat flow.Type: ApplicationFiled: November 30, 2001Publication date: July 4, 2002Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
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Patent number: 6390669Abstract: A heat flux type differential scanning calorimeter has a heat reservoir made of a thermal conducting material. A thermally conductive plate is disposed in the heat reservoir for supporting an unknown sample and a reference sample symmetrically with respect to a center of the reservoir. A thermally conductive support member is disposed in contact with the thermally conductive plate and supports the thermally conductive plate in the heat reservoir. A heat buffer plate is disposed between the thermally conductive support member and the heat reservoir so that the thermally conductive support member and the heat reservoir are contacted only through the heat buffer plate.Type: GrantFiled: July 12, 1999Date of Patent: May 21, 2002Assignee: Seiko Instruments Inc.Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
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Publication number: 20020012379Abstract: A differential thermal analyzer/differential scanning calorimeter has a sample holder supported by a temperature detector inside a heat sink. The sample holder has a bottom wall defining a mounting surface and a side wall. During a measurement, a sample is placed on the mounting surface in the sample holder and the sample holder is inclined so that the sample slides downwardly due to its own weight and contacts the sample holder side wall. A beam of electromagnetic radiation is then passed through the sample and through aligned radiation openings in the bottom wall of the sample holder and in the heat sink, and temperature measurements are taken by the temperature detector. Because the sample is in contact with both the side and bottom walls of the sample holder, heat escape is minimized during temperature measurements.Type: ApplicationFiled: May 3, 2001Publication date: January 31, 2002Inventor: Ryoichi Kinoshita
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Patent number: 6250799Abstract: An integral structure is formed having a downstream opening portion of the first furnace tube joined with a second cylindrical furnace tube side face. A structure is provided by a light transmissive window provided in the opening portions at respective ends of the second furnace tube, and a gas discharge section provided in at least one position in the second furnace tube side face.Type: GrantFiled: January 13, 2000Date of Patent: June 26, 2001Assignee: Seiko Instruments Inc.Inventors: Ryoichi Kinoshita, Nobutaka Nakamura, Masatsugu Kawasaki