Patents by Inventor Ryoichi Kinoshita

Ryoichi Kinoshita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240035994
    Abstract: To provide a thermal analysis system and a thermal analysis method capable of easily performing thermal analysis while suppressing atmospheric exposure associated with sample movement. A thermal analysis system according to the present disclosure includes a sample preparing unit and a thermal analyzing unit. The sample preparing unit includes a wall portion forming an internal space, a gate portion capable of opening and closing an opening of the wall portion, and a sample holding member including a sample holder and temperature sensors. The thermal analyzer includes a moving mechanism for moving a sample holder into a thermal analysis part, a sealing mechanism for sealing the sample holder from an internal space of a sample preparation part, and a coupling mechanism for connecting a heating tube of the thermal analysis part to a gate part in a state of sealing the heating tube from the outside.
    Type: Application
    Filed: June 7, 2023
    Publication date: February 1, 2024
    Inventors: Martin Brunner, Ryoichi Kinoshita
  • Patent number: 11320408
    Abstract: A gas analysis device and a gas analysis method for performing measurement in a direct mode and a trap mode without carrying out a complicated control. The gas analysis device includes a branching section that branches a target gas, a mass spectrometer performing mass spectrometry of one branched target gas, a trap section holding the other branched target gas, a gas chromatograph analyzing the other branched target gas, and a controller controlling the flow path of the one branched target gas and the other branched target gas. The branching section is controlled so that, while a thermal analysis is performed by a thermal analysis device, the branching section continuously branches the supplied target gas and discharges the one branched target gas and the other branched target gas, and when the thermal analysis is completed, the other branched target gas held by the trap section is supplied to the gas chromatograph.
    Type: Grant
    Filed: September 16, 2020
    Date of Patent: May 3, 2022
    Assignee: NETZSCH-Gerätebau GmbH
    Inventors: Ryoichi Kinoshita, Hiroki Takaishi, Daisuke Ito, Kenta Sato
  • Publication number: 20210088485
    Abstract: A gas analysis device and a gas analysis method capable of performing measurement in a direct mode and a trap mode without carrying out a complicated control. The gas analysis device includes a branching section that branches a target gas, a mass spectrometer that carries out mass spectrometry of one branched target gases, a trap section that holds the other branched target gases, a gas chromatograph that analyzes the other branched target gas held by the trap section, and a controller that controls the flow path of the one branched target gas and the other branched target gas. The branching section is controlled so that, while the thermal analysis is being carried out by the thermal analysis device, the branching section continuously branches the supplied target gas and discharges one branched target gas and the other branched target gas, and when the thermal analysis has been completed, the other branched target gas held by the trap section is supplied to the gas chromatograph.
    Type: Application
    Filed: September 16, 2020
    Publication date: March 25, 2021
    Inventors: Ryoichi Kinoshita, Hiroki Takaishi, Daisuke Ito, Kenta Sato
  • Patent number: 9939329
    Abstract: A device for thermal analysis including: a pair of sample container assembly sets, having a sample container and a heat sink connected using a predetermined thermal resistance; a heating unit for equally heating the pair of sample container assembly sets; a temperature control for the heating unit; a weight measurement unit measuring difference between a sample and a reference material; while the heating unit is changed.
    Type: Grant
    Filed: July 31, 2015
    Date of Patent: April 10, 2018
    Assignee: Netzsch-Gerätebau GmbH
    Inventors: Yoshio Shinoda, Ryoichi Kinoshita
  • Publication number: 20160054181
    Abstract: A device for thermal analysis including: a pair of sample container assembly sets, having a sample container and a heat sink connected using a predetermined thermal resistance; a heating unit for equally heating the pair of sample container assembly sets; a temperature control for the heating unit; a weight measurement unit measuring difference between a sample and a reference material; while the heating unit is changed.
    Type: Application
    Filed: July 31, 2015
    Publication date: February 25, 2016
    Inventors: Yoshio Shinoda, Ryoichi Kinoshita
  • Patent number: 7641384
    Abstract: To enable the reduction in working efforts by hand by performing control a drying operation by appropriately selecting dry conditions depending on the connection mode of the cooling device, and removal of moisture and the like without fail. The thermal analysis system uses a heater and a cooling device to raise and decrease the temperature inside the purge box. In the drying method for the thermal analysis system, the drying operation is performed by: previously setting dry conditions depending on the connection mode of the cooling device; starting control of an opening time dry process upon activation of the thermal analysis system; supplying a predetermined amount of dry gas into the purge box in accordance with the dry conditions corresponding to the selected connection mode of the cooling device with the cooling device kept off; and making the temperature control module control the temperature of the dry gas.
    Type: Grant
    Filed: July 18, 2007
    Date of Patent: January 5, 2010
    Assignee: SII NanoTechnology Inc.
    Inventors: Rintaro Nakatani, Ryoichi Kinoshita, Shinya Nishimura
  • Patent number: 7588366
    Abstract: There is provided a differential scanning calorimeter in which a base line stability and a responsiveness are improved. There is made a constitution in which the stability is ensured by making a neck-like part in a heat passage from a heat reservoir 1 to a sensor plate 4 and, at the same time, a two-dimension heat flow passage to a sample holder 5a is ensured.
    Type: Grant
    Filed: February 14, 2008
    Date of Patent: September 15, 2009
    Assignee: SII NanoTechnology Inc.
    Inventor: Ryoichi Kinoshita
  • Publication number: 20080187020
    Abstract: There is provided a differential scanning calorimeter in which a base line stability and a responsiveness are improved. There is made a constitution in which the stability is ensured by making a neck-like part in a heat passage from a heat reservoir 1 to a sensor plate 4 and, at the same time, a two-dimension heat flow passage to a sample holder 5a is ensured.
    Type: Application
    Filed: February 14, 2008
    Publication date: August 7, 2008
    Applicant: SII NANO TECHNOLOGY INC.
    Inventor: Ryoichi Kinoshita
  • Publication number: 20080025364
    Abstract: To enable the reduction in working efforts by hand by performing control a drying operation by appropriately selecting dry conditions depending on the connection mode of the cooling device, and removal of moisture and the like without fail. The thermal analysis system uses a heater and a cooling device to raise and decrease the temperature inside the purge box. In the drying method for the thermal analysis system, the drying operation is performed by: previously setting dry conditions depending on the connection mode of the cooling device; starting control of an opening time dry process upon activation of the thermal analysis system; supplying a predetermined amount of dry gas into the purge box in accordance with the dry conditions corresponding to the selected connection mode of the cooling device with the cooling device kept off; and making the temperature control module control the temperature of the dry gas.
    Type: Application
    Filed: July 18, 2007
    Publication date: January 31, 2008
    Inventors: Rintaro Nakatani, Ryoichi Kinoshita, Shinya Nishimura
  • Patent number: 7275862
    Abstract: A differential scanning calorimeter has a heat sink for accommodating therein a measurement sample and a reference material, and a differential heat flow detector that detects a temperature difference between the sample and the reference material. A cooling mechanism cools the heat sink, and a thermoconductor is disposed between the cooling mechanism and the heat sink and forms a heat flow path between the two. A first heater heats the heat sink, and a second heater heats the thermoconductor to thereby heat the heat sink. The second heater begins operating before the first heater nears its rated maximum output power.
    Type: Grant
    Filed: November 17, 2004
    Date of Patent: October 2, 2007
    Assignee: SII NanoTechnology Inc.
    Inventors: Shinya Nishimura, Rintaro Nakatani, Ryoichi Kinoshita
  • Publication number: 20050163188
    Abstract: At a differential scanning calorimeter, a cooling mechanism for cooling a heat sink is provided at a lower part of the heat sink. A thermoconductor equipped with a second heater is provided between the heat sink and the cooling mechanism, and a heat path is formed between the heat sink and the cooling mechanism by the thermoconductor.
    Type: Application
    Filed: November 17, 2004
    Publication date: July 28, 2005
    Inventors: Shinya Nishimura, Rintaro Nakatani, Ryoichi Kinoshita
  • Patent number: 6709153
    Abstract: In order to provide means for suppressing vibration of a balance arm of a thermogravity apparatus when changing a sample at low cost and with a minimal footprint, there is therefore provided a balance arm having a sample holder, a detector for detecting an amount of shift of the balance arm from an equilibrium position, a control circuit for carrying out feedback control towards the equilibrium position of the balance arm, a driver for driving the balance arm towards the equilibrium position, an exchange stage detector for detecting when a sample is being changed, and a fixed output holding circuit for maintaining the output of the driver at a fixed level while the exchange stage is indicated by the exchange stage detector, wherein output of the driver is fixed during the sample exchange stage.
    Type: Grant
    Filed: October 9, 2002
    Date of Patent: March 23, 2004
    Assignee: SII NanoTechnology Inc.
    Inventors: Rintaro Nakatani, Keiko Ooshiro, Masafumi Take, Ryoichi Kinoshita
  • Publication number: 20030086471
    Abstract: In order to provide means for suppressing vibration of a balance arm of a thermogravity apparatus when changing a sample at low cost and with a minimal footprint, there is therefore provided a balance arm having a sample holder, a detector for detecting an amount of shift of the balance arm from an equilibrium position, a control circuit for carrying out feedback control towards the equilibrium position of the balance arm, a driver for driving the balance arm towards the equilibrium position, an exchange stage detector for detecting when a sample is being changed, and a fixed output holding circuit for maintaining the output of the driver at a fixed level while the exchange stage is indicated by the exchange stage detector, wherein output of the driver is fixed during the sample exchange stage.
    Type: Application
    Filed: October 9, 2002
    Publication date: May 8, 2003
    Inventors: Rintaro Nakatani, Keiko Ooshiro, Masafumi Take, Ryoichi Kinoshita
  • Publication number: 20030026319
    Abstract: To provide a differential scanning calorimeter in which rise and fall of temperatures of a sample and a reference substance follow rise and fall of temperature of a heat sink with excellent response maintaining a structure of a differential scanning calorimeter having a structure of providing stability of a base line constituting a characteristic of a heat flux type while achieving response equivalent to or faster than that of a power compensation type, in a structure of a heat flux type differential scanning calorimeter in which a heat flow path between a sample holder and a heat sink is formed by a metallic material having excellent heat conductance, heaters for power compensation are attached to the sample holder and a reference holder.
    Type: Application
    Filed: July 12, 2002
    Publication date: February 6, 2003
    Inventor: Ryoichi Kinoshita
  • Patent number: 6508585
    Abstract: An insulating substrate provided with two types of metallic or alloy circuit patterns for detecting temperature difference between a sample side and a reference side, and also a metallic resistance circuit pattern, is fixed to a heat sink, and the heat sink is temperature controlled. If a temperature difference between the sample and the reference is detected, electrical power supplied to a compensation heater using metallic resistors is adjusted by a differential heat compensation circuit so that the temperature difference is immediately returned to zero, and a difference in supplied power is output as a differential heat flow.
    Type: Grant
    Filed: November 30, 2001
    Date of Patent: January 21, 2003
    Assignee: Seiko Instruments Inc.
    Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
  • Patent number: 6422742
    Abstract: A sample holder and a reference holder are arranged coaxially. Heat conductors making heat exchange with a heat sink are joined to the heat sink at the same position. The inside diameter of the heat sink can be made close to the diameter of the sample container without spoiling the stability of the baseline that is a feature of heat-flux DSC. The heat capacity of the heat sink can be decreased. Therefore, the response to the temperature as it is elevated and lowered can be improved greatly.
    Type: Grant
    Filed: December 2, 1998
    Date of Patent: July 23, 2002
    Assignee: Seiko Instruments Inc.
    Inventor: Ryoichi Kinoshita
  • Publication number: 20020085615
    Abstract: An insulating substrate provided with two types of metallic or alloy circuit patterns for detecting temperature difference between a sample side and a reference side, and also a metallic resistance circuit pattern, is fixed to a heat sink, and the heat sink is temperature controlled. If a temperature difference between the sample and the reference is detected, electrical power supplied to a compensation heater using metallic resistors is adjusted by a differential heat compensation circuit so that the temperature difference is immediately returned to zero, and a difference in supplied power is output as a differential heat flow.
    Type: Application
    Filed: November 30, 2001
    Publication date: July 4, 2002
    Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
  • Patent number: 6390669
    Abstract: A heat flux type differential scanning calorimeter has a heat reservoir made of a thermal conducting material. A thermally conductive plate is disposed in the heat reservoir for supporting an unknown sample and a reference sample symmetrically with respect to a center of the reservoir. A thermally conductive support member is disposed in contact with the thermally conductive plate and supports the thermally conductive plate in the heat reservoir. A heat buffer plate is disposed between the thermally conductive support member and the heat reservoir so that the thermally conductive support member and the heat reservoir are contacted only through the heat buffer plate.
    Type: Grant
    Filed: July 12, 1999
    Date of Patent: May 21, 2002
    Assignee: Seiko Instruments Inc.
    Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
  • Publication number: 20020012379
    Abstract: A differential thermal analyzer/differential scanning calorimeter has a sample holder supported by a temperature detector inside a heat sink. The sample holder has a bottom wall defining a mounting surface and a side wall. During a measurement, a sample is placed on the mounting surface in the sample holder and the sample holder is inclined so that the sample slides downwardly due to its own weight and contacts the sample holder side wall. A beam of electromagnetic radiation is then passed through the sample and through aligned radiation openings in the bottom wall of the sample holder and in the heat sink, and temperature measurements are taken by the temperature detector. Because the sample is in contact with both the side and bottom walls of the sample holder, heat escape is minimized during temperature measurements.
    Type: Application
    Filed: May 3, 2001
    Publication date: January 31, 2002
    Inventor: Ryoichi Kinoshita
  • Patent number: 6250799
    Abstract: An integral structure is formed having a downstream opening portion of the first furnace tube joined with a second cylindrical furnace tube side face. A structure is provided by a light transmissive window provided in the opening portions at respective ends of the second furnace tube, and a gas discharge section provided in at least one position in the second furnace tube side face.
    Type: Grant
    Filed: January 13, 2000
    Date of Patent: June 26, 2001
    Assignee: Seiko Instruments Inc.
    Inventors: Ryoichi Kinoshita, Nobutaka Nakamura, Masatsugu Kawasaki