Patents by Inventor Ryoji Koganei

Ryoji Koganei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor circuit apparatus and test method thereof
    Patent number: 7243280
    Abstract: In a semiconductor circuit apparatus and its test method according to embodiments of the present invention, the clock enable control circuit can generate in a test mode an enable clock signal by using the substitute enable signal instead of the enable signal output from the enable signal generation combinational circuit and supplies it to the enable input terminal of the sequential circuit. Accordingly, with the simple structure in which the substitute enable signal is used, a proper enable clock signal can be generated and a scan test can be performed by reliably setting the sequential circuit to the enable state.
    Type: Grant
    Filed: August 13, 2004
    Date of Patent: July 10, 2007
    Assignee: Sony Corporation
    Inventor: Ryoji Koganei
  • Semiconductor circuit apparatus and test method thereof
    Publication number: 20050050412
    Abstract: In a semiconductor circuit apparatus and its test method according to embodiments of the present invention, the clock enable control circuit can generate in a test mode an enable clock signal by using the substitute enable signal instead of the enable signal output from the enable signal generation combinational circuit and supplies it to the enable input terminal of the sequential circuit. Accordingly, with the simple structure in which the substitute enable signal is used, a proper enable clock signal can be generated and a scan test can be performed by reliably setting the sequential circuit to the enable state.
    Type: Application
    Filed: August 13, 2004
    Publication date: March 3, 2005
    Inventor: Ryoji Koganei