Patents by Inventor Ryoko Araki

Ryoko Araki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11587226
    Abstract: To provide a magnetic domain image processing apparatus and a magnetic domain image processing method by which strain of an electromagnetic steel sheet can be evaluated in more detail.
    Type: Grant
    Filed: February 28, 2022
    Date of Patent: February 21, 2023
    Assignee: Hitachi, Ltd.
    Inventors: Ryoko Araki, Teruo Kohashi
  • Publication number: 20220309636
    Abstract: To provide a magnetic domain image processing apparatus and a magnetic domain image processing method by which strain of an electromagnetic steel sheet can be evaluated in more detail.
    Type: Application
    Filed: February 28, 2022
    Publication date: September 29, 2022
    Inventors: Ryoko ARAKI, Teruo KOHASHI
  • Patent number: 11163974
    Abstract: In an image acquisition system, a distortion distribution is easily measured in a wide range. A standard image of magnetic domain of a sample serving as a standard is acquired by radiation of light using a standard external magnetic field which serves as a standard, a plurality of magnetic domain images are acquired in a state where an external magnetic field is applied while being changed, a plurality of subtraction images obtained by subtracting the standard image of magnetic domain from each of the plurality of magnetic domain images are acquired, a magnetization reversal area in which a magnetic domain is reversed is extracted from each of the plurality of subtraction images, and a composite image having a plurality of magnetization reversal areas is acquired by compositing the plurality of subtraction images each having the magnetization reversal area.
    Type: Grant
    Filed: November 2, 2020
    Date of Patent: November 2, 2021
    Assignee: HITACHI, LTD.
    Inventors: Ryoko Araki, Teruo Kohashi, Jun Xie
  • Publication number: 20210192178
    Abstract: In an image acquisition system, a distortion distribution is easily measured in a wide range. A standard image of magnetic domain of a sample serving as a standard is acquired by radiation of light using a standard external magnetic field which serves as a standard, a plurality of magnetic domain images are acquired in a state where an external magnetic field is applied while being changed, a plurality of subtraction images obtained by subtracting the standard image of magnetic domain from each of the plurality of magnetic domain images are acquired, a magnetization reversal area in which a magnetic domain is reversed is extracted from each of the plurality of subtraction images, and a composite image having a plurality of magnetization reversal areas is acquired by compositing the plurality of subtraction images each having the magnetization reversal area.
    Type: Application
    Filed: November 2, 2020
    Publication date: June 24, 2021
    Applicant: HITACHI, LTD.
    Inventors: Ryoko ARAKI, Teruo KOHASHI, Jun XIE
  • Patent number: 11043358
    Abstract: A measuring apparatus that irradiates a sample with a charged particle beam to observe the sample includes a particle source that outputs the charged particle beam, a lens that collects the charged particle beam, a detector that detects a signal of emitted electrons emitted from the sample which is irradiated with the charged particle beam, and a control device that controls the output of the charged particle beam and the detection of the signal of the emitted electrons in accordance with an observation condition, in which the control device sets, as the observation condition, a first parameter for controlling an irradiation cycle of the charged particle beam, a second parameter for controlling a pulse width of the pulsed charged particle beam, and a third parameter for controlling detection timing of the signal of the emitted electron within the irradiation time of the pulsed charged particle beam, and the third parameter is determined in accordance with a difference in intensity of signals of the plurality
    Type: Grant
    Filed: May 12, 2017
    Date of Patent: June 22, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Ryoko Araki, Natsuki Tsuno, Yohei Nakamura, Masahiro Sasajima, Mitsuhiro Nakamura, Toshihide Agemura
  • Publication number: 20200111638
    Abstract: A measuring apparatus that irradiates a sample with a charged particle beam to observe the sample includes a particle source that outputs the charged particle beam, a lens that collects the charged particle beam, a detector that detects a signal of emitted electrons emitted from the sample which is irradiated with the charged particle beam, and a control device that controls the output of the charged particle beam and the detection of the signal of the emitted electrons in accordance with an observation condition, in which the control device sets, as the observation condition, a first parameter for controlling an irradiation cycle of the charged particle beam, a second parameter for controlling a pulse width of the pulsed charged particle beam, and a third parameter for controlling detection timing of the signal of the emitted electron within the irradiation time of the pulsed charged particle beam, and the third parameter is determined in accordance with a difference in intensity of signals of the plurali
    Type: Application
    Filed: May 12, 2017
    Publication date: April 9, 2020
    Inventors: Ryoko ARAKI, Natsuki TSUNO, Yohei NAKAMURA, Masahiro SASAJIMA, Mitsuhiro NAKAMURA, Toshihide AGEMURA
  • Patent number: 10338367
    Abstract: A scanning microscope includes: a charged particle beam source configured to output a charged particle beam to be emitted to a sample; a detector configured to detect charged particles from the sample; and a controller configured to control the charged particle beam source and the detector, wherein the controller changes one or more variable parameters to determine a plurality of different parameter value sets, acquires a measurement result of a temporal change of absorption current in a target sample material under each of the plurality of different parameter value sets, and, based on the measurement results, selects a parameter value set for use in measurement of the target sample from the plurality of different parameter value sets.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: July 2, 2019
    Assignee: Hitachi, Ltd.
    Inventors: Ryoko Araki, Hyejin Kim, Daisuke Bizen
  • Publication number: 20180067294
    Abstract: A scanning microscope includes: a charged particle beam source configured to output a charged particle beam to be emitted to a sample; a detector configured to detect charged particles from the sample; and a controller configured to control the charged particle beam source and the detector, wherein the controller changes one or more variable parameters to determine a plurality of different parameter value sets, acquires a measurement result of a temporal change of absorption current in a target sample material under each of the plurality of different parameter value sets, and, based on the measurement results, selects a parameter value set for use in measurement of the target sample from the plurality of different parameter value sets.
    Type: Application
    Filed: August 31, 2017
    Publication date: March 8, 2018
    Inventors: Ryoko ARAKI, Hyejin KIM, Daisuke BIZEN
  • Patent number: 7892663
    Abstract: Embodiments of the present invention provide a perpendicular magnetic recording media having excellent resolution, signal to noise ratio (S/N), and a small adjacent track erasure. According to one embodiment, underlayers for controlling the orientation and segregation of a magnetic layer, a magnetic layer including an oxide and an alloy of magnetic materials mainly composed of Co, Cr, and Pt, and a ferromagnetic-metal layer which does not contain oxygen, are formed over a substrate. The magnetic layer has at least two layers including ferromagnetic grains and oxides, a first magnetic layer, which is the part of the magnetic layer closer to the substrate, has grain boundaries mainly composed of Cr oxide and at least one oxide selected from Si, Ti, Nb, and Ta, and grain boundaries of a second magnetic layer at the ferromagnetic-metal layer side includes at least one oxide selected from Si, Ti, Nb, and Ta in which Cr oxide is less than the first magnetic layer.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: February 22, 2011
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Hiroyuki Nakagawa, Ryoko Araki, Naoto Ito, Takayuki Ichihara
  • Publication number: 20090264319
    Abstract: The purpose of the present invention is to prepare a cellular gene expression profile from an extremely small number of cells so as to realize its application to pathological samples, microtissues, microanimals, etc, whose handling has been infeasible because of a limited sample amount, and further to realize a gene expression profile as to cells of peripheral blood for use in pathological diagnosis, etc. There is provided a method attaining improvement of the high coverage expression profiling analysis (HiCEP) disclosed in the pamphlet of WO 02/48352, characterized in that an amount of mRNA contained in a starting material is increased through obtaining amplified RNA complementary to double-stranded cDNA sequence by the action of RNA polymerase, and that the number of double-stranded cDNAs having X primer and Y primer added thereto is increased by the use of PCR.
    Type: Application
    Filed: March 17, 2005
    Publication date: October 22, 2009
    Inventors: Masumi Abe, Ryoko Araki
  • Publication number: 20090147403
    Abstract: Embodiments in accordance with the present invention provide a perpendicular magnetic recording medium where the signal to noise (S/N) of the media is improved. In a particular embodiment, a magnetic layer is applied to the recording magnetic layer of the recording medium in which the normalization crystal grain cluster size (Dn) is controlled so as to satisfy 1?Dn?1.9, where the mean value of the recording crystal grain cluster area obtained by summation of the area of neighboring grains having the same crystal orientation in both the a-axis and the c-axis of the recording layer crystal grain of the magnetic layer is normalized by the mean grain size.
    Type: Application
    Filed: November 18, 2008
    Publication date: June 11, 2009
    Inventors: Ryoko Araki, Yoshio Takahashi
  • Publication number: 20090052074
    Abstract: Embodiments of the present invention provide a perpendicular magnetic recording media having excellent resolution, signal to noise ratio (S/N), and a small adjacent track erasure. According to one embodiment, underlayers for controlling the orientation and segregation of a magnetic layer, a magnetic layer including an oxide and an alloy of magnetic materials mainly composed of Co, Cr, and Pt, and a ferromagnetic-metal layer which does not contain oxygen, are formed over a substrate. The magnetic layer has at least two layers including ferromagnetic grains and oxides, a first magnetic layer, which is the part of the magnetic layer closer to the substrate, has grain boundaries mainly composed of Cr oxide and at least one oxide selected from Si, Ti, Nb, and Ta, and grain boundaries of a second magnetic layer at the ferromagnetic-metal layer side includes at least one oxide selected from Si, Ti, Nb, and Ta in which Cr oxide is less than the first magnetic layer.
    Type: Application
    Filed: May 30, 2008
    Publication date: February 26, 2009
    Applicant: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Hiroyuki Nakagawa, Ryoko Araki, Naoto Ito, Takayuki Ichihara
  • Patent number: 7374831
    Abstract: A distribution of grain boundaries in a magnetic recording medium having a granular structure is reduced so that the magnetic recording medium with a high medium signal-to-noise ratio is provided. According to one embodiment, in an underlayer composed of grains each having a generally columnar structure and in a magnetic recording layer composed of magnetic crystal grains each having a generally columnar structure and grain boundaries, a grain size Dm of the magnetic recording layer and a grain size Du of each of the underlayer crystal grains are determined to satisfy a relationship represented by 0.8×Du?Dm<Du and a standardized grain boundary distribution obtained by dividing the standardized deviation of the distribution of the grain boundaries by an average grain boundary width is adjusted to about 0.4 or less.
    Type: Grant
    Filed: October 29, 2004
    Date of Patent: May 20, 2008
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Ryoko Araki, Yoshio Takahashi
  • Publication number: 20050142387
    Abstract: A distribution of grain boundaries in a magnetic recording medium having a granular structure is reduced so that the magnetic recording medium with a high medium signal-to-noise ratio is provided. According to one embodiment, in an underlayer composed of grains each having a generally columnar structure and in a magnetic recording layer composed of magnetic crystal grains each having a generally columnar structure and grain boundaries, a grain size Dm of the magnetic recording layer and a grain size Du of each of the underlayer crystal grains are determined to satisfy a relationship represented by 0.8×Du?Dm<Du and a standardized grain boundary distribution obtained by dividing the standardized deviation of the distribution of the grain boundaries by an average grain boundary width is adjusted to about 0.4 or less.
    Type: Application
    Filed: October 29, 2004
    Publication date: June 30, 2005
    Applicant: Hitachi Global Storage Technologies Netherlands, B.V.
    Inventors: Ryoko Araki, Yoshio Takahashi