Patents by Inventor Ryoko Araki
Ryoko Araki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11587226Abstract: To provide a magnetic domain image processing apparatus and a magnetic domain image processing method by which strain of an electromagnetic steel sheet can be evaluated in more detail.Type: GrantFiled: February 28, 2022Date of Patent: February 21, 2023Assignee: Hitachi, Ltd.Inventors: Ryoko Araki, Teruo Kohashi
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Publication number: 20220309636Abstract: To provide a magnetic domain image processing apparatus and a magnetic domain image processing method by which strain of an electromagnetic steel sheet can be evaluated in more detail.Type: ApplicationFiled: February 28, 2022Publication date: September 29, 2022Inventors: Ryoko ARAKI, Teruo KOHASHI
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Patent number: 11163974Abstract: In an image acquisition system, a distortion distribution is easily measured in a wide range. A standard image of magnetic domain of a sample serving as a standard is acquired by radiation of light using a standard external magnetic field which serves as a standard, a plurality of magnetic domain images are acquired in a state where an external magnetic field is applied while being changed, a plurality of subtraction images obtained by subtracting the standard image of magnetic domain from each of the plurality of magnetic domain images are acquired, a magnetization reversal area in which a magnetic domain is reversed is extracted from each of the plurality of subtraction images, and a composite image having a plurality of magnetization reversal areas is acquired by compositing the plurality of subtraction images each having the magnetization reversal area.Type: GrantFiled: November 2, 2020Date of Patent: November 2, 2021Assignee: HITACHI, LTD.Inventors: Ryoko Araki, Teruo Kohashi, Jun Xie
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Publication number: 20210192178Abstract: In an image acquisition system, a distortion distribution is easily measured in a wide range. A standard image of magnetic domain of a sample serving as a standard is acquired by radiation of light using a standard external magnetic field which serves as a standard, a plurality of magnetic domain images are acquired in a state where an external magnetic field is applied while being changed, a plurality of subtraction images obtained by subtracting the standard image of magnetic domain from each of the plurality of magnetic domain images are acquired, a magnetization reversal area in which a magnetic domain is reversed is extracted from each of the plurality of subtraction images, and a composite image having a plurality of magnetization reversal areas is acquired by compositing the plurality of subtraction images each having the magnetization reversal area.Type: ApplicationFiled: November 2, 2020Publication date: June 24, 2021Applicant: HITACHI, LTD.Inventors: Ryoko ARAKI, Teruo KOHASHI, Jun XIE
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Patent number: 11043358Abstract: A measuring apparatus that irradiates a sample with a charged particle beam to observe the sample includes a particle source that outputs the charged particle beam, a lens that collects the charged particle beam, a detector that detects a signal of emitted electrons emitted from the sample which is irradiated with the charged particle beam, and a control device that controls the output of the charged particle beam and the detection of the signal of the emitted electrons in accordance with an observation condition, in which the control device sets, as the observation condition, a first parameter for controlling an irradiation cycle of the charged particle beam, a second parameter for controlling a pulse width of the pulsed charged particle beam, and a third parameter for controlling detection timing of the signal of the emitted electron within the irradiation time of the pulsed charged particle beam, and the third parameter is determined in accordance with a difference in intensity of signals of the pluralityType: GrantFiled: May 12, 2017Date of Patent: June 22, 2021Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Ryoko Araki, Natsuki Tsuno, Yohei Nakamura, Masahiro Sasajima, Mitsuhiro Nakamura, Toshihide Agemura
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Publication number: 20200111638Abstract: A measuring apparatus that irradiates a sample with a charged particle beam to observe the sample includes a particle source that outputs the charged particle beam, a lens that collects the charged particle beam, a detector that detects a signal of emitted electrons emitted from the sample which is irradiated with the charged particle beam, and a control device that controls the output of the charged particle beam and the detection of the signal of the emitted electrons in accordance with an observation condition, in which the control device sets, as the observation condition, a first parameter for controlling an irradiation cycle of the charged particle beam, a second parameter for controlling a pulse width of the pulsed charged particle beam, and a third parameter for controlling detection timing of the signal of the emitted electron within the irradiation time of the pulsed charged particle beam, and the third parameter is determined in accordance with a difference in intensity of signals of the pluraliType: ApplicationFiled: May 12, 2017Publication date: April 9, 2020Inventors: Ryoko ARAKI, Natsuki TSUNO, Yohei NAKAMURA, Masahiro SASAJIMA, Mitsuhiro NAKAMURA, Toshihide AGEMURA
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Patent number: 10338367Abstract: A scanning microscope includes: a charged particle beam source configured to output a charged particle beam to be emitted to a sample; a detector configured to detect charged particles from the sample; and a controller configured to control the charged particle beam source and the detector, wherein the controller changes one or more variable parameters to determine a plurality of different parameter value sets, acquires a measurement result of a temporal change of absorption current in a target sample material under each of the plurality of different parameter value sets, and, based on the measurement results, selects a parameter value set for use in measurement of the target sample from the plurality of different parameter value sets.Type: GrantFiled: August 31, 2017Date of Patent: July 2, 2019Assignee: Hitachi, Ltd.Inventors: Ryoko Araki, Hyejin Kim, Daisuke Bizen
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Publication number: 20180067294Abstract: A scanning microscope includes: a charged particle beam source configured to output a charged particle beam to be emitted to a sample; a detector configured to detect charged particles from the sample; and a controller configured to control the charged particle beam source and the detector, wherein the controller changes one or more variable parameters to determine a plurality of different parameter value sets, acquires a measurement result of a temporal change of absorption current in a target sample material under each of the plurality of different parameter value sets, and, based on the measurement results, selects a parameter value set for use in measurement of the target sample from the plurality of different parameter value sets.Type: ApplicationFiled: August 31, 2017Publication date: March 8, 2018Inventors: Ryoko ARAKI, Hyejin KIM, Daisuke BIZEN
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Patent number: 7892663Abstract: Embodiments of the present invention provide a perpendicular magnetic recording media having excellent resolution, signal to noise ratio (S/N), and a small adjacent track erasure. According to one embodiment, underlayers for controlling the orientation and segregation of a magnetic layer, a magnetic layer including an oxide and an alloy of magnetic materials mainly composed of Co, Cr, and Pt, and a ferromagnetic-metal layer which does not contain oxygen, are formed over a substrate. The magnetic layer has at least two layers including ferromagnetic grains and oxides, a first magnetic layer, which is the part of the magnetic layer closer to the substrate, has grain boundaries mainly composed of Cr oxide and at least one oxide selected from Si, Ti, Nb, and Ta, and grain boundaries of a second magnetic layer at the ferromagnetic-metal layer side includes at least one oxide selected from Si, Ti, Nb, and Ta in which Cr oxide is less than the first magnetic layer.Type: GrantFiled: May 30, 2008Date of Patent: February 22, 2011Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Hiroyuki Nakagawa, Ryoko Araki, Naoto Ito, Takayuki Ichihara
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Publication number: 20090264319Abstract: The purpose of the present invention is to prepare a cellular gene expression profile from an extremely small number of cells so as to realize its application to pathological samples, microtissues, microanimals, etc, whose handling has been infeasible because of a limited sample amount, and further to realize a gene expression profile as to cells of peripheral blood for use in pathological diagnosis, etc. There is provided a method attaining improvement of the high coverage expression profiling analysis (HiCEP) disclosed in the pamphlet of WO 02/48352, characterized in that an amount of mRNA contained in a starting material is increased through obtaining amplified RNA complementary to double-stranded cDNA sequence by the action of RNA polymerase, and that the number of double-stranded cDNAs having X primer and Y primer added thereto is increased by the use of PCR.Type: ApplicationFiled: March 17, 2005Publication date: October 22, 2009Inventors: Masumi Abe, Ryoko Araki
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Publication number: 20090147403Abstract: Embodiments in accordance with the present invention provide a perpendicular magnetic recording medium where the signal to noise (S/N) of the media is improved. In a particular embodiment, a magnetic layer is applied to the recording magnetic layer of the recording medium in which the normalization crystal grain cluster size (Dn) is controlled so as to satisfy 1?Dn?1.9, where the mean value of the recording crystal grain cluster area obtained by summation of the area of neighboring grains having the same crystal orientation in both the a-axis and the c-axis of the recording layer crystal grain of the magnetic layer is normalized by the mean grain size.Type: ApplicationFiled: November 18, 2008Publication date: June 11, 2009Inventors: Ryoko Araki, Yoshio Takahashi
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Publication number: 20090052074Abstract: Embodiments of the present invention provide a perpendicular magnetic recording media having excellent resolution, signal to noise ratio (S/N), and a small adjacent track erasure. According to one embodiment, underlayers for controlling the orientation and segregation of a magnetic layer, a magnetic layer including an oxide and an alloy of magnetic materials mainly composed of Co, Cr, and Pt, and a ferromagnetic-metal layer which does not contain oxygen, are formed over a substrate. The magnetic layer has at least two layers including ferromagnetic grains and oxides, a first magnetic layer, which is the part of the magnetic layer closer to the substrate, has grain boundaries mainly composed of Cr oxide and at least one oxide selected from Si, Ti, Nb, and Ta, and grain boundaries of a second magnetic layer at the ferromagnetic-metal layer side includes at least one oxide selected from Si, Ti, Nb, and Ta in which Cr oxide is less than the first magnetic layer.Type: ApplicationFiled: May 30, 2008Publication date: February 26, 2009Applicant: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Hiroyuki Nakagawa, Ryoko Araki, Naoto Ito, Takayuki Ichihara
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Patent number: 7374831Abstract: A distribution of grain boundaries in a magnetic recording medium having a granular structure is reduced so that the magnetic recording medium with a high medium signal-to-noise ratio is provided. According to one embodiment, in an underlayer composed of grains each having a generally columnar structure and in a magnetic recording layer composed of magnetic crystal grains each having a generally columnar structure and grain boundaries, a grain size Dm of the magnetic recording layer and a grain size Du of each of the underlayer crystal grains are determined to satisfy a relationship represented by 0.8×Du?Dm<Du and a standardized grain boundary distribution obtained by dividing the standardized deviation of the distribution of the grain boundaries by an average grain boundary width is adjusted to about 0.4 or less.Type: GrantFiled: October 29, 2004Date of Patent: May 20, 2008Assignee: Hitachi Global Storage Technologies Netherlands B.V.Inventors: Ryoko Araki, Yoshio Takahashi
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Publication number: 20050142387Abstract: A distribution of grain boundaries in a magnetic recording medium having a granular structure is reduced so that the magnetic recording medium with a high medium signal-to-noise ratio is provided. According to one embodiment, in an underlayer composed of grains each having a generally columnar structure and in a magnetic recording layer composed of magnetic crystal grains each having a generally columnar structure and grain boundaries, a grain size Dm of the magnetic recording layer and a grain size Du of each of the underlayer crystal grains are determined to satisfy a relationship represented by 0.8×Du?Dm<Du and a standardized grain boundary distribution obtained by dividing the standardized deviation of the distribution of the grain boundaries by an average grain boundary width is adjusted to about 0.4 or less.Type: ApplicationFiled: October 29, 2004Publication date: June 30, 2005Applicant: Hitachi Global Storage Technologies Netherlands, B.V.Inventors: Ryoko Araki, Yoshio Takahashi