Patents by Inventor Ryosei Kawai

Ryosei Kawai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7166013
    Abstract: The present invention relates to a polishing apparatus, and a semiconductor manufacturing method using the apparatus. Dressing of a grindstone surface is ground by sizing processing whereby dressing of a tool surface can be done while preventing occurrence of cracks on the grindstone surface which is the cause for occurrence of scratches. Further, flatness of the surface of a dressing tool can be guaranteed because of sizing cutting-in; even if a thick grindstone of a few centimeters is used, the flatness can be maintained to the end; and processing with less in-face unevenness can be always carried out. Therefore, the life of the dressing tool can be greatly extended. Further, the present sizing-dressing is carried out jointly with processing of a wafer to thereby enable improvement of throughput of the apparatus as well as maintenance of a processing rate. The present apparatus and method are effective for planarization of various substrate surfaces having irregularities.
    Type: Grant
    Filed: December 7, 2004
    Date of Patent: January 23, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Shigeo Moriyama, Yoshihiro Ishida, Takashi Kugaya, Shigeo Ootsuki, Soichi Katagiri, Sadayuki Nishimura, Ryosei Kawai, Kan Yasui
  • Patent number: 7137866
    Abstract: The present invention relates to a polishing apparatus, and a semiconductor manufacturing method using the apparatus. Dressing of a grindstone surface is ground by sizing processing whereby dressing of a tool surface can be done while preventing occurrence of cracks on the grindstone surface which is the cause for occurrence of scratches. Further, flatness of the surface of a dressing tool can be guaranteed because of sizing cutting-in; even if a thick grindstone of a few centimeters is used, the flatness can be maintained to the end; and processing with less in-face unevenness can be always carried out. Therefore, the life of the dressing tool can be greatly extended. Further, the present sizing-dressing is carried out jointly with processing of a wafer to thereby enable improvement of throughput of the apparatus as well as maintenance of a processing rate. The present apparatus and method are effective for planarization of various substrate surfaces having irregularities.
    Type: Grant
    Filed: November 7, 2005
    Date of Patent: November 21, 2006
    Assignee: Hitachi Ltd.
    Inventors: Shigeo Moriyama, Yoshihiro Ishida, Takashi Kugaya, Shigeo Ootsuki, Soichi Katagiri, Sadayuki Nishimura, Ryosei Kawai, Kan Yasui
  • Publication number: 20060057940
    Abstract: The present invention relates to a polishing apparatus, and a semiconductor manufacturing method using the apparatus. Dressing of a grindstone surface is ground by sizing processing whereby dressing of a tool surface can be done while preventing occurrence of cracks on the grindstone surface which is the cause for occurrence of scratches. Further, flatness of the surface of a dressing tool can be guaranteed because of sizing cutting-in; even if a thick grindstone of a few centimeters is used, the flatness can be maintained to the end; and processing with less in-face unevenness can be always carried out. Therefore, the life of the dressing tool can be greatly extended. Further, the present sizing-dressing is carried out jointly with processing of a wafer to thereby enable improvement of throughput of the apparatus as well as maintenance of a processing rate. The present apparatus and method are effective for planarization of various substrate surfaces having irregularities.
    Type: Application
    Filed: November 7, 2005
    Publication date: March 16, 2006
    Inventors: Shigeo Moriyama, Yoshihiro Ishida, Takashi Kugaya, Shigeo Ootsuki, Soichi Katagiri, Sadayuki Nishimura, Ryosei Kawai, Kan Yasui
  • Publication number: 20050095960
    Abstract: The present invention relates to a polishing apparatus, and a semiconductor manufacturing method using the apparatus. Dressing of a grindstone surface is ground by sizing processing whereby dressing of a tool surface can be done while preventing occurrence of cracks on the grindstone surface which is the cause for occurrence of scratches. Further, flatness of the surface of a dressing tool can be guaranteed because of sizing cutting-in; even if a thick grindstone of a few centimeters is used, the flatness can be maintained to the end; and processing with less in-face unevenness can be always carried out. Therefore, the life of the dressing tool can be greatly extended. Further, the present sizing-dressing is carried out jointly with processing of a wafer to thereby enable improvement of throughput of the apparatus as well as maintenance of a processing rate. The present apparatus and method are effective for planarization of various substrate surfaces having irregularities.
    Type: Application
    Filed: December 7, 2004
    Publication date: May 5, 2005
    Inventors: Shigeo Moriyama, Yoshihiro Ishida, Takashi Kugaya, Shigeo Ootsuki, Soichi Katagiri, Sadayuki Nishimura, Ryosei Kawai, Kan Yasui
  • Publication number: 20030199238
    Abstract: The present invention relates to a polishing apparatus, and a semiconductor manufacturing method using the apparatus. Dressing of a grindstone surface is ground by sizing processing whereby dressing of a tool surface can be done while preventing occurrence of cracks on the grindstone surface which is the cause for occurrence of scratches. Further, flatness of the surface of a dressing tool can be guaranteed because of sizing cutting-in; even if a thick grindstone of a few centimeters is used, the flatness can be maintained to the end; and processing with less in-face unevenness can be always carried out. Therefore, the life of the dressing tool can be greatly extended.
    Type: Application
    Filed: April 19, 2002
    Publication date: October 23, 2003
    Inventors: Shigeo Moriyama, Yoshihiro Ishida, Takashi Kugaya, Shigeo Ootsuki, Soichi Katagiri, Sadayuki Nishimura, Ryosei Kawai, Kan Yasui