Patents by Inventor Ryosuke Hasui
Ryosuke Hasui has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10558175Abstract: A technique capable of shortening a period in which value of a PID parameter is outside of an appropriate range is provided. A measured value acquisition functional unit processes a sensing signal of a sensor that measures a barrel and acquires a measured value of the barrel. A storage unit stores a target value of the barrel and a PID parameter. An operation amount calculation functional unit calculates an amount of operation using the PID parameter and a difference between the measured value and the target value. A first output unit and a second output unit output the amount of operation. A first updating functional unit updates the PID parameter through a first update process when the variation range is greater than a first range, and a second updating functional unit updates the PID parameter through a second update process when the variation range is less than a second range.Type: GrantFiled: October 16, 2017Date of Patent: February 11, 2020Assignee: OMRON CorporationInventors: Hajime Tsubata, Ryosuke Hasui, Takaaki Yamada, Hitoshi Tanaka
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Publication number: 20180217565Abstract: A technique capable of shortening a period in which value of a PID parameter is outside of an appropriate range is provided. A measured value acquisition functional unit processes a sensing signal of a sensor that measures a barrel and acquires a measured value of the barrel. A storage unit stores a target value of the barrel and a PID parameter. An operation amount calculation functional unit calculates an amount of operation using the PID parameter and a difference between the measured value and the target value. A first output unit and a second output unit output the amount of operation. A first updating functional unit updates the PID parameter through a first update process when the variation range is greater than a first range, and a second updating functional unit updates the PID parameter through a second update process when the variation range is less than a second range.Type: ApplicationFiled: October 16, 2017Publication date: August 2, 2018Applicant: OMRON CorporationInventors: Hajime TSUBATA, Ryosuke HASUI, Takaaki YAMADA, Hitoshi TANAKA
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Publication number: 20180203422Abstract: A hunting phenomenon of a control object is suppressed. A temperature adjusting device (10) includes a control unit (12), an input unit (13), and a filter (15). The filter (15) is connected to a location upstream of the input unit (13), cuts off a high frequency component of a measurement value (SS), and outputs a measurement value (SSF) after being subjected to filtering processing to the input unit (13). A measurement value (SSF) of a control object after being subjected to filtering processing is input to the input unit (13), and an actual measurement value (PV) based on the measurement value (SSF) after being subjected to filtering processing is output. The control unit (12) calculates an operation amount (MV) with respect to the control object such that the actual measurement value (PV) approximates a target value (SP) with respect to the control object.Type: ApplicationFiled: October 6, 2017Publication date: July 19, 2018Applicant: OMRON CorporationInventors: Masahiro OZAKI, Takaaki YAMADA, Ryosuke HASUI, Akira TAKAISHI, Hironori OGAWA
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Publication number: 20110236265Abstract: A channel chip includes a substrate made of a material capable of transmitting light. The substrate includes a groove to form a channel for allowing a fluid to flow. A film is made of a material capable of transmitting light. The film is bonded to the substrate with a pressure sensitive adhesive agent to seal the groove.Type: ApplicationFiled: February 18, 2011Publication date: September 29, 2011Applicant: OMRON CORPORATIONInventors: Ryosuke Hasui, Hiroyuki Iwasaka, Takeo Nishikawa, Keisuke Yamada, Susumu Kamiyama
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Patent number: 7999941Abstract: A metal layer 13 made of Au or the like is formed on the upper surface of a transparent substrate 12. Dielectric layers 14a, 14b and 14c with different thicknesses are formed on the upper surface of the metal layer 13 (any one of the dielectric layers can have a thickness of 0) to form respective determination areas 15a, 15b and 15c. Further, different types of antibodies 22a, 22b and 22c are fixed on the upper surfaces of the respective dielectric layers 14a, 14b and 14c. Then, light is directed to the determination areas 15a, 15b and 15c, then signals of light reflected by the determination areas 15a, 15b and 15c are received, the light is dispersed, and analyses are performed on signals resulted from the light dispersion to detect the conditions of the surfaces of the respective determination areas, at the same time.Type: GrantFiled: March 14, 2007Date of Patent: August 16, 2011Assignee: OMRON CorporationInventors: Tomohiko Matsushita, Hideyuki Yamashita, Takeo Nishikawa, Megumi Moriyama, Ryosuke Hasui, Shigeru Aoyama
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Patent number: 7839508Abstract: A sensor chip has a metal layer formed on a surface of a substrate, where a plurality of microscopic concave part is formed in a measurement region of the surface of the metal layer. When light of linear polarization is irradiated onto the measurement region, local resonance electric field generates at opposing metal layer surfaces in the concave part. The reflected light thereof is received to measure reflectance. The light of linear polarization is irradiated so that the polarizing surface becomes orthogonal to the longitudinal direction of the concave part.Type: GrantFiled: March 5, 2008Date of Patent: November 23, 2010Assignee: OMRON CorporationInventors: Takeo Nishikawa, Tomohiko Matsushita, Hideyuki Yamashita, Ryosuke Hasui, Satoshi Fujita, Yutaro Okuno, Shigeru Aoyama
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Publication number: 20100067015Abstract: A metal layer 13 made of Au or the like is formed on the upper surface of a transparent substrate 12. Dielectric layers 14a, 14b and 14c with different thicknesses are formed on the upper surface of the metal layer 13 (any one of the dielectric layers can have a thickness of 0) to form respective determination areas 15a, 15b and 15c. Further, different types of antibodies 22a, 22b and 22c are fixed on the upper surfaces of the respective dielectric layers 14a, 14b and 14c. Then, light is directed to the determination areas 15a, 15b and 15c, then signals of light reflected by the determination areas 15a, 15b and 15c are received, the light is dispersed, and analyses are performed on signals resulted from the light dispersion to detect the conditions of the surfaces of the respective determination areas, at the same time.Type: ApplicationFiled: March 14, 2007Publication date: March 18, 2010Applicant: OMRON CORPORATIONInventors: Tomohiko Matsushita, Hideyuki Yamashita, Takeo Nishikawa, Megumi Moriyama, Ryosuke Hasui, Shigeru Aoyama
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Publication number: 20080218761Abstract: A sensor chip has a metal layer formed on a surface of a substrate, where a plurality of microscopic concave part is formed in a measurement region of the surface of the metal layer. When light of linear polarization is irradiated onto the measurement region, local resonance electric field generates at opposing metal layer surfaces in the concave part. The reflected light thereof is received to measure reflectance. The light of linear polarization is irradiated so that the polarizing surface becomes orthogonal to the longitudinal direction of the concave part.Type: ApplicationFiled: March 5, 2008Publication date: September 11, 2008Applicant: OMRON CORPORATIONInventors: Takeo Nishikawa, Tomohiko Matsushita, Hideyuki Yamashita, Ryosuke Hasui, Satoshi Fujita, Yutaro Okuno, Shigeru Aoyama