Patents by Inventor Ryota TAKASU

Ryota TAKASU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240110496
    Abstract: The present invention provides an ohmic heating-type exhaust gas purification catalyst system. The ohmic heating-type exhaust gas purification catalyst system is configured to perform, based on information of temperature of a catalyst bed input from a temperature detector of an ohmic heating-type exhaust gas purification device, electric current pass control including controls of (1) causing an electric current to pass through a pair of electrodes when the temperature of the catalyst bed is equal to or lower than a first threshold temperature T1 set in a range of 350±25° C., (2) not causing an electric current to pass through the pair of electrodes when the temperature of the catalyst bed exceeds the first threshold temperature T1 and is equal to or lower than a second threshold temperature T2 set in a range of 450±25° C.
    Type: Application
    Filed: February 1, 2022
    Publication date: April 4, 2024
    Inventors: Ryota Onoe, Junichi Hori, Ryosuke Takasu, Tatsuya Ohashi, Shunsuke Oishi
  • Publication number: 20230400334
    Abstract: An object of the present disclosure is to provide a loss analysis device and a loss analysis method of detecting an event with high reproducibility when an SN ratio is small or when an event interval is short. According to the present disclosure, a loss analysis device includes an OTDR waveform acquisition unit that acquires an OTDR waveform of a measurement target optical fiber, and a calculation unit that performs nonlinear fitting of an event model function to the OTDR waveform and calculates a position of a start point of each event included in the OTDR waveform, a level at the start point of each event, a loss of each event, and a return loss of each event, the event model function using the position, the level, the loss, and the return loss as parameters.
    Type: Application
    Filed: June 9, 2023
    Publication date: December 14, 2023
    Inventors: Ryota TAKASU, Taichi MURAKAMI
  • Publication number: 20230400381
    Abstract: An object of the present disclosure is to improve an SN ratio while maintaining a distance resolution and to accurately detect an event occurrence location. An event detection device according to the present disclosure includes: an OTDR waveform acquisition unit that acquires an OTDR waveform of an optical fiber to be measured; a feature quantity extraction unit that performs wavelet transform on the OTDR waveform and generates a scalogram with each wavelet coefficient as a feature quantity; a peak extraction unit that calculates a noise threshold value from the OTDR waveform, and extracts a peak from the feature quantity on the scalogram based on the noise threshold value to generate a peak graph; and an event identification unit that identifies an event in the optical fiber to be measured from the peak graph.
    Type: Application
    Filed: May 25, 2023
    Publication date: December 14, 2023
    Inventors: Ryota TAKASU, Taichi MURAKAMI
  • Publication number: 20230400383
    Abstract: According to the present disclosure, an optical pulse test device includes an OTDR waveform measurement unit that measures an OTDR waveform with a plurality of pulse widths, an event analysis unit that calculates a level, a loss, and a return loss at a start point of each event, and an analysis result integration unit that calculates a cumulative loss at the start point and an end point of each event from the level, the loss, and the return loss at the start point of each event, determines a pulse width that enables securing of a required SN ratio or more for each of the start point and the end point of each event, integrates the cumulative loss at each of the start point and the end point of each event with the determined pulse width, and sets the integrated cumulative loss as an analysis result.
    Type: Application
    Filed: June 6, 2023
    Publication date: December 14, 2023
    Inventors: Ryota TAKASU, Taichi MURAKAMI, Kodai ISHIDA
  • Patent number: 11632172
    Abstract: It is possible to allow a user to easily distinguish between an event at a place to be resolved and an event at a place having no problem on a path of a PON communication network to be measured. A light intensity distribution of return light is processed in a time-series order to detect an event at each position on a network. A parameter N1 relating to the total number of splitters present on a path of the network is specified, the number N2 of detections of the total number of splitters detected as an event is recognized, and in a case where “N1>N2”, a last detected event is associated with one optical splitter and is further displayed as an “uncertain splitter” in distinction from a normal splitter.
    Type: Grant
    Filed: September 9, 2021
    Date of Patent: April 18, 2023
    Assignee: ANRITSU CORPORATION
    Inventors: Ryota Takasu, Taichi Murakami
  • Publication number: 20220123832
    Abstract: It is possible to allow a user to easily distinguish between an event at a place to be resolved and an event at a place having no problem on a path of a PON communication network to be measured. A light intensity distribution of return light is processed in a time-series order to detect an event at each position on a network. A parameter N1 relating to the total number of splitters present on a path of the network is specified, the number N2 of detections of the total number of splitters detected as an event is recognized, and in a case where “N1>N2”, a last detected event is associated with one optical splitter and is further displayed as an “uncertain splitter” in distinction from a normal splitter.
    Type: Application
    Filed: September 9, 2021
    Publication date: April 21, 2022
    Inventors: Ryota TAKASU, Taichi MURAKAMI
  • Patent number: 10521922
    Abstract: Provided is an end face inspection device capable of inspecting different end face shapes without replacing an adapter for attachment. An end face inspection device includes: an optical system that forms an image of an end face of a test object, which is fixed at a predetermined position, at a position of an image sensor; and a focus detection section that acquires image data, which is output by the image sensor, and determines whether or not the end face is brought into focus in the image data. The focus detection section acquires a plurality of the image data pieces, in which parts of the end face are brought into focus by changing a focal position of the optical system by a predetermined distance at a time, and acquires focused image data by synthesizing the respective parts brought into focus in the plurality of image data pieces.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: December 31, 2019
    Assignee: ANRITSU CORPORATION
    Inventor: Ryota Takasu
  • Patent number: 10279376
    Abstract: Provided are a measurement result display device and a measurement result display method which are capable of making a list of how much difference is present between an allowable value and a measurement value of each measurement item measured by a measuring instrument, in a visually discriminable state. An allowable upper limit value indicator 21 and an allowable lower limit value indicator 22 are disposed at display positions which are set in advance in a measurement result image 20 as positions indicating an allowable upper limit value and an allowable lower limit value, and a measurement value indicator 23 is disposed at a display position calculated from display positions of the allowable upper limit value indicator 21 and allowable lower limit value indicator 22 and a measurement value measured by the measurement unit 10.
    Type: Grant
    Filed: January 31, 2018
    Date of Patent: May 7, 2019
    Assignee: ANRITSU CORPORATION
    Inventors: Ryota Takasu, Yasuhiro Miyake, Soichiro Kai
  • Publication number: 20180276836
    Abstract: Provided is an end face inspection device capable of inspecting different end face shapes without replacing an adapter for attachment. An end face inspection device includes: an optical system that forms an image of an end face of a test object, which is fixed at a predetermined position, at a position of an image sensor; and a focus detection section that acquires image data, which is output by the image sensor, and determines whether or not the end face is brought into focus in the image data. The focus detection section acquires a plurality of the image data pieces, in which parts of the end face are brought into focus by changing a focal position of the optical system by a predetermined distance at a time, and acquires focused image data by synthesizing the respective parts brought into focus in the plurality of image data pieces.
    Type: Application
    Filed: March 14, 2018
    Publication date: September 27, 2018
    Inventor: Ryota TAKASU
  • Publication number: 20180236496
    Abstract: Provided are a measurement result display device and a measurement result display method which are capable of making a list of how much difference is present between an allowable value and a measurement value of each measurement item measured by a measuring instrument, in a visually discriminable state. An allowable upper limit value indicator 21 and an allowable lower limit value indicator 22 are disposed at display positions which are set in advance in a measurement result image 20 as positions indicating an allowable upper limit value and an allowable lower limit value, and a measurement value indicator 23 is disposed at a display position calculated from display positions of the allowable upper limit value indicator 21 and allowable lower limit value indicator 22 and a measurement value measured by the measurement unit 10.
    Type: Application
    Filed: January 31, 2018
    Publication date: August 23, 2018
    Inventors: Ryota TAKASU, Yasuhiro MIYAKE, Soichiro KAI