Abstract: A component transfer device includes an integration path through which both of a regular component and a defective component are to be transported, and a sorting gauge that is provided at the downstream end of the integration path and sorts the regular component and the defective component. A discharge path through which the defective component passes extends to incline in the width direction of the integration path. The sorting gauge includes a gauge body, a sorting path extending through the gauge body and into which the regular component is allowed to advance while the defective component is not allowed to advance, and a guide surface that is disposed at the gauge body so as to spread toward the discharge path and that guides the defective component to the discharge path when the defective component comes into contact with the guide surface.

Abstract: A component transfer device includes an integration path through which both of a regular component and a defective component are to be transported, and a sorting gauge that is provided at the downstream end of the integration path and sorts the regular component and the defective component. A discharge path through which the defective component passes extends to incline in the width direction of the integration path. The sorting gauge includes a gauge body, a sorting path extending through the gauge body and into which the regular component is allowed to advance while the defective component is not allowed to advance, and a guide surface that is disposed at the gauge body so as to spread toward the discharge path and that guides the defective component to the discharge path when the defective component comes into contact with the guide surface.

Abstract: A plate thickness test mechanism includes a detection section that detects an abnormality when a plate thickness is thinner than a desired plate thickness by a predetermined amount or more or thicker than the desired plate thickness by the predetermined amount or more, a determination section that determines whether or not the detection section functions normally, and a plate-shaped test jig that has a first plate portion having a plate thickness thinner than a predetermined specific plate thickness, and a second plate portion having a plate thickness thicker than the specific plate thickness. The determination section determines whether or not a plate thickness test is normally performed on the basis of a detection result of the detection section obtained when the detection section tests the plate thicknesses of the first and second plate portions by taking the desired plate thickness as the specific plate thickness.

Abstract: A plate thickness test mechanism includes a detection section that detects an abnormality when a plate thickness is thinner than a desired plate thickness by a predetermined amount or more or thicker than the desired plate thickness by the predetermined amount or more, a determination section that determines whether or not the detection section functions normally, and a plate-shaped test jig that has a first plate portion having a plate thickness thinner than a predetermined specific plate thickness, and a second plate portion having a plate thickness thicker than the specific plate thickness. The determination section determines whether or not a plate thickness test is normally performed on the basis of a detection result of the detection section obtained when the detection section tests the plate thicknesses of the first and second plate portions by taking the desired plate thickness as the specific plate thickness.