Patents by Inventor Ryouichi Shinohara

Ryouichi Shinohara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6646861
    Abstract: In a gas-insulated switching device capable of reducing the physical installation space while suppressing the installation height of the device, busbar connecting lines are disposed perpendicularly to and between as pair of main busbars to connect the main busbars. Three sets (one set per phase) of three serially connected horizontal broker units are placed in parallel, and each of the main busbars has three busbar units along a portion extending vertically from the end of the busbar connecting line.
    Type: Grant
    Filed: May 9, 2002
    Date of Patent: November 11, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Hiroyasu Watanabe, Rei Henmi, Ryouichi Shinohara, Ryouichi Mitsugi, Shunji Ito
  • Publication number: 20020163344
    Abstract: An insulated device diagnosing system capable of judging the deterioration, lifetime, defects and so on of a device highly sensitively and precisely.
    Type: Application
    Filed: July 2, 2002
    Publication date: November 7, 2002
    Applicant: Hitachi, Ltd.
    Inventors: Toshiaki Rokunohe, Fumihiro Endo, Tokio Yamagiwa, Ryouichi Shinohara
  • Patent number: 6424162
    Abstract: An insulated device diagnosing system is capable of judging the deterioration, lifetime, and defects of a device. The intensity at each voltage phase angle is measured at a plurality of specific frequencies, taking high voltage phase angles as the abscissas. The deterioration, lifetime, and the kind and extent of abnormality of the device are judged from the pattern and intensity of the spectral distribution, which is obtained by peak-holding the measured intensity for a defined time period. According to the present invention, partial discharge can be measured highly sensitively and precisely to diagnose the deterioration, lifetime and the extent of defect of the device. As a result, the insulation reliability of the device can be improved, and the part of the device that should be repaired/replaced can be grasped before disassembly of the device, thereby cutting the maintenance cost.
    Type: Grant
    Filed: August 11, 1999
    Date of Patent: July 23, 2002
    Assignee: Hitachi, Ltd.
    Inventors: Toshiaki Rokunohe, Fumihiro Endo, Tokio Yamagiwa, Ryouichi Shinohara
  • Patent number: 5982181
    Abstract: An insulated device diagnosing system is capable of judging the deterioration, lifetime, and defects of a device. The intensity at each voltage phase angle is measured at a plurality of specific frequencies, taking high voltage phase angles as the abscissas. The deterioration, lifetime, and the kind and extent of abnormality of the device are judged from the pattern and intensity of the spectral distribution, which is obtained by peak-holding the measured intensity for a defined time period. According to the present invention, partial discharge can be measured highly sensitively and precisely to diagnose the deterioration, lifetime and the extent of defect of the device. As a result, the insulation reliability of the device can be improved, and the part of the device that should be repaired/replaced can be grasped before disassembly of the device, thereby cutting the maintenance cost.
    Type: Grant
    Filed: December 8, 1997
    Date of Patent: November 9, 1999
    Assignee: Hitachi, Ltd.
    Inventors: Toshiaki Rokunohe, Fumihiro Endo, Tokio Yamagiwa, Ryouichi Shinohara