Patents by Inventor Ryousuke KONDO

Ryousuke KONDO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240026221
    Abstract: An europium activating ?-type sialon phosphor contains at least one kind of element selected from the group made of yttrium, titanium, and gadolinium, wherein the total content of the at least one kind of element is more than 0 ppm and less than 1000 ppm.
    Type: Application
    Filed: September 6, 2021
    Publication date: January 25, 2024
    Applicant: Denka Company Limited
    Inventors: Noriyoshi SAKAI, Ryousuke KONDO, Tomohiro NOMIYAMA, Keita KOBAYASHI
  • Patent number: 11377594
    Abstract: A ?-type sialon phosphor represented by the following expression 1, in which D50 is 10 ?m or less, and values of D10, D50, and D90 satisfy a relationship of the following expression 2 with respect to D10, D50, and D90 (each unit is [?m]) on a volume frequency basis as measured according to a laser diffraction/scattering method. Expression 1: Si12-aAlaObN16-b:Eux (wherein 0<a?3; 0<b?3; 0<x?0.1), expression 2: (D90?D10)/D50<1.6 (wherein the D10, D50, and D90 (each unit is [?m]) on a volume frequency basis as measured according to the laser diffraction/scattering method.
    Type: Grant
    Filed: August 22, 2019
    Date of Patent: July 5, 2022
    Assignee: DENKA COMPANY LIMITED
    Inventors: Keita Kobayashi, Shunsuke Mitani, Ryousuke Kondo, Kazuya Sugita, Takuya Matsufuji, Akihisa Kajiyama
  • Publication number: 20210189234
    Abstract: A ?-type sialon phosphor represented by the following expression 1, in which D50 is 10 ?m or less, and values of D10, D50, and D90 satisfy a relationship of the following expression 2 with respect to D10, D50, and D90 (each unit is [?m]) on a volume frequency basis as measured according to a laser diffraction/scattering method. Expression 1: Si12-aAlaObN16-b:Eux (wherein 0<a?3; 0<b?3; 0<x?0.1), expression 2: (D90?D10)/D50<1.6 (wherein the D10, D50, and D90 (each unit is [?m]) on a volume frequency basis as measured according to the laser diffraction/scattering method.
    Type: Application
    Filed: August 22, 2019
    Publication date: June 24, 2021
    Applicant: DENKA COMPANY LIMITED
    Inventors: Keita KOBAYASHI, Shunsuke MITANI, Ryousuke KONDO, Kazuya SUGITA, Takuya MATSUFUJI, Akihisa KAJIYAMA