Patents by Inventor Ryozo Fukuda

Ryozo Fukuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6674523
    Abstract: A pre-viewing inspection method and apparatus for inspecting an inspection article prior to visual inspection thereof, the inspection article being an electrophotographic member, such as an electrophotographic photosensitive member. The method (apparatus) comprises a defect signal detecting step (means) of detecting a defect signal based on a defect state of the inspection article, a detailed defect information generating step (means) of generating detailed defect information based on the defect signal detected in the defect signal detecting step, the detailed defect information including defect position information, and a detailed defect information visualizing step (means) of visualizing, on the inspection article, the detailed defect information generated in the detailed defect information generating step.
    Type: Grant
    Filed: July 23, 2001
    Date of Patent: January 6, 2004
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoichi Kawamorita, Ryozo Fukuda, Kazuya Tokuda, Kenji Muranaka, Shoshin Igarashi
  • Publication number: 20020021123
    Abstract: The invention provides a pre-viewing inspection method for an inspection article prior to visual inspection thereof, the method comprising a defect signal detecting step of detecting a defect signal based on a defect state of the inspection article, a detailed defect information generating step of generating detailed defect information based on the defect signal detected by the defect signal detecting step, and a detailed defect information visualizing step of visualizing, on the inspection article, the detailed defect information generated in the detailed defect information generating step, and a pre-viewing inspection device for an inspection article prior to visual inspection thereof, the device comprising defect signal detecting means for detecting a defect signal based on a defect state of the inspection article, detailed defect information generating means for generating detailed defect information based on the defect signal detected by the defect signal detecting means, and detailed defect information
    Type: Application
    Filed: July 23, 2001
    Publication date: February 21, 2002
    Inventors: Yoichi Kawamorita, Ryozo Fukuda, Kazuya Tokuda, Kenji Muranaka, Shoshin Igarashi