Abstract: An environment measuring device 1 has a measuring QCM sensor 10, a reference QCM sensor 20, a measurement oscillation circuit 15, a reference oscillation circuit 25, a frequency counter 31, s humidity sensor 51, a control unit 40, and a storage unit 41. The measuring QCM sensor 10 has an oscillator and an electrode formed by a corrosive metal on the surface of the oscillator, and the reference QCM sensor 20 has an oscillator and an electrode formed by a corrosion-resistant metal on the surface of the oscillator. The storage unit 41 stores the measurement count signal, the reference count signal, and the humidity signal which are associated with a measurement time. The control unit 40 determines an amount of increase in mass due to the corrosion of the electrode of the measuring QCM sensor by using the measurement count signal and the reference count signal.

Abstract: A measurement device includes: a mass measurer that measures a mass of particles in gas; a humidity changer that changes a humidity of atmosphere to which the particles are exposed; and a calculator that calculates information indicating a correlation of the mass with respect to the humidity.

Abstract: An atmospheric environment measuring apparatus including a filter disposed in a casing and adsorbing a component of a gas to be detected; a first mass sensor disposed in the casing between an inlet of the casing and the filter, including a first piezoelectric vibration element and changing a resonance frequency according to a mass of a substance adhered on a surface of the first piezoelectric vibration element; a second mass sensor disposed in a stage following the filter in the casing, including a second piezoelectric vibration element and changing a resonance frequency according to a mass of a substance adhered on a surface of the second piezoelectric vibration element; and a fan disposed in a stage following the second mass sensor in the casing and fluidizing atmosphere from the inlet toward an outlet of the casing.

Abstract: A detection method of detecting a target substance, the method includes exciting the target substance by irradiating an atmosphere of a detection space with light having a first wavelength that excites the target substance from a ground state to an excited state on the basis of the energy level structure of the target substance; ionizing the target substance by irradiating the atmosphere of the detection space with light having a second wavelength that excites the target substance from the excited state to an energy state substantially equal to or higher than a vacuum level; making the ionized target substance adsorb to a detector by electric field acceleration; and detecting the amount of adsorption of the target substance.

Abstract: An ion analyzing apparatus includes a sensor; a counter electrode having openings, the counter electrode being positioned so as to substantially surround the sensor; and a bias generating circuit coupled to the sensor, wherein the sensor includes quartz crystal and a pair of electrodes positioned on surface of the quartz crystal, and one of the pair of electrodes is coupled to the bias generating circuit.

Abstract: An ion analyzing apparatus includes a sensor; a counter electrode having openings, the counter electrode being positioned so as to substantially surround the sensor; and a bias generating circuit coupled to the sensor, wherein the sensor includes quartz crystal and a pair of electrodes positioned on surface of the quartz crystal, and one of the pair of electrodes is coupled to the bias generating circuit.

Abstract: An ion analyzing apparatus includes a sensor; a counter electrode having openings, the counter electrode being positioned so as to substantially surround the sensor; and a bias generating circuit coupled to the sensor, wherein the sensor includes quartz crystal and a pair of electrodes positioned on surface of the quartz crystal, and one of the pair of electrodes is coupled to the bias generating circuit.

Abstract: A detection method of detecting a target substance, the method includes exciting the target substance by irradiating an atmosphere of a detection space with light having a first wavelength that excites the target substance from a ground state to an excited state on the basis of the energy level structure of the target substance; ionizing the target substance by irradiating the atmosphere of the detection space with light having a second wavelength that excites the target substance from the excited state to an energy state substantially equal to or higher than a vacuum level; making the ionized target substance adsorb to a detector by electric field acceleration; and detecting the amount of adsorption of the target substance.

Abstract: An ion analyzing apparatus includes a sensor; a counter electrode having openings, the counter electrode being positioned so as to substantially surround the sensor; and a bias generating circuit coupled to the sensor, wherein the sensor includes quartz crystal and a pair of electrodes positioned on surface of the quartz crystal, and one of the pair of electrodes is coupled to the bias generating circuit.

Abstract: The ? ray dose rate measuring method according to the present invention comprises the first step of leaving a solid state track detector 12 and a sample 10 superimposed on each other for a prescribed period of time; the second step of etching the solid state track detector to thereby form in the solid state track detector etch pits 20 corresponding to tracks of ? rays incident on the solid state track detector; and the third step of giving a dose rate of ? rays emitted from the sample, based on a number of the etch pits formed in the solid state track detector and a leaving period of time. The sample and the solid state track detector are left for a relatively long period of time, and a number of the etch pits is divided by the leaving period time to thereby give a dose rate of ? rays, whereby as the leaving period of time is set longer, the background can be made less influential. Thus, the dose rate of ? rays can be given with very high precision.