Abstract: A scanning probe microscope prober employs a self-sensing cantilever including a first wire through which a current is supplied to a probe, and a second wire used in a sensor circuit for detecting a deformation of the cantilever. The prober includes guard potential generation means for causing the second wire to be employed as a guard wire for the first wire, and second wire switching means for switching over the second wire to be used in a time division manner in one of a first period during which the second wire is used as a sensor, and a second period during which the second wire is held at a guard potential. The probe is moved, after obtaining a two-dimensional distribution in the first period, to a predetermined position on the basis of the two-dimensional distribution in the second period for measuring a current or voltage of the first wire.

Abstract: The optical domain optical signal sampling device comprises an electrical sampling pulse source and an electrically-controlled optical modulator. The electrically-controlled optical modulator comprises electro-optical material, an optical waveguide located in the electro-optical material and including a bifurcated region, and electrodes disposed along the bifurcated region. The optical waveguide is arranged to receive an optical signal-under-test. At least one of the electrodes is connected to receive electrical sampling pulses from the electrical sampling pulse source. The electrical sampling pulses generate an electric field between the electrodes that differentially changes the refractive index of the electro-optical material in the bifurcated region of the optical waveguide to sample the optical signal-under-test.

Abstract: The optical domain optical signal sampling device comprises an electrical sampling pulse source and an electrically-controlled optical modulator. The electrically-controlled optical modulator comprises electro-optical material, an optical waveguide located in the electro-optical material and including a bifurcated region, and electrodes disposed along the bifurcated region. The optical waveguide is arranged to receive an optical signal-under-test. At least one of the electrodes is connected to receive electrical sampling pulses from the electrical sampling pulse source. The electrical sampling pulses generate an electric field between the electrodes that differentially changes the refractive index of the electro-optical material in the bifurcated region of the optical waveguide to sample the optical signal-under-test.