Abstract: An apparatus for testing a semiconductor device includes an insulation body on which an IC to be tested is placed; a high voltage source for generating an electrostatic charge; a capacitor and resistor; a variable discharge gap defined by a metal piece and a discharge electrode; a fixed discharge gap; a discharge resistor inserted into the discharge circuit; and a switch for conducting the electrostatic charge into the discharge circuit. When a high voltage is applied to the terminal to be tested in the IC, a corona or spark is generated at the discharge gap and the current is on rapidly into the terminal to be tested. Thus, a condition very similar to the actual electrostatic discharge phenomenon is reproduced.