Abstract: An exposure apparatus for exposing a substrate to light. A substrate stage holds the substrate and is to be moved. A measuring device measures a positional deviation amount of a mark on the substrate held by the substrate stage. A computing device determines a coefficient of a linear expression that approximates the measured positional deviation amount of each mark and is linear with respect to a term including at least one of an X coordinate to the Nth power and a Y coordinate to the Nth power, where N is an integer not less than zero, and a control device controls a position of the substrate stage in accordance with a target position determined based on the linear expression to expose a shot to the light.

Abstract: An exposure apparatus for exposing a substrate, includes a substrate stage configured to hold the substrate and to move, a measuring device configured to measure a positional deviation amount of a mark on the substrate held by the substrate stage, a computing device configured to determine a linear expression for approximating positional deviation amounts measured by using the measuring device, and a control device configured to control a position of the substrate stage in accordance with a target position based on the linear expression, for exposure of an exposure region on the substrate, wherein the computing device is configured to determine the linear expression in accordance with an integer programming method so as to minimize the number of marks having a difference between a mark positional deviation amount as measured by the measuring device and a mark positional deviation amount as approximated in accordance with the linear expression, which difference is out of a predetermined allowable range.