Patents by Inventor Ryuji Hokari

Ryuji Hokari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9958514
    Abstract: A magnetic field measurement apparatus includes a first gas cell disposed in a +z direction when seen from an object to be measured, a second gas cell disposed in the +z direction when seen from the first gas cell, a first measurement unit which measures a component of a magnetic field in the first gas cell, a second measurement unit which measures a component of a magnetic field in the second gas cell, a magnetic field generation unit which generates the magnetic field toward the second gas cell so as to reduce the component measured by the second measurement unit, and an output unit which outputs a signal in response to the difference in the components respectively measured by the first measurement unit and second measurement unit.
    Type: Grant
    Filed: January 22, 2015
    Date of Patent: May 1, 2018
    Assignee: Seiko Epson Corporation
    Inventor: Ryuji Hokari
  • Patent number: 9642553
    Abstract: A magnetic field measuring apparatus includes a cell array which includes plural cells different in size of detection surface through which a magnetic flux passes when the cells are arranged in a magnetic field of a measurement object, a medium which is enclosed inside each of the plural cells and rotates a light polarization plane according to an intensity of the magnetic field, an irradiator to irradiate a light to the detection surface of each of the cells, and a detector to detect a rotation angle of a polarization plane of the light passing through each of the cells.
    Type: Grant
    Filed: December 12, 2012
    Date of Patent: May 9, 2017
    Assignee: Seiko Epson Corporation
    Inventor: Ryuji Hokari
  • Publication number: 20160360987
    Abstract: A magnetic field measurement apparatus includes a magnetic sensor that detects a magnetic field from a subject, a table on which the subject is mounted, a shape measurement device that measures a surface shape of the subject, an average plane calculation unit that calculates an average plane of the surface shape, and a control unit that controls the table so that an opposing surface of the magnetic sensor is parallel to the average plane.
    Type: Application
    Filed: June 2, 2016
    Publication date: December 15, 2016
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Mitsutoshi MIYASAKA, Toshihiro SAITO, Akihiro DEGUCHI, Ryuji HOKARI
  • Patent number: 9462733
    Abstract: A magnetic shielding apparatus includes: a passive shield; a correction target space that is defined in the interior of the passive shield; external coils as a first coil that corrects a magnetic field in the passive shield; a first magnetic sensor; a second magnetic sensor that is arranged more inside the passive shield than the first magnetic sensor; and a control unit. The first magnetic sensor and the second magnetic sensor measure a magnetic field gradient in the passive shield. The control unit controls the external coils based on a result of the measurement performed by the first magnetic sensor and the second magnetic sensor.
    Type: Grant
    Filed: September 10, 2014
    Date of Patent: October 4, 2016
    Assignee: Seiko Epson Corporation
    Inventor: Ryuji Hokari
  • Patent number: 9451734
    Abstract: A magnetic shielding device includes: a passive shield having an inner space; a first coil that cancels a magnetic field entering in the inner space; a first magnetic sensor that measures the magnetic field entering in the inner space; a second magnetic sensor located in a position farther from the first coil than the first magnetic sensor; and a controller that controls the first coil so that a gradient between a first magnetic field measured by the first magnetic sensor and a second magnetic field measured by the second magnetic sensor be less than a predetermined threshold.
    Type: Grant
    Filed: September 17, 2013
    Date of Patent: September 20, 2016
    Assignee: Seiko Epson Corporation
    Inventors: Fumihiko Onuma, Shigemitsu Toda, Ryuji Hokari
  • Publication number: 20160228055
    Abstract: In an electronic apparatus, a contact thermometer contacts a skin surface of a user and measures a first temperature of the skin surface. A radiation thermometer measures a second temperature of the skin surface of the user. A vaporization heat quantity calculating unit calculates a quantity of heat of vaporization, using the first temperature and the second temperature. The calculation of the quantity of heat of vaporization is performed by executing predetermined vaporization heat quantity computing processing in which the first temperature and the second temperature are variables.
    Type: Application
    Filed: February 2, 2016
    Publication date: August 11, 2016
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Akira IKEDA, Ryuji HOKARI
  • Publication number: 20150130457
    Abstract: A magnetic field measurement apparatus includes a first gas cell disposed in a +z direction when seen from an object to be measured, a second gas cell disposed in the +z direction when seen from the first gas cell, a first measurement unit which measures a component of a magnetic field in the first gas cell, a second measurement unit which measures a component of a magnetic field in the second gas cell, a magnetic field generation unit which generates the magnetic field toward the second gas cell so as to reduce the component measured by the second measurement unit, and an output unit which outputs a signal in response to the difference in the components respectively measured by the first measurement unit and second measurement unit.
    Type: Application
    Filed: January 22, 2015
    Publication date: May 14, 2015
    Inventor: Ryuji HOKARI
  • Patent number: 9024634
    Abstract: A magnetic field measurement apparatus includes a first gas cell disposed in a +z direction when seen from an object to be measured, a second gas cell disposed in the +z direction when seen from the first gas cell, a first measurement unit which measures a component of a magnetic field in the first gas cell, a second measurement unit which measures a component of a magnetic field in the second gas cell, a magnetic field generation unit which generates the magnetic field toward the second gas cell so as to reduce the component measured by the second measurement unit, and an output unit which outputs a signal in response to the difference in the components respectively measured by the first measurement unit and second measurement unit.
    Type: Grant
    Filed: March 30, 2012
    Date of Patent: May 5, 2015
    Assignee: Seiko Epson Corporation
    Inventor: Ryuji Hokari
  • Publication number: 20150069846
    Abstract: A magnetic shielding apparatus includes: a passive shield; a correction target space that is defined in the interior of the passive shield; external coils as a first coil that corrects a magnetic field in the passive shield; a first magnetic sensor; a second magnetic sensor that is arranged more inside the passive shield than the first magnetic sensor; and a control unit. The first magnetic sensor and the second magnetic sensor measure a magnetic field gradient in the passive shield. The control unit controls the external coils based on a result of the measurement performed by the first magnetic sensor and the second magnetic sensor.
    Type: Application
    Filed: September 10, 2014
    Publication date: March 12, 2015
    Inventor: Ryuji HOKARI
  • Publication number: 20140077612
    Abstract: A magnetic shielding device includes: a passive shield having an inner space; a first coil that cancels a magnetic field entering in the inner space; a first magnetic sensor that measures the magnetic field entering in the inner space; a second magnetic sensor located in a position farther from the first coil than the first magnetic sensor; and a controller that controls the first coil so that a gradient between a first magnetic field measured by the first magnetic sensor and a second magnetic field measured by the second magnetic sensor be less than a predetermined threshold.
    Type: Application
    Filed: September 17, 2013
    Publication date: March 20, 2014
    Applicant: Seiko Epson Corporation
    Inventors: Fumihiko Onuma, Shigemitsu Toda, Ryuji Hokari
  • Patent number: 8362762
    Abstract: A magnetic field measurement device includes: a magneto-optical sensor that measures a first axial component of a magnetic field in the direction of a first axis that is arbitrarily set in the magnetic field that is to be measured; and a second magneto-optical sensor that measures a second axial component of the magnetic field in the direction of a second axis that form an angle q (0<q<90°) with the first axis.
    Type: Grant
    Filed: March 16, 2010
    Date of Patent: January 29, 2013
    Assignee: Seiko Epson Corporation
    Inventor: Ryuji Hokari
  • Publication number: 20120249132
    Abstract: A magnetic field measurement apparatus includes a first gas cell disposed in a +z direction when seen from an object to be measured, a second gas cell disposed in the +z direction when seen from the first gas cell, a first measurement unit which measures a component of a magnetic field in the first gas cell, a second measurement unit which measures a component of a magnetic field in the second gas cell, a magnetic field generation unit which generates the magnetic field toward the second gas cell so as to reduce the component measured by the second measurement unit, and an output unit which outputs a signal in response to the difference in the components respectively measured by the first measurement unit and second measurement unit.
    Type: Application
    Filed: March 30, 2012
    Publication date: October 4, 2012
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Ryuji HOKARI
  • Publication number: 20100237858
    Abstract: A magnetic field measurement device includes: a magneto-optical sensor that measures a first axial component of a magnetic field in the direction of a first axis that is arbitrarily set in the magnetic field that is to be measured; and a second magneto-optical sensor that measures a second axial component of the magnetic field in the direction of a second axis that form an angle q (0<q<90°) with the first axis.
    Type: Application
    Filed: March 16, 2010
    Publication date: September 23, 2010
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Ryuji HOKARI